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Used Metrology and inspection equipment

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1

Illumination Type Reflected Light Stage Type Coaxial X-Y Stage Area Length: 267 mm (10.512 in) Width:... Location : AMERICA North (USA-Canada-Mexico)

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Wafer Size Range Minimum 50 mm Maximum 150 mm Set Size 150 mm Alignment Optics Splitfield Video So... Location : AMERICA North (USA-Canada-Mexico)

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Model Periplan GF Magnification 10 X Field Number 18 mm Focusing YES Motorized Nosepiece YES Multip... Location : AMERICA North (USA-Canada-Mexico)

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Microscope Type Microzoom Multiple Objectives Models Bausch and Lomb 2.25 X 0.04 N.A. 8 X 0.15 N.A. 25 X 0.3... Location : AMERICA North (USA-Canada-Mexico)

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Wafer Size Range Maximum 150 mm Illumination Source Type HeNe Laser Other Information Operating wavelen... Location : AMERICA North (USA-Canada-Mexico)

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Wafer Size Range Maximum 125 mm Controller Type Microprocessor Controller Type Controller Model C225 Ro... Location : AMERICA North (USA-Canada-Mexico)

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Wafer size: 8 inch with notch Chamber depth: 7.25" Posts with SS ball bearings Software ver 1.51 Require 24VDC... Location : AMERICA North (USA-Canada-Mexico)

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Microscope Type Upright Microscope Configuration Brightfield Illumination Type Reflected Light Binocular An... Location : AMERICA North (USA-Canada-Mexico)

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Patterned Wafer Contamination Analyzer Cassette to Cassette YES Condition Excellent Location : AMERICA North (USA-Canada-Mexico)

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Grid electron microscope Resolution: 1,8 nm at 1kV or 0,5 nm at 30kV Magnification: Low magnification mode: 6... Year(s) : 2001 Location : EUROPE (Western and Northern)

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Binocular Viewing Head with 2ea CFI 10X Eyepieces Nikon Ti2-N-ND-E Motorized DIC Sextuple Nosepiece, Including... Year(s) : 2019 Location : AMERICA North (USA-Canada-Mexico)

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Zeiss Model D Tiltable Stand (G) Motorized Z-Drives for Focusing & Pivot Point Adjustment Tilting angle ≤ 45°... Location : AMERICA North (USA-Canada-Mexico)

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Wafer Size 8" Tool's Condition Refurbishing Step height: Nanometers to 1000µ;m Step height repeatability : 4... Year(s) : 2017 Location : ASIA (North East)

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Xray inspection, 50 KV, windows XP Year(s) : 2011 Location : EUROPE (Western and Northern)

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Transfer: Reticle Location : ASIA (North East)

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Wafer Size 8" Vintage 2012-3 Tool's Condition Refurbishing The KLA-Tencor P-16+ Profiler is a highly sensiti... Year(s) : 2012 Location : ASIA (North East)

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Model Dimension 7000 Wafer Size 8" Vintage 1996-3 Year(s) : 1996 Location : ASIA (North East)

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Wafer Size 8" Tool's Condition Refurbishing 1.Microscope : - Model : OLYMPUS MX61L F - Objectives :5X,10X,20... Location : ASIA (North East)

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Scan Length: 210mm. (8″) Scan Speed: 1 um/sec to 25mm/sec. Vertical range: +/- 6.5um at 1A resolution & +/- 15... Location : AMERICA North (USA-Canada-Mexico)

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Measures Film Thickness, Refractive Index (RI) and Extinction Coefficient of Single and Multi-Layer Thin Film... Year(s) : 2000 Location : EUROPE (Western and Northern)

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Measurement range: X-axis 100mm Z1-axis detection section ±30mm from horizontal state Z2 axis (column) movem... Location : ASIA (North East)

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Year: Model: 2015 Tilt mechanism: Yes (X axis, tilt angle ±45 degrees) Measurement range/resolution: X-axis 20... Year(s) : 2015 Location : ASIA (North East)

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150mm Manual Analytical Wafer Prober. Vacuum Chuck: 6” dia. (150mm). Manual XY stage movement: 6” X x 6” Y. P... Location : AMERICA North (USA-Canada-Mexico)

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Wafer Size 8" Vintage 2018-4 Tool's Condition Refurbishing ■ System Configuration . WT2020 main unit with sc... Year(s) : 2018 Location : ASIA (North East)

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Wafer Size 8" Vintage 2009-5 Tool's Condition Excellent ■ System Configuration . WT2000PV main unit with scan... Year(s) : 2009 Location : ASIA (North East)

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You can find used Metrology and inspection equipment on Wotol

The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.

The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.

HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. 

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