Used Metrology and inspection equipment
1,251 resultsMicroscope on stand with Nicholas Illuminator Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope on *KT* Stand with Microlite Location : AMERICA North (USA-Canada-Mexico)
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More detailsMissing parts: Software and HDD Condition: as is All other parts are there Location : ASIA (North East)
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More details6×6 travel motorized nose piece Location : AMERICA North (USA-Canada-Mexico)
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More details2″ PROBER Location : AMERICA North (USA-Canada-Mexico)
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More details4″ FASPROBER (JOYSTICK MOVEMENT) INCLUDES STEREO ZOOM OPTICS WITH MICROSCOPE MOVEMENT Location : AMERICA North (USA-Canada-Mexico)
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More detailsMeasuring instrument/Metal film thickness Year(s) : 2003 Location : ASIA (North East)
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More detailsStepper/8in Year(s) : 1994 Location : ASIA (North East)
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More detailsVintage : DEC 2015 Details 3D Solder Paste Inspection 220V 1 Phase 50/60Hz Specifications Koh Young Technol Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)
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More detailsAutomated Defect Inspection Version: 150 mm/200 mm Automatic Shut down in Fab. Needs to be removed in the ne Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicromanipulator System [Configuration/Specifications] ・Manipulator (left and right arms): Operating ran Location : ASIA (North East)
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More detailsMOTORIZED OBJECTIVE TURRET 10, 20, 50X PLAN OBJECTIVES BRIGHT/DARK FIELD 100 WATT ILLUMINATION SOURCE 6X6″ TRA Location : AMERICA North (USA-Canada-Mexico)
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More detailsDOUBLE SIDED MASK ALIGNER DUAL 7” DIAMETER LIGHT SOURCES, 200 WATTS XY THETA MOVEMENT OF BOTTOM MASK AND SUBST Location : AMERICA North (USA-Canada-Mexico)
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More detailsMASK ALIGNER (HYBRID TECHNOLOGY GROUP) 7” DIAMETER BEAM. NEW TOUCH SCREEN CONTROLS REBUILT WITH 1 YEAR WARRANT Location : AMERICA North (USA-Canada-Mexico)
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More detailsManual wafer load profilometer Max wafer size: 8"/200mm Computer controlled Measures roughness, waviness, step Location : AMERICA North (USA-Canada-Mexico)
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More detailsExpose up to 4” wafers 350 lamp with digital power supply. Upgraded with new PLC/HMI Touch screen controls. Hi Location : AMERICA North (USA-Canada-Mexico)
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More detailsFILM AND HYBRID APPLICATIONS. WAFERS UP TO 4.5″X5″ AREA. Location : AMERICA North (USA-Canada-Mexico)
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More details1000 WATT POWER SUPPLY 1 MICRON RESOLUTION ON 6″ WAFERS IR BACK SIDE ILLUMINATION SPLIT FIELD MICROSCOPE WITH Location : AMERICA North (USA-Canada-Mexico)
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More details- Automated Surface Profilometer - Wafer Size: 8"/200mm - Automated Wafer Handler - 1 Open Loader for 200mm - Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Size 5 Location : ASIA (North East)
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More detailsWafer Size 6 Year(s) : 1999 Location : ASIA (North East)
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More detailsWafer Size 8 Year(s) : 1998 Location : ASIA (North East)
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More detailsWafer Size 8 Year(s) : 1995 Location : ASIA (North East)
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More details4-in-1 AOI Solution for Advanced PCB production Includes SLP, mSAP, advanced HDI, advanced Flex and IC substra Year(s) : 2017 Location : AMERICA North (USA-Canada-Mexico)
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More detailsAligner/4in Location : ASIA (North East)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.