Used Metrology and inspection equipment
1,302 resultsVintage : JUL 2012 3D Solder Paste Inspection 220Va.c. 1 Phase 50/60Hz Specifications ( See Details above for Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)
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More detailsSEM / FIB Location : AMERICA North (USA-Canada-Mexico)
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More details- Wafer Sizes: 8"/200mm - De-installed - Working order - No missing parts - Includes software and HDD Year(s) : 2001 Location : AMERICA North (USA-Canada-Mexico)
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More details• Guaranteed Resolution at 1 kV: 2.1 nm • Resolution at 15 kV: 1.5 nm • Working Distance: 12 mm • Sample Excha Year(s) : 2002 Location : AMERICA North (USA-Canada-Mexico)
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More details3D Solder Paste Inspection Machine 220V 1Phase 50/60hz Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)
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More detailsMPI LEDA-8F 3G Plus-V 110 3G Wafer Prober. Plus-V is a wafer prober for testing diced die on stretch frame ( Location : AMERICA North (USA-Canada-Mexico)
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More detailsCondition Good Power Requirements 380 V 3 Phase Power consumption 17 Kw 58 BTU/Hour Year(s) : 2003 Location : EUROPE (Western and Northern)
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More detailsAFM WORKSHOP MS 3220 ATOMIOC FORCE MICROSCOPE GOOD WORKING CONDITION Location : AMERICA North (USA-Canada-Mexico)
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More detailsVintage : OCT 2012 3D Solder Paste Inspection 27" Max Board Width 220V 1 Phase Specifications The Koh Young Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)
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More detailsCondition Good Power Requirements 380 V 3 Phase Power Consumption 17 Kw 58 BTU/Hour. Exterior Dimension Year(s) : 1998 Location : EUROPE (Western and Northern)
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More detailsVintage : OCT 2012 3D Solder Paste Inspection 27" Max Board Width 220V 1 Phase Specifications The Koh Young Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)
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More details3D Solder Paste Inspection 220V 1 Phase 50/60Hz Specifications Koh Young Technology is a market-proven techn Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)
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More detailsCondition Good Power Requirements 380 V 3 Phase Power consumption 17 Kw 58 BTU/Hour. Exterior Dimension Year(s) : 2000 Location : EUROPE (Western and Northern)
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More details• Focusing Controls: Coarse / Fine • Nosepiece: Motorized 5-position rotatable • Eyepieces: WH10x-H/22 • Objec Location : ASIA (North East)
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More detailsNanometrics ECVPro Carrier Concentration Profiler For Si, SiC, II-VI, III-V & III-Nitrides Hamamatsu LC8 UV L Location : AMERICA North (USA-Canada-Mexico)
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More detailsThe machine is in perfect working condition, Location : EUROPE (Western and Northern)
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More detailsOpticon Basicline AOI Year(s) : 2006 Location : EUROPE (Western and Northern)
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More detailsThermo Oriel Accudose 9000 Photospeed Tool. Measures batch to batch photospeed variations. Photoresist testi Location : AMERICA North (USA-Canada-Mexico)
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More detailsVerification station for AOI, Max panel size 26" x 36". With Amethyst technology. Location : EUROPE (Western and Northern)
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More details2D/3D Enabled – with OmniVision Digital Multi-Frequency Quad Moire 3D 15MP/ 10um Top Down Camera with Precis Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)
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More detailsMirtec AOI Automatic Optical Inspection Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)
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More detailsAsymtek Coating Table: Conformal Coating System Location : AMERICA North (USA-Canada-Mexico)
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More detailsCascade Microtech Summit 12000 200mm Prober with Attoguard Microchamber and -65°C to 200°C Shielded Chuck. C Location : AMERICA North (USA-Canada-Mexico)
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More detailsVintage: 11/2012 Details: (1) 5MP Top Down Camera (4) 5MP Side View Cameras Windows XP Operating System Mirt Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)
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More details• Particle Size Range: 0.5 to 10 microns • Manifold: AM-12-1.0 aerosol manifold • Pump: AM-12 pump included • Location : AMERICA North (USA-Canada-Mexico)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.