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Used Metrology and inspection equipment

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1

QA-MDI-02 Location : AMERICA North (USA-Canada-Mexico)

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EO Technics CSM2000 Chip Scale Marker consisting of: - Manufacturer: EO Technics - Model: CSM2000 - Vintage: Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)

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- ORC UV-MIOA UV Intensity Meter - SN: 19S000005 Year(s) : 2018 Location : AMERICA North (USA-Canada-Mexico)

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- PC w/ windows XP - Maximum Throughput: 1 minute per wafer - Measurement Range: 2 mΩ/- 5 MΩ/ - Minimum Edge E Location : AMERICA North (USA-Canada-Mexico)

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Atomic Force Microscope (AFM) Wafer Size Range Minimum 200 mm Maximum 300 mm Set Size 300 mm Power Requir Year(s) : 2004 Location : EUROPE (Western and Northern)

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Microscope Accessories without x - y table Power Requirements 200-240 V 2.0 A 50/60 Hz Condition Go Year(s) : 1997 Location : EUROPE (Western and Northern)

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AOI System Year(s) : 2007 Location : EUROPE (Western and Northern)

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*. Process: wafer Sheet Resistance measurement *. Measurement perfomance: - 4 Point Probe check surface on Sil Year(s) : 1998 Location : ASIA (North East)

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Manual wafer load profilometer Max wafer size: 8"/200mm Computer controlled Measures roughness, waviness, step Location : AMERICA North (USA-Canada-Mexico)

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Thin film measurement tool Broadband UV optics Dual beam spectrophotometry Wafer sizes: 100mm, 150mm, and 200m Location : AMERICA North (USA-Canada-Mexico)

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- 3 open cassette load stations - 5 anneal chambers - 3 Electrofill Cells (Plating Cells) - 3 Post Electrofill Location : AMERICA North (USA-Canada-Mexico)

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EVG 620 MASK ALIGNER consisting of: - Model: EVG620 (Upgraded from a 420) - Manual Mask Aligner - Topside Ali Location : AMERICA North (USA-Canada-Mexico)

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- Can handle from 2" up to 8"/200mm wafers - Submicron sensitivity, detects 0.2 micron particles - Surface haz Location : AMERICA North (USA-Canada-Mexico)

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Parmi SPI Tabletop Solder Paste Inspector Model Number: 50T Notes: • Measuring principle: Laser optical trian Location : AMERICA North (USA-Canada-Mexico)

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Digital Microscope Model Number: VHX-5000 • Controller Unit: VHX-5000 • Camera Unit: VHX-5020 • RZ Lens: VH-Z2 Location : AMERICA North (USA-Canada-Mexico)

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Automated Optical Inspection Machine. Input: 200-240 50/60 Hz. Single phase. Good Working Condition. Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)

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Equipped with a Die. The Pneumatic MARK V cuts and forms component leads to a variety of configurations at hig Location : AMERICA North (USA-Canada-Mexico)

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Loc8 Light, S/N 18310012 without Software Location : EUROPE (Western and Northern)

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Microscope Location : EUROPE (Western and Northern)

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5 kW-Maschine. A modification up to 8 kW is possible (with new Software and guarantee). Upper drawer in order, Year(s) : 2002 Location : EUROPE (Western and Northern)

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Repair Station, Type Veri Smart VRL-OL Year(s) : 2006 Location : EUROPE (Western and Northern)

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3 X 400 V~ / 50 Hz B (width) m / T (depth) m H (height) m / G (weight) t ja (yes) wird geprueft (gets chec Location : EUROPE (Western and Northern)

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Staub 6 kW Device with additional Glass pane so that the Film not by warming warps including various new spar Location : EUROPE (Western and Northern)

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Quick Set up Supplied fully working & Tested Hi Resolution 1.3 Mega Pixel Colour Camera Max. Board Year(s) : 2005 Location : EUROPE (Western and Northern)

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Dual Band Visible IR Heating System 150W Lens Focused with adjustable image system Supplied with 2 lenses Comp Year(s) : 2012 Location : EUROPE (Western and Northern)

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You can find used Metrology and inspection equipment on Wotol

The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.

The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.

HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. 

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