Used Metrology and inspection equipment
1,259 resultsBH2, ON LARGE BASE WITH 6X6″ TRAVEL 10, 20, 40X BF/DF OBJECTIVES BINOCULAR TILTING HEAD OR TRINOCULAR HEAD Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsBH2 4X4″ TRAVEL 10, 20,50X BF/DF OBJECTIVES BINOCULAR TILTING HEAD (OPTIONAL TRINOCULAR HEAD) TOP AND BOTTOM L Location : AMERICA North (USA-Canada-Mexico)
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More detailsBf/df with adjustable height eyepeice assembly 6″ travel with motorized objective turret for cleanroom operato Location : AMERICA North (USA-Canada-Mexico)
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More detailsCalibrated microscopes on boom stand Includes LED ring light or gooseneck light Location : AMERICA North (USA-Canada-Mexico)
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More detailsScan Length: 210mm. (8″) Scan Speed: 1 um/sec to 25mm/sec. Vertical range: +/- 6.5um at 1A resolution & +/- 15 Location : AMERICA North (USA-Canada-Mexico)
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More details120mm X 120mm TRAVEL SCRIBE RANGE WITH SKIP IS 3X3″ SMALLEST STEPS: X=5 MICRONS, Y=1 MICRON (5 MICRON ACCURACY Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details6×6 travel motorized nose piece Location : AMERICA North (USA-Canada-Mexico)
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More details2″ PROBER Location : AMERICA North (USA-Canada-Mexico)
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More details4″ FASPROBER (JOYSTICK MOVEMENT) INCLUDES STEREO ZOOM OPTICS WITH MICROSCOPE MOVEMENT Location : AMERICA North (USA-Canada-Mexico)
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More detailsMOTORIZED OBJECTIVE TURRET 10, 20, 50X PLAN OBJECTIVES BRIGHT/DARK FIELD 100 WATT ILLUMINATION SOURCE 6X6″ TRA Location : AMERICA North (USA-Canada-Mexico)
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More detailsDOUBLE SIDED MASK ALIGNER DUAL 7” DIAMETER LIGHT SOURCES, 200 WATTS XY THETA MOVEMENT OF BOTTOM MASK AND SUBST Location : AMERICA North (USA-Canada-Mexico)
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More detailsMASK ALIGNER (HYBRID TECHNOLOGY GROUP) 7” DIAMETER BEAM. NEW TOUCH SCREEN CONTROLS REBUILT WITH 1 YEAR WARRANT Location : AMERICA North (USA-Canada-Mexico)
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More detailsExpose up to 4” wafers 350 lamp with digital power supply. Upgraded with new PLC/HMI Touch screen controls. Hi Location : AMERICA North (USA-Canada-Mexico)
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More detailsFILM AND HYBRID APPLICATIONS. WAFERS UP TO 4.5″X5″ AREA. Location : AMERICA North (USA-Canada-Mexico)
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More details1000 WATT POWER SUPPLY 1 MICRON RESOLUTION ON 6″ WAFERS IR BACK SIDE ILLUMINATION SPLIT FIELD MICROSCOPE WITH Location : AMERICA North (USA-Canada-Mexico)
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More detailsFRONT SIDE ALIGNMENT 350 WATT LAMP HIGH RESOLUTION ALIGNMENT FOR UP TO 3″ WAFER NEW DIGITAL VIDEO CAMERA FLAT Location : AMERICA North (USA-Canada-Mexico)
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More detailsAPPROX 12X12” BEAM 1000 WATT POWER SUPPLY 1 YEAR WARRANTY ON NEW MOTORS AND TOUCH SCREEN CONTROLS CUSTOM MASK Location : AMERICA North (USA-Canada-Mexico)
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More detailsFILM FRAME MOUNTER, UP TO 8″ (200mm) WAFERS Location : AMERICA North (USA-Canada-Mexico)
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More details500 WATT LAMP 9X9” COLLIMATING LENS CHOOSE UP TO 8”X8” CHUCK AND UP TO 9X9” MASK HOLDER Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope Type Stereo Zoom Vacuum Chuck Diameter 6.0000 in (152.40 mm) Accessories Nikon SMZ-1 with Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Size Range Maximum 150 mm Microscope Type Microzoom Multiple Objectives Models Industrial 2.25X Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Size Range Minimum 50 mm Maximum 150 mm Microscope Type Microzoom X-Y Optics Motion YES Vacuum Location : AMERICA North (USA-Canada-Mexico)
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More detailsBinocular Angle 60° Eyepieces Model GSWH 10x/22 Magnification 10 X Field Number 22 mm Magnificatio Location : AMERICA North (USA-Canada-Mexico)
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More detailsBinocular Angle 45° Eyepieces Model GSWH20X/12 Magnification 20 X Field Number 12 mm Focusing Y Location : AMERICA North (USA-Canada-Mexico)
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More detailsIllumination Type Reflected & Transmitted Light Binocular Angle 45° Eyepieces Model CFWN Magnificatio Location : AMERICA North (USA-Canada-Mexico)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.