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Used Metrology and inspection equipment

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- Up to 8"/200mm wafer handling - Allows small batch processing for R&D and Pilot Production - Load-locked Sys Location : AMERICA North (USA-Canada-Mexico)

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- Single chamber with load lock - Currently configured for 4" wafers - Can process up to 8"/200mm wafers (wit Location : AMERICA North (USA-Canada-Mexico)

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- Configured for 200mm Wafers - Single Cassette Station - Minimum Scan Step: 0.02mm - Maximum Points Per Scan: Location : AMERICA North (USA-Canada-Mexico)

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Hitachi SU8040 Scanning Electron Microscope, is a high-quality SEM used in various industries, research, and Location : EUROPE (Western and Northern)

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Tabletop Scanning Electron Microscope, Model TM-1000 (Hitachi High-Technologies), is an easy-to-use introduct Location : EUROPE (Western and Northern)

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Dual 300mm FIMS Standard and Oblique scanning mode, 0.060um sensitivity, 30mw Argon laser Location : AMERICA North (USA-Canada-Mexico)

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300mm Advanced Thin Films measurement tool Dual 300 mm load ports, WLR, BBSE, SWE, iDesorber, Stress Location : AMERICA North (USA-Canada-Mexico)

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Aligner/Double-sided Year(s) : 2001 Location : ASIA (North East)

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Aligner: Mask aligner/4in Year(s) : 2010 Location : ASIA (North East)

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Film Thickness Measurement System Metrology Equipment Date of Manufacture: 2001-12-31 Currently Configured for Year(s) : 2001 Location : EUROPE (Western and Northern)

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Brand: Koh Young Technology Power: 220V a.c Type: 3D SPI FEATURES: - Inspection speed at 0.24sec/FOV - 3D Sha Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)

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Thin Film Stress Measurement System, 150 mm and 200 mm wafer Location : AMERICA North (USA-Canada-Mexico)

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FRONT SIDE ALIGNMENT HIGH RESOLUTION ALIGNMENT FOR UP TO 4″ WAFERS SUSS POWER SUPPLY Year(s) : 2019 Location : AMERICA North (USA-Canada-Mexico)

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12.25×12.25 SQUARE BEAM (EXPOSURE HEAD IS MOTORIZED) 500 WATT LAMP, SPLIT FIELD VIDEO OPTICS WITH FLAT SCREEN Location : AMERICA North (USA-Canada-Mexico)

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Si wafers, 200/300mm wafers, Bright and Dark Field, 0.2 um pixel size, 10.5 Soft version, RBB classification Location : AMERICA North (USA-Canada-Mexico)

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Si, Gan & Gas, Saphire 150/200mm, Bright and Dark Field, 0.2 um pixel size, 10.5 Soft version, RBB classificat Location : AMERICA North (USA-Canada-Mexico)

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Dual 300mm FIMS – DBS, SE, Stress, 200/300 mm chuck, Win NT, Summit 3.3, upgradable Location : AMERICA North (USA-Canada-Mexico)

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Thin Film measurement tool Location : AMERICA North (USA-Canada-Mexico)

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Metrology Location : AMERICA North (USA-Canada-Mexico)

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Dark field defect detection tool, setup for 200mm or 300mm wafers, 2 Cameras 200 and 300mm compatible with dua Location : AMERICA North (USA-Canada-Mexico)

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Wafer Defect Inspection, for 150 or 200mm wafers, .25, 0.39, 0.62 um inspection spot size Location : AMERICA North (USA-Canada-Mexico)

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Automatic Wafer Optical Inspection System Robot defect but machines works fine in manual mode Year(s) : 2007 Location : EUROPE (Western and Northern)

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Ultratech Titan 4700 Stepper consisting of: - Model: Titan 4700 Stepper (Enclosure marked as 6700) - G & H Location : AMERICA North (USA-Canada-Mexico)

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Fully Automatic 300mm wafer prober, Dual FIMS loadport, Cold (-25c, ambiant and hot) Location : AMERICA North (USA-Canada-Mexico)

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Automated High Resolution Stylus Profiler, for 150 and 200 mm Wafer Location : AMERICA North (USA-Canada-Mexico)

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You can find used Metrology and inspection equipment on Wotol

The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.

The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.

HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. 

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