Used Metrology and inspection equipment
1,079 resultsRudolph/August AXI 930 Macro Inspection System Wafer Size 8" Macro Inspection System to detect wafer level an Location : ASIA (North East)
Price : On request
More detailsTencor P-20(H) Step Height Measurement Sytem - Wafer Size 8" - Scan Length: 210mm. - Scan Speed : 1㎛ ~ 25 mm/ Location : ASIA (North East)
Price : On request
More detailsAMC 7700 EPI Reactor Wafer Size 6" *. Process: Epilayer growth on silicon wafer *. Operational at the time o Location : ASIA (North East)
Price : On request
More detailsLeica INS3000 Defect Inspection System Wafer Size 8" Year(s) : 1999 Location : ASIA (North East)
Price : On request
More detailsN&K 3000 Trench Depth & Thin film thickness Measurement Wafer Size 6" Non-destructive measurements of Trench Location : ASIA (North East)
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More detailsOlympus MX80-F Microscope (up to 300mm wafer) Wafer Size 12" * 200/300 mm wafer size * OBJECTIVES :5/10/20/50 Location : ASIA (North East)
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More detailsKLA-Tencor's 2401 Automated Macro Defect Inspection System Wafer Size 8" - Replacing the manual bright light Year(s) : 2000 Location : ASIA (North East)
Price : On request
More detailsRudolph/August AXI-S Macro Inspection System Wafer Size 8" Macro Inspection System to detect wafer level and Location : ASIA (North East)
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More detailsN&K 1700 Trench Depth & Thin film thickness Measurement Wafer Size 8" * .Available 100,125,150,200 mm by chuc Location : ASIA (North East)
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More detailsHitachi SEM S-4160 Performance: Rresolution: 2.5 nm at 30kv Magnification: 20X - 300KX Electron Optics: Elec Location : ASIA (North East)
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More detailsN&K 3700 RT Metrology System Wafer Size 8" Vintage 2004 Broadband spectrometry for film thickness on transpar Year(s) : 2004 Location : ASIA (North East)
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More detailsNIDEK 8" Wafer Autoloader IM-14 - 8" wafer. - Power: 120V, 5A - Utility: Vacuum. *. Fully refurbished. Fully Location : ASIA (North East)
Price : On request
More detailsZeiss Axiotron HSEB Microscope Wafer Size 8" *. Modified auto stage movement. *. Attached additional scope he Location : ASIA (North East)
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More detailsHitachi SEM S-5000 - 30KV 0.6nm - 1 KV 2.5nm with a test specimen *.Magnification 20X ~ 300,000X *. Stage Year(s) : 1996 Location : ASIA (North East)
Price : On request
More detailsKLA-Tencor's 2401 Automated Macro Defect Inspection System Wafer Size 8" - Replacing the manual bright light Year(s) : 2001 Location : ASIA (North East)
Price : On request
More detailsTencor P-2 Step Height Measurement System - Wafer Size 8" - Long Scan Profiler Measurement. - Standard Head w Location : ASIA (North East)
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More detailsTencor FLX-2908 Thin Film Stress Measurement Wafer Size 8" Installed in Clean-room. Location : ASIA (North East)
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More detailsIncludes X-Y table, Fiber Optic Light, Oblique Adjustment Location : AMERICA North (USA-Canada-Mexico)
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More detailsAsymtek Coating Table: Conformal Coating System Location : AMERICA North (USA-Canada-Mexico)
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More details5MP Top camera 4 side angle cameras Windows 7 operating system Yesvision 2.8.3 SW 20x22" max board size 50MM Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsViscom S3088-III AOI 06/2011 High resolution 01005 capable 8MP camera 4 size camera Calibration kits Repair/r Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYESTECH Nordson B3 Benchtop AOI w/ Color LED stadium lighting Color LED stadium lighting (fusion) 2.7 Softwar Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsBrand: Visionmaster / ASC Visionmaster / ASC VM450 3d SPI solder paste measurement system Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYestech YTV-2050 5 camera inline AOI system, yesvision 2.8.2 SW 1 x top down camera 4 side camera Calibration Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsViTechnology 3D SPI 4000L 3D Solder Paste Inspection System 2009 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.