Used Metrology and inspection equipment
1,217 resultsModel Dimension 7000 Wafer Size 8" Vintage 1996-3 Year(s) : 1996 Location : ASIA (North East)
Price : On request
More detailsWafer Size 8" Tool's Condition Refurbishing 1.Microscope : - Model : OLYMPUS MX61L F - Objectives :5X,10X,20 Location : ASIA (North East)
Price : On request
More detailsScan Length: 210mm. (8″) Scan Speed: 1 um/sec to 25mm/sec. Vertical range: +/- 6.5um at 1A resolution & +/- 15 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsWafer Size Range Minimum 50 mm Maximum 200 mm Number of Photoresist Develop Stations 1 Number of Phot Year(s) : 2001 Location : AMERICA North (USA-Canada-Mexico)
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More detailsYear: Model: 2015 Tilt mechanism: Yes (X axis, tilt angle ±45 degrees) Measurement range/resolution: X-axis 20 Year(s) : 2015 Location : ASIA (North East)
Price : On request
More detailsWafer Size 8" Vintage 2018-4 Tool's Condition Refurbishing ■ System Configuration . WT2020 main unit with sc Year(s) : 2018 Location : ASIA (North East)
Price : On request
More detailsWafer Size 8" Vintage 2009-5 Tool's Condition Excellent ■ System Configuration . WT2000PV main unit with scan Year(s) : 2009 Location : ASIA (North East)
Price : On request
More detailsWafer Size 8" . Up to 8" . Automatic robotic wafer handling . Single open-cassette wafer loading station . Me Year(s) : 0 Location : ASIA (North East)
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More detailsWafer Size 8" Vintage 2000-10 . Wafer size : 200mm . CE marked . Single open cssette handler . Image Computer Year(s) : 2000 Location : ASIA (North East)
Price : On request
More detailsconsole with keypad controller Free angle stand with manual X,Y,Z and theta rotation of stage Zoom lens 150-8 Location : EUROPE (Western and Northern)
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More detailsPhotoresist Year(s) : 2013 Location : EUROPE (Western and Northern)
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More detailsWafer Size: 200mm 150/200mm Open Handler Software Version 5.3.17.4 Double Darkfield Inspection Tool SECS II Year(s) : 1999 Location : AMERICA North (USA-Canada-Mexico)
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More detailsG2 F20 S TWIN TMP, 300mm Scanning Electron Microscope Location : AMERICA North (USA-Canada-Mexico)
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More detailsExterior Dimensions Width 47.244 in (120.0 cm) Depth 58.268 in (148.0 cm) Height 66.929 in (1 Year(s) : 2015 Location : EUROPE (Western and Northern)
Price : On request
More detailsMain System FEI TL-150 Handler System Asyst Front End with AeroTech Software Version 2.55.6.107 Factory Interf Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsCRYOTEST 105 8 inch WAFER PROBE SYSTEM Location : AMERICA North (USA-Canada-Mexico)
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More details1200 8 inch WAFER PROBE SYSTEM Location : AMERICA North (USA-Canada-Mexico)
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More detailsINSPECTION MICROSCOPE WITH FOCEA SYSTEM Location : EUROPE (Western and Northern)
Price : On request
More detailsSEM/Scanning electron microscope Year(s) : 2003 Location : ASIA (North East)
Price : On request
More details120mm X 120mm TRAVEL SCRIBE RANGE WITH SKIP IS 3X3″ SMALLEST STEPS: X=5 MICRONS, Y=1 MICRON (5 MICRON ACCURACY Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsThe KY8030-2 has maintained the industry’s leading position as the best-selling True 3D Solder Paste Inspectio Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsSDP-ALD NIT 12 Thin Film ALD SiN/SiO Wafer Size 12 Location : EUROPE (Western and Northern)
Price : On request
More detailsIPS AKRA CVD Ti/TiN Year(s) : 2010 Location : EUROPE (Western and Northern)
Price : On request
More detailsProcess: Thin Film Stress Measurement System Year(s) : 2007 Location : EUROPE (Western and Northern)
Price : On request
More detailsWafer Size 8 Year(s) : 1996 Location : ASIA (North East)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.