Used Metrology and inspection equipment
1,066 results- Suss E-Rack - Qty 2 Cybor Control Module - Julabo F-30CL Chiller - Julabo FC600S Chiller - Qty 2 Coater Wa Location : AMERICA North (USA-Canada-Mexico)
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More details- NSX Automated Wafer Handling System - Xandex 350-0002 Pneumatic Die Marker Controller - Objectives: 1, 2, 5, Location : AMERICA North (USA-Canada-Mexico)
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More details- Cybor Model 512 Power Supply - Cybor Control Module - Thermo Scientific A25 Chiller - SN: 0307 - Develope Location : AMERICA North (USA-Canada-Mexico)
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More details- Xandex 350-0002 Pneumatic Die Marker Controller - PC - Monitor - Keyboard and Mouse Location : AMERICA North (USA-Canada-Mexico)
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More detailsAligner Year(s) : 2011 Location : ASIA (North East)
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More details- PC & Monitor - Keyboard and Mouse - SN: DW2009 Year(s) : 2002 Location : AMERICA North (USA-Canada-Mexico)
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More detailsModel 20-02000 Location : AMERICA North (USA-Canada-Mexico)
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More detailsFEG SEM Field Emission Gun Scanning Electron Microscope fitted with OXFORD Instruments 6650-M EDS Detector. Al Location : AMERICA North (USA-Canada-Mexico)
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More detailsDescription: - Alignment System MA200E TSA - Chuck 8" _Mask Holder for 8" Wafer -PC -Aut. Adjustment ( Cogne Year(s) : 0 Location : EUROPE (Western and Northern)
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More detailsdescription: Condition: used, but complete refurbished Available for full inspection and demonstrati Year(s) : 2004 Location : EUROPE (Western and Northern)
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More details3D AOI Year(s) : 2017 Location : AMERICA North (USA-Canada-Mexico)
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More detailsVT-RNS II Inline AOI Machine Location : AMERICA North (USA-Canada-Mexico)
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More detailsSereoscopic Zoom Microscope Location : AMERICA North (USA-Canada-Mexico)
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More detailsTrinocular Microscope Location : AMERICA North (USA-Canada-Mexico)
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More detailsTS-3 Dynascope S/N: 4200 & 3995 Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: Allwin21 Allwin21 AWgage-150 Non-Contact Thickness/Resistance Wafer Size: 2″ – 6″ Capability Wafer Lo Location : AMERICA North (USA-Canada-Mexico)
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More details- G & H Line Optics - Equipped for 4", 5", 6", and 8" wafers - 1000W Lamp - Extended Focus option for thick re Location : AMERICA North (USA-Canada-Mexico)
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More detailsQA-MDI-02 Location : AMERICA North (USA-Canada-Mexico)
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More details- NSX Automated Wafer Handling System - Xandex 350-0002 Pneumatic Die Marker Controller - Objectives: 1, 2, 5, Location : AMERICA North (USA-Canada-Mexico)
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More details- ORC UV-MIOA UV Intensity Meter - SN: 19S000005 Year(s) : 2018 Location : AMERICA North (USA-Canada-Mexico)
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More detailsAligner/Mask/6in. Location : ASIA (North East)
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More detailsSEM:Scanning electron microscope Year(s) : 1988 Location : ASIA (North East)
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More detailsMicroscope Year(s) : 2020 Location : ASIA (North East)
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More detailsMicroscope Year(s) : 2008 Location : ASIA (North East)
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More detailsmicroscope Year(s) : 1986 Location : ASIA (North East)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.