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Used Metrology and inspection equipment

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Includes Computer (current OS), monitor, keyboard, mouse New M3 software Location : AMERICA North (USA-Canada-Mexico)

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Specifications: X-Travel: 100mm (4″) Z Column Height: 500mm Z Vertical Detector Travel with Contracer Head: 60 Location : AMERICA North (USA-Canada-Mexico)

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stepper Location : ASIA (North East)

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KLA-Tencor 2138XP Brightfield Defect Inspection Tool 0.25µ, 0.39µ, 0.62µ Spot Sizes For 150mm & 200mm Wafers M Year(s) : 2006 Location : EUROPE (Western and Northern)

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Small 18” dia. footprint but handles all wafer sizes up to 300mm. Cures most UV tape in 30 seconds. Ultra long Location : AMERICA North (USA-Canada-Mexico)

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Brightfield Inspection Metrology Equipment Date of Manufacture: 1994-02-01 Currently Configured for: 200mm Pat Year(s) : 2018 Location : EUROPE (Western and Northern)

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Macro-Defect Metrology Equipment Currently Configured for: 200mm Macro Defect Inspection Software Version: 3.6 Location : EUROPE (Western and Northern)

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Wafer Size Range Minimum 200 mm Maximum 200 mm Condition Good Exterior Dimensions Width 61.811 Year(s) : 1999 Location : EUROPE (Western and Northern)

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Magnification 10 X Field Number 26 mm Trinocular/Phototube Provided YES Multiple Objectives Models BD Plan 5x Location : AMERICA North (USA-Canada-Mexico)

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Karl Suss MJB3 Aligner Working condition Contact 1:1 aligner IR capability (back side alignment) Approximate e Location : EUROPE (Western and Northern)

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Mirtec MV7U Inline AOI - 2011 DOM: 2/18/2011 SW: Mirtec Inspector 4.5.6.0 OS: Windows XP 5 Cameras: - 1 top Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)

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Wafer Mask Inspection Parts Machine KLA ES32 (1) - Stage, electron source, feed throughs included KLA ES32 (2) Year(s) : 2005 Location : EUROPE (Western and Northern)

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WAFER SIZE 150mm Year(s) : 2001 Location : EUROPE (Western and Northern)

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Metrology Model Prometrix UV-1050 Location : EUROPE (Western and Northern)

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Integrated Metrology System Model 9010bVIS Year(s) : 2002 Location : EUROPE (Western and Northern)

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The NanoSpec 6100 is a fast, reliable, low cost tabletop film thickness and mapping system that provides a br Location : EUROPE (Western and Northern)

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film thickness from 100A to 50 microns Upgraded to new Olympus MS Plan infinity corrected 5x/10x/50x objective Location : EUROPE (Western and Northern)

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Long Scan Surface Profilometer Wafer Size: 8"/200mm Note: this tool won’t boot Year(s) : 1990 Location : EUROPE (Western and Northern)

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Metrology Model UV1080 Year(s) : 1999 Location : EUROPE (Western and Northern)

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Wafer size: 20mm Microscope Location : EUROPE (Western and Northern)

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Zeiss 1540 EsB Dual Beam FIB-SEM - EDX is included - 10mm EDAX detector - Known issue with Ion Pump for FIB ca Location : EUROPE (Western and Northern)

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KLA-Tencor SP1-TBI Wafer Defect Inspection System | 200mm | AS-IS KLA-Tencor SP1-TBI wafer defect inspection s Year(s) : 2000 Location : EUROPE (Western and Northern)

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KLA 6200 for sale in Refurbished condition. Optional Calibration Wafers available if required Location : EUROPE (Western and Northern)

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Prober Working condition Vintage circ 1999~2000 MS Dos system EGCommander software Location : EUROPE (Western and Northern)

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Profilometer Controller Type Microprocessor Controller Type Accessories Thermal printer is included Environmen Year(s) : 2017 Location : EUROPE (Western and Northern)

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You can find used Metrology and inspection equipment on Wotol

The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.

The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.

HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. 

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