Used Metrology and inspection equipment
1,300 resultsHitachi SU8040 Scanning Electron Microscope, is a high-quality SEM used in various industries, research, and Location : EUROPE (Western and Northern)
Price : On request
More detailsTabletop Scanning Electron Microscope, Model TM-1000 (Hitachi High-Technologies), is an easy-to-use introduct Location : EUROPE (Western and Northern)
Price : On request
More detailsFilm Thickness Measurement System Metrology Equipment Date of Manufacture: 2001-12-31 Currently Configured for Year(s) : 2001 Location : EUROPE (Western and Northern)
Price : On request
More detailsAutomatic Wafer Optical Inspection System Robot defect but machines works fine in manual mode Year(s) : 2007 Location : EUROPE (Western and Northern)
Price : On request
More detailsManufacturer ICOS Model WI-2200 + MH 200 AVI_WI-2000+HM200 spec This system is used as a set. Vintage : 2009 Year(s) : 2009 Location : EUROPE (Western and Northern)
Price : On request
More detailsInspection System Parts Tool Location : EUROPE (Western and Northern)
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More detailsWafer Inspection System 200mm Good Condition Just out from 200mm fab Location : EUROPE (Western and Northern)
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More detailsWafer Inspection Microscope Model MIS200 Location : EUROPE (Western and Northern)
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More detailsMP200 double path tool non copper tool; double path tool delay stage; 6 inch chuck Cooling Water Required Min Year(s) : 2002 Location : EUROPE (Western and Northern)
Price : On request
More detailsLeica INS3300 is the most advanced solution in the production control of 200 mm and 300 mm wafers. This compa Year(s) : 2003 Location : EUROPE (Western and Northern)
Price : On request
More detailsWorking condition before deinstall Location : EUROPE (Western and Northern)
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More detailsVeeco Wyko NT3300 Non contact Profilometer Fully Refurbished New PC with latest Wyko software revision running Location : EUROPE (Western and Northern)
Price : On request
More detailsRUDOLPH / AUGUST WAFER INSPECTION SYSTEM MODEL: NSX-105c VINTAGE: 2006 Automatic Wafer Inspection System up t Year(s) : 2006 Location : EUROPE (Western and Northern)
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More detailsWafer Size 200mm Year(s) : 2006 Location : EUROPE (Western and Northern)
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More detailsComplete Unit Model:340 Location : EUROPE (Western and Northern)
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More detailseS32 is a top-of-the-line mask and wafer inspection equipment that is designed to meet the most stringent qua Year(s) : 2006 Location : EUROPE (Western and Northern)
Price : On request
More detailsCurrently Under KLA Service Contract. Location : EUROPE (Western and Northern)
Price : On request
More detailsas is where is in fab running Year(s) : 2006 Location : EUROPE (Western and Northern)
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More detailsVintage : 2004. HDDs included, please see the photos. Year(s) : 2004 Location : EUROPE (Western and Northern)
Price : On request
More detailsModel: SEM Vision cX OEM: AMAT Accessory: 1 Baking Box, 1 User Manual Condition at Time of Shutdown: Operated Year(s) : 2001 Location : EUROPE (Western and Northern)
Price : On request
More detailsdouble rail; CPK2.6; 30 type camera--4pcs; nozzle--48pcs Year(s) : 2012 Location : EUROPE (Western and Northern)
Price : On request
More detailsInspection microscope with reflected and transmitted illumination Reflected and transmitted light 5x/10x/20x/5 Location : EUROPE (Western and Northern)
Price : On request
More detailsWafer Inspection System, WS-75BU, WS-70LCKT/15M Location : EUROPE (Western and Northern)
Price : On request
More detailsCondition Refurbished 200mm Patterned wafer inspection System This Tool was refurbished in 2017 and two new L Year(s) : 2001 Location : EUROPE (Western and Northern)
Price : On request
More detailsNikon Eclipse L200N inspection microscope with brightfield and darkfield episcopic illumination Trinocular vi Location : EUROPE (Western and Northern)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.