Used Metrology and inspection equipment
1,239 resultsKLA-TENCOR SURFSCAN SP1 DLS UNPATTERNED SURFACE INSPECTION SYSTEM consisting of: - Model: SP1 DLS with 300mm S Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details200mm As-is KLA / MicroSense UMA-C200-STR Thin Film Stress Measurement System consisting of: - Vintage: Appro Year(s) : 2019 Location : EUROPE (Western and Northern)
Price : On request
More detailsMax KV: 160KV Operating system : Windows 10 Detector : Flat Panel Max tube power : 10W Tube NT500 Condition : Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsFor 200mm & 300mm Patterned & Unpatterned Wafers Brightfield/Darkfield Optics 2X, 3.5X, 5X & 10X Objectives 35 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsFor 150mm & 200mm Patterned & Unpatterned Wafers For GaN & GaAs on Sapphire & Silicon Wafers Brightfield/Dark Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsAutomated Optical Inspection System Brand Pemtron Year(s) : 2020 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsHigh-Tech Science High-performance fluorescent X-ray thickness gauge [Main specifications] ・X-ray tube: Tub Year(s) : 2013 Location : ASIA (North East)
Price : On request
More detailsFor 200mm Patterned Wafers on Film Frames Brightfield/Darkfield Optics 2X, 5X, 10X & 20X Objectives 35X LWD Re Year(s) : 2022 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsBrightfield Defect Inspection Tool Cassette to Cassette YES Condition Excellent 0.25µ, 0.39µ, 0.62µ Spot Si Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsDOM 6/2017 Per the OEM: As the true 3D AOI system, ZENITH LiTE effectively measures solder joints and compo Year(s) : 2017 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsTool Status Connected Wafer Size NA Fab Section Failure Analysis Asset Description Zeiss Merlin Scanning Ele Year(s) : 2010 Location : EUROPE (Western and Northern)
Price : On request
More detailsCondition Refurbished S-1160B-4N Precision Manual Analytical Probe Station configured with 4" chuck upgradable Location : EUROPE (Western and Northern)
Price : On request
More detailsMicroscope autoloader only (Not including the microscope) Version: 100 MM AND 150 mm -Deinstalled to warehouse Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsOxide film thickness measurement (PC missing) Version: 200 mm Year(s) : 2003 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsInspection: AOI Year(s) : 2010 Location : ASIA (North East)
Price : On request
More detailsMask & Wafer Inspection Working condition Year(s) : 2008 Location : EUROPE (Western and Northern)
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More detailsEye Piece: SWH10 x /26.5 Objective lens: MpanFLN x5 x10 x20 Working Condition Year(s) : 2015 Location : EUROPE (Western and Northern)
Price : On request
More detailsVintage: 01.05.1997 Cassette to Cassette Handling of 200mm Wafers Non-Contact Wafer Pre-Alignment Trinocular H Year(s) : 1997 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsWafer Inspection Microscope •5 Position Turret with Motorized Rotation •CF Plan 2.5X Bright/Darkfield Object Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsCMP metrology system Version: 300 mm -De-installed, warehoused. Can be inspected by appointment. -Has CE mark Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsEllipsometer for CD and thin film measurements Version: 300 mm Vintage: 01.01.2018 Nova Instruments T600 Multi Year(s) : 2018 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsWafer Inspection Microscope with autoloader Version: 100 MM AND 150 mm In good working condition Has CE safety Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsWafer Inspection Microscope Version: 150 mm Microscope Type Upright Microscope Configuration Brightfield Ill Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsInspection: Surface Defect/4-6in Model Candela8720 Year(s) : 2017 Location : ASIA (North East)
Price : On request
More detailsOlympus MX-80 Wafer Inspection Microscope Motorized Stage for up to 300mm Wafers Bright/Darkfield Optics: 5X, Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.