Used Metrology and inspection equipment
1,217 resultsBinocular Angle 45° Eyepieces Magnification 20 X Focusing YES Magnification Range 18 X - 150 X Zo Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsXray Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)
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More details6×6″ travel with 6″ wafer chuck New video camera and monitor 1 year warranty on parts Optional probe card hold Location : AMERICA North (USA-Canada-Mexico)
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More detailsTILTING PLATEN, 5X5″ TRAVEL, WITH 6″ DIAMETER CHUCK INCLUDES B&L STEREO ZOOM 7 OPTICS, OR CAN BE UPGRADED TO Location : AMERICA North (USA-Canada-Mexico)
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More detailsScanning Acoustic Microscope Version: Laboratory Vintage: 01.06.2010 A high-speed scanning acoustic microscope Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)
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More detailsCompound Microscope Microscope Configuration Brightfield & Darkfield Location : AMERICA North (USA-Canada-Mexico)
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More detailsUnpatterned Wafer Surface Inspection Tool Location : AMERICA North (USA-Canada-Mexico)
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More details6″ Probe station With 6″ chuck and 6X6″ travel Manual lifting platen, Z movement controlled by chuck Microzoom Location : AMERICA North (USA-Canada-Mexico)
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More detailsCR TECH CRX-1000 X-Ray System Location : AMERICA North (USA-Canada-Mexico)
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More detailsGE Phoenix Nanomex PCBA Analyser 160 X-Ray System Location : AMERICA North (USA-Canada-Mexico)
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More detailsBinocular Angle 45° Eyepieces Model 445111 Magnification 10 X Field Number 21 mm Focusing YES T Location : AMERICA North (USA-Canada-Mexico)
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More detailsModel M7A-DiscussionScope Binocular Angle 45°-Low Eyelevel Eyepieces Magnification 10 X Field Number Location : AMERICA North (USA-Canada-Mexico)
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More detailsBinocular Angle 45° Eyepieces Magnification 10 X Field Number 21 mm Focusing YES Magnification Ran Location : AMERICA North (USA-Canada-Mexico)
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More detailsX-Ray System Model Nanomex 160 Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)
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More detailsHg-CV measurement system Version: up to 12 inch Vintage: 01.01.2004 - Capable up to 12" Wafer - SSM 52 Capac Year(s) : 2004 Location : AMERICA North (USA-Canada-Mexico)
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More details8″ uv flood exposure system, cassette to cassette. Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope Configuration Brightfield, Darkfield & DIC Illumination Type Reflected & Transmitted Light Trinoc Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope/Light source:LG-PS2 Model SZX7 Location : ASIA (North East)
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More detailsUltra SPI Solder Paste Inspection Machine Upgraded with Windows 7 Year(s) : 2018 Location : AMERICA North (USA-Canada-Mexico)
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More detailsIT Control System X-ray Nondestructive Inspection System <b> Specification </b> Table size: 410×360 mm Tabl Year(s) : 2017 Location : ASIA (North East)
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More detailsHigh-Tech Science Scanning White Interference Microscope <b> specification </b> ○Observation interference mi Location : ASIA (North East)
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More detailsOne Shot 3D Shape Measuring Machine 【specification】 ・Year: 2015 ・Measurable height: Wide field mode 10mm, h Year(s) : 2015 Location : ASIA (North East)
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More details300mm (12″ INCH) CHUCK 300mm (12″ INCH) X 300mm (12″ INCH) TRAVEL ANORAD TABLE NEW MOTORS (covered by 6 month Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsSpin RInser/Dryer Model ST-270D Location : EUROPE (Western and Northern)
Price : On request
More detailsINS:AOI Year(s) : 2016 Location : ASIA (North East)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.