Used Metrology and inspection equipment
1,217 resultsBrand Mitaka Kohki Non-contact 3D measuring device 【Main Specifications】 〇Microscope section ・Expensive obser Location : ASIA (North East)
Price : On request
More detailsFeatures: One-touch changeover switch for coarse and fine movement of the large stage Excellent image Location : AMERICA North (USA-Canada-Mexico)
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More detailsBinocular Angle 45° Eyepieces Magnification 10 X Magnification Range 8 X - 28 X Zoom Range 0.8 X - Location : AMERICA North (USA-Canada-Mexico)
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More detailsBinocular Angle 45° Eyepieces Model 10x/21 Magnification 10 X Field Number 21 mm Magnification Ran Location : AMERICA North (USA-Canada-Mexico)
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More detailsBinocular Angle 60° Eyepieces Magnification 10 X Field Number 23 mm Magnification Range 9 X - 40 X Location : AMERICA North (USA-Canada-Mexico)
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More detailsSUSS MJB3 MASK ALIGNER consisting of: - Model: MJB3 Main System - Configured for Top Side Alignment - Max Waf Location : AMERICA North (USA-Canada-Mexico)
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More detailsKLA-TENCOR ALPHA-STEP IQ PROFILER consisting of: - Model: Alpha-Step IQ - Up to 6”/150mm Wafer Capable - Scan Location : AMERICA North (USA-Canada-Mexico)
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More detailsOAI MBA 806 Mask Aligner OAI MBA 806 Mask Aligner consisting of: - Model: MBA806 - Manual Wafer Load Mask Alig Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope Configuration Brightfield & Darkfield Illumination Type Reflected Light Binocular Angle 45° Eye Location : AMERICA North (USA-Canada-Mexico)
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More details150mm PROBE STATION (AVAILABLE WITH 6″ HOT CHUCK) INCLUDES B&L STEREO ZOOM 7 OPTICS, OR CAN BE UPGRADED TO MIC Location : AMERICA North (USA-Canada-Mexico)
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More detailsS250 ANALYTICAL 4″ STATION WITH B&L MICROZOOM Location : AMERICA North (USA-Canada-Mexico)
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More detailsREL 6″ PROBE STATION WITH 6″ CHUCK AND 6X6″ TRAVEL FIXED PLATEN, Z MOVEMENT CONTROLLED BY CHUCK B&L STEREO ZOO Location : AMERICA North (USA-Canada-Mexico)
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More details9000 SUMMIT PROBE STATION 6X6″ Chuck, 6×6″ Travel Trinocular microscope zooms from 7-45x with 10x e.p. with ne Location : AMERICA North (USA-Canada-Mexico)
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More detailsPS21 Automatic 8″ Prober with Microchamber Includes: 2 RF xyz probes, video camera and 200mm Hot chuck. Location : AMERICA North (USA-Canada-Mexico)
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More details- 3 open cassette load stations - 5 anneal chambers - 3 Electrofill Cells (Plating Cells) - 3 Post Electrofill Location : AMERICA North (USA-Canada-Mexico)
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More detailsExterior Dimensions Width 15.750 in (40.0 cm) Depth 13.750 in (34.9 cm) Height 17.000 in (43. Location : AMERICA North (USA-Canada-Mexico)
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More detailsModel U-SWH 10x.26.5 Magnification 10 X Field Number 26 mm Focusing YES Trinocular/Phototube Provide Location : AMERICA North (USA-Canada-Mexico)
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More detailsSerial No. 3384 160 Kv Multi-Focus x-ray Tube / Open Tube 10W Max Target Power 70 degree angular view ADR-Aut Year(s) : 2009 Location : AMERICA North (USA-Canada-Mexico)
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More details2D Inspection Max Board: 12"x18" Board Thickness: 1mm to 5mm Component Height: 3.0 mm (Top & Bottom) Left to R Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details3D Solder Paste Inspection Dual Lane 220V 1 Phase 50/60Hz Year(s) : 2013 Location : AMERICA North (USA-Canada-Mexico)
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More detailsInspection/Defect Location : ASIA (North East)
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More detailsWafer Size 8" Tool's Condition Refurbished Measurement Range : 25§- 20탆 - 500?-200 um with the visible light Location : ASIA (North East)
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More detailsWafer Size 8" Tool's Condition Refurbishing •; Optimized Polarized Reflectance (Rs and Rp) Data - Wavelength Location : ASIA (North East)
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More detailsAOI system Revised, ready to work. Year(s) : 2011 Location : EUROPE (Western and Northern)
Price : On request
More detailsAOI system Location : EUROPE (Western and Northern)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.