Used Metrology and inspection equipment
1,303 resultsVeeco Dektak 3030 Profilometer * EQP-00847-SI * Operating modes: Automatic, semi automatic, manual. * Stage Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsViscom X8011 PCB Plus Xray X-ray system X8011 PCB plus suited for 2D xray application for manual up to fully Location : AMERICA North (USA-Canada-Mexico)
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More detailsTISI ID 20151106-166 Manufacturer HITACHI Model PD-1000N Description Mask defect inspection Wafer Size V Location : ASIA (North East)
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More detailsBrand: SCREEN TISI ID 20151106-165 Manufacturer SCREEN Model STM-602 Description Film thickness inspectio Location : ASIA (North East)
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More detailsTISI ID 20151106-164 Manufacturer Tencor Model OmniMap RS35 Description Sheet resisitance inspection Wafer Location : ASIA (North East)
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More detailsBrand: Screen TISI ID 20151106-159 Manufacturer SCREEN Model ` Description Film thickness inspection（Lamb Location : ASIA (North East)
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More detailsTISI ID 20151106-163 Manufacturer RUDDLPH Model AutoEL-Ⅲ Description Film thickness inspection（Ellipsomete Location : ASIA (North East)
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More detailsBrand: SCREEN TISI ID 20151106-162 Manufacturer SCREEN Model VM-8000J Description Film thickness inspecti Location : ASIA (North East)
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More detailsTISI ID 20151106-161 Manufacturer Tencor Model OmniMap RS35C Description Sheet resisitance inspection Wafe Location : ASIA (North East)
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More detailsPlease visit our website for updated information at www.allwin21.com Updated Brochure in2024： https://allwin Year(s) : 2024 Location : AMERICA North (USA-Canada-Mexico)
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More detailsTemptronics TP04390A THERMOSTREAM THERMAL INDUCING SYSTEM GRADE C; UNIT PASSED SELF DIAGNOSTICS. NO HDD. MISS Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: SCREEN TISI ID 20151106-155 Manufacturer SCREEN Model STM-602P Description Film thickness inspecti Location : ASIA (North East)
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More detailsAuto type Location : ASIA (North East)
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More detailsTISI ID 20151106-152 Manufacturer BECKMAN COULTER Model DU70 Description Reflectance inspection Wafer Size Location : ASIA (North East)
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More detailsTISI ID 20151106-149 Manufacturer Tencor Model OmniMap RS55 Description Sheet resisitance inspection Wafer Location : ASIA (North East)
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More detailsManufacturer: JEOL Model: JEM 2010 Transmission electron microscope (TEM) Upgraded TEM operation system to JE Year(s) : 1994 Location : AMERICA North (USA-Canada-Mexico)
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More detailsTISI ID 11243 Manufacturer RVSI Model WS-2500 Description Inspection System Location : ASIA (North East)
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More detailsBrand: IMS TISI ID 151124-97 Manufacturer ` Model IMS Description Auto Inspector / LED Wafer Size Vinta Location : ASIA (North East)
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More detailsTISI ID 150826-12 Manufacturer Rudolph Model FE 7 Description Inspection Wafer Size 8" Vintage 1993 Location : ASIA (North East)
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More detailsTISI ID 150910-35 Manufacturer KLA-Tencor Model UV-1250SE Description Reflection rate Measurement Wafer Si Location : ASIA (North East)
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More detailsTISI ID 150826-11 Manufacturer Rudolph Model FE 4 Description Inspection Wafer Size 8" Vintage 1995 Location : ASIA (North East)
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More detailsDescription Optical checker（for macro inspection） Wafer Size Year(s) : 1995 Location : ASIA (North East)
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More detailsOptical checker（for macro inspection） Year(s) : 1996 Location : ASIA (North East)
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More details<b>1 x SEMIPROBE Model: SA-8</b> Wafer Size: 8" Semiautomatic prober, 8". Chuck stage X-Y movement: Travel: Location : AMERICA North (USA-Canada-Mexico)
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More detailsUsed <b> Manufacture : SemiTool Model : WST406MG Manufacture YR. : Dec. 2000 Desc : Solvent Processor </b> De Year(s) : 2000 Location : AMERICA North (USA-Canada-Mexico)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.