Used Metrology and inspection equipment
1,289 resultsX-Ray System Model Nanomex 160 Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsHg-CV measurement system Version: up to 12 inch Vintage: 01.01.2004 - Capable up to 12" Wafer - SSM 52 Capac Year(s) : 2004 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details8″ uv flood exposure system, cassette to cassette. Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMicroscope Configuration Brightfield, Darkfield & DIC Illumination Type Reflected & Transmitted Light Trinoc Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMicroscope/Light source:LG-PS2 Model SZX7 Location : ASIA (North East)
Price : On request
More detailsUltra SPI Solder Paste Inspection Machine Upgraded with Windows 7 Year(s) : 2018 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsIT Control System X-ray Nondestructive Inspection System <b> Specification </b> Table size: 410×360 mm Tabl Year(s) : 2017 Location : ASIA (North East)
Price : On request
More detailsHigh-Tech Science Scanning White Interference Microscope <b> specification </b> ○Observation interference mi Location : ASIA (North East)
Price : On request
More detailsOne Shot 3D Shape Measuring Machine 【specification】 ・Year: 2015 ・Measurable height: Wide field mode 10mm, h Year(s) : 2015 Location : ASIA (North East)
Price : On request
More details300mm (12″ INCH) CHUCK 300mm (12″ INCH) X 300mm (12″ INCH) TRAVEL ANORAD TABLE NEW MOTORS (covered by 6 month Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsSpin RInser/Dryer Model ST-270D Location : EUROPE (Western and Northern)
Price : On request
More detailsINS:AOI Year(s) : 2016 Location : ASIA (North East)
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More detailsInspection : Full-Auto L/F & Mold Year(s) : 2021 Location : ASIA (North East)
Price : On request
More detailsRUCKER AND KOLLS 250 4″ PROBE STATION 4×4 travel with 4″ chuck includes B&L zoom 4 optics Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details4″ PROBE STATION WITH 4″ CHUCK, 4X4″ TRAVEL INCLUDES STEREO ZOOM OPTICS AND LED RING ILLUMINATION XYZ MANIPULA Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details【specification】 ・Measurement part: XM-T1000 (2 probe type) ・Controller: XM-1500 ・Measurement range: 300mm x 25 Location : ASIA (North East)
Price : On request
More detailsMarantz AOI System Vintage: 2007 Year(s) : 2007 Location : EUROPE (Western and Northern)
Price : On request
More detailsMANUAL PROBE STATION PROBE UP TO 5″ WAFERS, FAST CHESSMAN MOVEMENT FOR LARGE GEOMETRIES AND JOYSTICK FOR FINE Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsULTRACISION 860 200mm XY TRAVEL WITH 8″ DIAMETER CHUCK WITH B&L ZOOM 5 STEREO OPTICS (8-40X) OR 16-80X WITH 2 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsBinocular Angle 45° Eyepieces Model 455043-0000 Magnification 10 X Field Number 23 mm Trinocular/P Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMicroscope Configuration Brightfield Illumination Type Reflected Light Binocular Angle 45° Eyepieces Mo Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMicroscope Configuration Brightfield & DIC Illumination Type Xe Reflected Light Eyepieces Model KPL-W Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsINS:AOI Year(s) : 2006 Location : ASIA (North East)
Price : On request
More detailsProber Version: 300 mm Vintage: 01.05.2006 De-installed, warehoused. Inspection WITH POWER-UP DEMONSTRATION i Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsWAFER FILM THICKNESS MEASUREMENT SYSTEM Vintage: 01.06.1991 KLA-Tencor Prometrix Film Thickness Probe W/ FT-65 Year(s) : 1991 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.
