Used Metrology and inspection equipment
1,035 resultsPH150 micropositioner with vacuum hold-down - Condition Refurbished Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMeas. technique: non-contact, junction photovoltage (JPV) Sample size: 100 to 156 mm (210mm option) Sa... Location : AMERICA North (USA-Canada-Mexico)
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More detailsmicropositioner with vacuum base 12C Picoprobe with power supply Location : AMERICA North (USA-Canada-Mexico)
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More detailsProbe: 100mm tip spacing, 60+ grams force, Tungsten Carbide, Tip Ru 100 (100 microns tip radius) 200mm vacuum... Location : AMERICA North (USA-Canada-Mexico)
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More details6" stainless steel vacuum chuck Olympus SZX7 Stereozoom microscope with camera port and fiber ring illuminator... Location : AMERICA North (USA-Canada-Mexico)
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More detailsFeature resolution 3um Travel range X/Y/ZÂ 12.5mm/12.5mm/12.5mm Magnetic base with quick release lever Location : AMERICA North (USA-Canada-Mexico)
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More details4" vacuum chuck Mitutoyo microscope with 2x/10x/20x objectives Optional: positioners Location : AMERICA North (USA-Canada-Mexico)
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More detailsVeeco/Digital Instruments Nanoscope III SPM Atomic Force Microscope Nanoscope III SPM and controller, LSSF... Location : AMERICA North (USA-Canada-Mexico)
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More detailsVeeco CPII Atomic Force Microscope Motorized Z stage, scans up to 100um, Mitutoyo M Plan Apo 20SL objective... Location : AMERICA North (USA-Canada-Mexico)
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More detailsSuss/MFI Vibsense For use with Suss MFI Probehead or for the monitoring of environmental parameters of any... Location : AMERICA North (USA-Canada-Mexico)
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More detailsRMS Systems/Hologenix NGS 3500 Defect Detection System Automatic Defect Detection & Classification Automat... Location : AMERICA North (USA-Canada-Mexico)
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More detailsS 5000 Location : ASIA (China - Taiwan - HKG)
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More detailsWAFER SIZE: 150MM Location : ASIA (China - Taiwan - HKG)
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More detailsNSR-4425i 6 inch As-is condition Complete with no missing parts Working condition before decommissioned Perfec... Year(s) : 1995 Location : ASIA (China - Taiwan - HKG)
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More detailsAUTO MICROSCOPE WAFER SIZE: 150MM WITH LOADER Location : ASIA (China - Taiwan - HKG)
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More detailsS4500 Location : ASIA (China - Taiwan - HKG)
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More detailsAligner/4in. Location : ASIA (North East)
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More detailsAligner Location : ASIA (North East)
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More detailsX’Pert Pro MRD Diffraction System Location : AMERICA North (USA-Canada-Mexico)
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More detailsL117 Ellipsometer w/ Video Camera & Computer Location : AMERICA North (USA-Canada-Mexico)
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More detailsAutoEL SS291 Automatic Ellipsometer Location : AMERICA North (USA-Canada-Mexico)
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More detailsBHM Reflected Light Microscope w/ Sentech Analyzer + HP Vectra ID-OEM-2 Location : AMERICA North (USA-Canada-Mexico)
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More detailsOVERLAY INSECTION SYSTEM, 8” WITH PANELS FULLY AUTOMATED COHERENCE PROBE MICROSCOPY (CPM) TECHNOLOGY GRAINY TA... Location : ASIA (China - Taiwan - HKG)
Price : On request
More detailswafer size:150mm – Sample size: up to 200mm – Low force head: 0.05 – 15mg – 0.05mg resolution – Step heigh rep... Location : ASIA (China - Taiwan - HKG)
Price : On request
More detailscomplete with no missing parts Location : ASIA (China - Taiwan - HKG)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.