Used Metrology and inspection equipment
1,302 results• Type: Secondary workstation for implanter • Version: Spares • Condition: As is where is • Lead time: Immedia Year(s) : 1995 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsTESCAN VEGA-II Model LSH SEM. Computer Controlled Scanning Electron Microscope, high vacuum operation, 230mm Location : AMERICA North (USA-Canada-Mexico)
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More detailsVintage : APR 2010 120/208V 3 Phase 15" Max Board Width Specifications ( See Details above for installed opti Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)
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More details• Resolution: 3 nm at 30 kV • Magnification: Up to 300,000× • Stage: 5-axis motorized • Sample Size: Supports Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)
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More details• AOI microscope • Load Ports: 2 units of Brooks load port • Version: 300 mm • Sales Condition: As is where is Location : AMERICA North (USA-Canada-Mexico)
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More details• Type: Field Emission SEM with EDX • Version: Laboratory • Sales Condition: As is where is • Lead Time: Immed Year(s) : 2017 Location : AMERICA North (USA-Canada-Mexico)
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More detailsUsed <b> Manufacture : Rudolph Model : EL III Date Manufactured : 09/89 Ellipsometer </b> Details: Wafer Size Year(s) : 1989 Location : AMERICA North (USA-Canada-Mexico)
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More detailsUsed <b> Manufacture : SemiTool Model : WST406MG Manufacture YR. : Dec. 2000 Desc : Solvent Processor </b> De Year(s) : 2000 Location : AMERICA North (USA-Canada-Mexico)
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More detailsSpec : -Semitool graphic controller display screens -chemical cabinet (2 tanks, 1 for redian PRS1000, 1 for f Year(s) : 2000 Location : AMERICA North (USA-Canada-Mexico)
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More detailsX-Y Recorder S/N 221059 For Implant Tool Location : AMERICA North (USA-Canada-Mexico)
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More detailsHandy Communication Terminal,DC24V/12W Furnace Remote Control Pad Location : AMERICA North (USA-Canada-Mexico)
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More detailsFurnace, poly Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: N1 N 1 Checker FAI First Article Inspection Line Downtime = Lost Revenue n=1 makes FAI quick and fric Location : AMERICA North (USA-Canada-Mexico)
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More detailsInstruments 49197701 2.6 Mil Camera Location : AMERICA North (USA-Canada-Mexico)
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More detailsPre Reflow and Post Reflow High-Speed Camera, 12MP CMOS Camera Patented - Next Generation 3D Model Processing, Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: SILLNER SILLNER Lasermark 940 Location : EUROPE (Western and Northern)
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More detailsSpecification: Display head: Trinocular 25x Ocular: Wild 10X/21 Diopric correction: +5 až -5 Approach: APO Zoo Location : EUROPE (Western and Northern)
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More detailsSpecification: Illumination type: second light Binocular angle: 45° Ocular model: WHK 10x / 20L Magnification Location : EUROPE (Western and Northern)
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More detailsNordson YESTECH YTV-FX in excellent condition. vintage 2011 Specifications: Throughput: Up to 10 sq. in./sec. Year(s) : 2011 Location : EUROPE (Western and Northern)
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More detailsSpea 3030IL dual bay in excellent condition. Vintage 2006 The 3030IL is the fully automatic bed-of-nails test Year(s) : 2006 Location : EUROPE (Western and Northern)
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More details- Type: X-ray fluorescence spectrometer - Control Software: X-Ray Station - Included: Laptop (Windows XP) Location : EUROPE (Western and Northern)
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More details- Type: AOI (Automated Optical Inspection) - Z-resolution: 0.5 µm - Z-range: Up to 30 mm (1.2") - Angled v Location : EUROPE (Western and Northern)
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More detailsAOI Desktop inspection system including keyboard Location : EUROPE (Western and Northern)
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More detailsWafer Size: 150mm Gasonics Aura A3000 Location : AMERICA North (USA-Canada-Mexico)
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More detailsThe ASET-F5x thin film metrology system can measure materials across a continuous wavelength spectrum from 1 Location : AMERICA North (USA-Canada-Mexico)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.