Used Metrology and inspection equipment
1,251 resultsInspection/2D Model PA-500TL Year(s) : 2011 Location : ASIA (North East)
Price : On request
More detailsAtomic Force Microscope Accessories Stage Controller: NanoScope Model 5000C-1 Scanning Probe Microscope Con Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMetrology Equipment Year(s) : 2001 Location : EUROPE (Western and Northern)
Price : On request
More detailsGE Phoenix Nanome|x 180 PCBA X-ray system 180KVA Dual Detector : has both Image intensifier and flat panel de Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsTEL Precio Wafer Prober Tri-Temp with Chiller Dual FOUP Handlers Wafer Size Range Minimum 200 mm Maxim Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsWafer Size 6" Tool's Condition Excellent Nikon Eclips L200 - Wafer size : up to 8" - Objectives : 5X, 10X, 2 Location : ASIA (North East)
Price : On request
More detailsCondition: Very Good Configuration: 12" Wafer sorter with: 2x Fixload V6 Multiple IOSS Wafer ID Reader 2x Bro Year(s) : 2001 Location : EUROPE (Western and Northern)
Price : On request
More detailsVintage : NOV 2015 Details 3D AOI Dual Lane Capability 120/210 Voltage Specifications This high-end inspect Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)
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More detailsYTV-FX 2D AOI Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
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More detailsSemi-Automatic BGA Rework Station Nozzles Included Maximum Board Size: 18” x 22” (458mm x 560mm) Minimum Compo Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsKLA-TENCOR PROMETRIX RS55/TC FOUR POINT PROBE RESISTIVITY MAPPING SYSTEM consisting of: - Model: RS55/tc - Tem Location : AMERICA North (USA-Canada-Mexico)
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More detailsCoater: Spin/SOG Year(s) : 1993 Location : ASIA (North East)
Price : On request
More detailsIN-:ICT Year(s) : 2000 Location : ASIA (North East)
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More details[Specifications] ○Measurement unit: XM-1200 ○Controller: XM-1500 ○Measurement range: 600mm x 300mm x 200mm ○Im Location : ASIA (North East)
Price : On request
More detailsMask Aligner With 150mm Backside Chuck Cassette to Cassette 1000 Watt Light Source Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details10″ COLLIMATED LENS FOR UP TO 6X6″ SQUARES OR 200mm WAFERS DUAL VIDEO CAMERAS ABOVE AND BELOW MASK 500 WATT P Location : AMERICA North (USA-Canada-Mexico)
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More detailsUsed, looks complete, very clean Manufacturer ALSI Model DCM802 Laser Separation System w/ LCPU, Wafer Location : EUROPE (Western and Northern)
Price : On request
More detailsThin film measurement tool Broadband UV optics Dual beam spectrophotometry Wafer sizes: 100mm, 150mm, and 200m Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsCu Film thickness measurement Version: 300 mm Location : AMERICA North (USA-Canada-Mexico)
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More details- Alignment System MA150e TSA - PC -Aut. Adjustment ( Autoalignment System) Cognex 8100 ( Patmex ) TSA - Lamph Location : EUROPE (Western and Northern)
Price : On request
More detailsMax PCB: 510 x 510 mm Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsInline AOI 5 Camera Windows 7 DOM: 10/2012 Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsThe S3088-II utilizes high performance Viscom 8M camera technology to meet extreme throughput requirements. Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsFocused Ion Beam (FIB) system. Location : United States (USA)
Price : On request
More detailsCondition Good Power Requirements 380 V 3 Phase Power Consumption : 17 kw 58 BTU/Hour Exterior Dimensio Year(s) : 1999 Location : EUROPE (Western and Northern)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.