Used Metrology and inspection equipment
1,259 resultsWAFER SIZE 150mm Professionally Deinstalled, skidded in storage Working condition prior to deinstall Year(s) : 2004 Location : EUROPE (Western and Northern)
Price : On request
More detailsEllipsometer for CD and thin film measurements Version: 300 mm Vintage: 01.01.2018 Nova Instruments T600 Multi Year(s) : 2018 Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Inspection Microscope with autoloader Version: 100 MM AND 150 mm In good working condition Has CE safety Location : AMERICA North (USA-Canada-Mexico)
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More detailsTransmission electron microscope (TEM) Year(s) : 2012 Location : ASIA (North East)
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More detailsWafer Inspection Microscope Version: 150 mm Microscope Type Upright Microscope Configuration Brightfield Ill Location : AMERICA North (USA-Canada-Mexico)
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More detailsInspection: Surface Defect/4-6in Model Candela8720 Year(s) : 2017 Location : ASIA (North East)
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More detailsOlympus MX-80 Wafer Inspection Microscope Motorized Stage for up to 300mm Wafers Bright/Darkfield Optics: 5X, Location : AMERICA North (USA-Canada-Mexico)
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More detailsmask aligner exposes up to 3″ wafers Includes split field optics Location : AMERICA North (USA-Canada-Mexico)
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More detailsMa 6 mask aligner upgraded 1000 watt power supply 1 micron resolution on 6″ wafers Location : AMERICA North (USA-Canada-Mexico)
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More detailsMetal Film thickness measurement Version: 300mm Location : AMERICA North (USA-Canada-Mexico)
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More detailsProgrammable pulse periodic reverse power supply, 20 volts peak, 30 amp maximum DC, 100amp peak pulse, DynaNet Location : AMERICA North (USA-Canada-Mexico)
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More detailsUnpatterned Surface Inspection System Location : AMERICA North (USA-Canada-Mexico)
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More detailsKLA ADE equipment Metrology Location : AMERICA North (USA-Canada-Mexico)
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More detailsINS:AOI Year(s) : 2016 Location : ASIA (North East)
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More detailsSEM Year(s) : 2003 Location : ASIA (North East)
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More detailsInspection: AOI Model BF18D-S Year(s) : 2004 Location : ASIA (North East)
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More detailsInspection: AOI Year(s) : 2003 Location : ASIA (North East)
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More detailsInspection: 3D X-ray/LtoR Model VT-X750 Year(s) : 2018 Location : ASIA (North East)
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More detailsInspection/2D Model PA-500TL Year(s) : 2011 Location : ASIA (North East)
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More detailsAtomic Force Microscope Accessories Stage Controller: NanoScope Model 5000C-1 Scanning Probe Microscope Con Location : AMERICA North (USA-Canada-Mexico)
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More detailsMetrology Equipment Year(s) : 2001 Location : EUROPE (Western and Northern)
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More detailsGE Phoenix Nanome|x 180 PCBA X-ray system 180KVA Dual Detector : has both Image intensifier and flat panel de Location : AMERICA North (USA-Canada-Mexico)
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More detailsTEL Precio Wafer Prober Tri-Temp with Chiller Dual FOUP Handlers Wafer Size Range Minimum 200 mm Maxim Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Size 6" Tool's Condition Excellent Nikon Eclips L200 - Wafer size : up to 8" - Objectives : 5X, 10X, 2 Location : ASIA (North East)
Price : On request
More detailsParmi SPI Tabletop Solder Paste Inspector Model Number: 50T Notes: • Measuring principle: Laser optical trian Location : AMERICA North (USA-Canada-Mexico)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.