Used Metrology and inspection equipment
1,300 resultsModel 5500 Main System Can handle from 2" up to 8"/200mm wafers Submicron sensitivity, detects 0.2 micron part Year(s) : 2007 Location : EUROPE (Western and Northern)
Price : On request
More detailsWafer Sizes: 8"/200mm Wafer defect inspection The Leica INS 3000 is the new defect review and inspection stat Year(s) : 1999 Location : EUROPE (Western and Northern)
Price : On request
More detailsWAFER SIZE 8 Year(s) : 1995 Location : EUROPE (Western and Northern)
Price : On request
More detailsSpin RInser/Dryer Model ST-270D Location : EUROPE (Western and Northern)
Price : On request
More detailsWafer-Edge Inspection Year(s) : 2007 Location : EUROPE (Western and Northern)
Price : On request
More detailsParticle Counter WAFER SIZE 12 Year(s) : 2004 Location : EUROPE (Western and Northern)
Price : On request
More detailsWafer Loader 150mm Complete Sold As Is Location : EUROPE (Western and Northern)
Price : On request
More detailsScanning Electron Microscope (SEM) Model S 4500 Location : EUROPE (Western and Northern)
Price : On request
More detailsKLA-Tencor - Tool in production - Measures Film Thickness, Refractive Index (RI) and Extinction Coefficient o Year(s) : 2000 Location : EUROPE (Western and Northern)
Price : On request
More detailsTELI/F Block (Mark8-i11D) Year(s) : 1997 Location : EUROPE (Western and Northern)
Price : On request
More detailsProcess: Thin Film Stress Measurement System Year(s) : 2004 Location : EUROPE (Western and Northern)
Price : On request
More detailsconsole with keypad controller Free angle stand with manual X,Y,Z and theta rotation of stage Zoom lens 150-8 Location : EUROPE (Western and Northern)
Price : On request
More detailsPhotoresist Year(s) : 2013 Location : EUROPE (Western and Northern)
Price : On request
More detailsSDP-ALD NIT 12 Thin Film ALD SiN/SiO Wafer Size 12 Location : EUROPE (Western and Northern)
Price : On request
More detailsIPS AKRA CVD Ti/TiN Year(s) : 2010 Location : EUROPE (Western and Northern)
Price : On request
More detailsProcess: Thin Film Stress Measurement System Year(s) : 2007 Location : EUROPE (Western and Northern)
Price : On request
More detailsFixed Binocular Head U-BI30 Pair of WHN10x/22 Eyepieces (one adjustable). Fixed Stage with Right Hand Coaxial Location : EUROPE (Western and Northern)
Price : On request
More detailsWAFER SIZE 8 Location : EUROPE (Western and Northern)
Price : On request
More detailsTENCOR Surfscan 4500 Wafer surface inspection Unpatterned Wafer Surface Inspection Tool, for 75mm-150mm Wafer Location : EUROPE (Western and Northern)
Price : On request
More detailsCamera and Optics: Review camera CCD : 3CCD Color Review camera Resolution : 752pixels*582 lines Second Camera Location : EUROPE (Western and Northern)
Price : On request
More detailsPrinted Circuit Board Manufacturing Location : EUROPE (Western and Northern)
Price : On request
More detailsADE Episcan 1000 FT-IR Measurement of Epi Films <25µ ON-LINE TECHNOLOGIES 2110 Spectrometer Head IRVINE OPTICA Year(s) : 2000 Location : EUROPE (Western and Northern)
Price : On request
More detailsMirtec MV-6e Omni 3D AOI- 2016 #17161122-3535 DOM: 11/2016 SW: Mirtec inspector 5.5.400.332 Win 7 Lighting: Year(s) : 2016 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsOmron VT-RNS-II Inline AOI Machine 120V Single phase Max board 18x20" Board size : L Good working order M Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYESTECH Nordson YTV-FX 2014 Inline AOI, 5 Camera, Windows 7 - DOM: 4/2014 Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.