Used Metrology and inspection equipment
1,259 resultsMicroscope Type Microzoom Multiple Objectives Models Bausch and Lomb 2.25 X 0.04 N.A. 8 X 0.15 N.A. 25 X 0.3 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMicroscope for machines (without stand) Objective: Nikon G-AL 0,29 x Oculars: 20 x Illumination: up to 29 x o Location : EUROPE (Western and Northern)
Price : On request
More detailsThis tool includes chem cabinets and Temperature and Humidity module. The controller is programed in DOS. Pump Location : EUROPE (Western and Northern)
Price : On request
More detailsFull 3D Inspection (Actual 3D) Inspection Irrelevant to Color, Material, Surface Roughness Foreign Material & Year(s) : 2022 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsAnti Static Probes YES Heated Nitrogen YES Rotors Included YES Controller Type Microprocessor Controller T Location : AMERICA North (USA-Canada-Mexico)
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More detailsSubstrate Size Up to 125mm Wafer Size Range Maximum 125 mm Controller Type Microprocessor Controller Ty Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsBinocular Angle 60° Eyepieces Magnification 10 X Field Number 22 mm Magnification Range 10 X - 40 Location : AMERICA North (USA-Canada-Mexico)
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More detailsMeasurement Display Range … 200 A to 655,000 A (20nm to 65,000nm) Vertical Resolution … 5A (.5nm) Scan Length Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsX-Ray Inspection System consisting of: - PC & Monitors - Mouse and Keyboard Year(s) : 2009 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details(HIGH PRESSURE SCRUBBING) UP TO 8″ DIAMETER WAFERS INFRARED DRYER Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsExterior Dimensions Width 47.244 in (120.0 cm) Depth 58.268 in (148.0 cm) Height 66.929 in (1 Year(s) : 2015 Location : EUROPE (Western and Northern)
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More detailsScanning Electron Microscope Manufacturer TESCAN Accessories Equip with OXFORD INCA ENERGY 200 Energy Disp Year(s) : 2004 Location : EUROPE (Western and Northern)
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More detailsCondition Fair Power Requirements 380 V 3 Phase Other Information Power Consumption : 6,25 kVA Temp Ra Year(s) : 2014 Location : EUROPE (Western and Northern)
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More detailsPower Requirements 220/240 V 50 Hz Exterior Dimensions Width 32.677 in (83.0 cm) Depth 98.425 Year(s) : 2009 Location : EUROPE (Western and Northern)
Price : On request
More detailsAutomatic Optical Inspection CE Marked YES Condition Good Year(s) : 2011 Location : EUROPE (Western and Northern)
Price : On request
More detailsOther V 48.0 A 50/60 Hz Exterior Dimensions Width 169.528 in (430.6 cm) Depth 61.890 in (1 Year(s) : 2012 Location : EUROPE (Western and Northern)
Price : On request
More detailsHigh Speed XRay System f. Tray Handling Accessories input Feeder output feeder Power Requirements Other V Year(s) : 2015 Location : EUROPE (Western and Northern)
Price : On request
More detailsMask Aligner Exposure Light Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope on stand with Nicholas Illuminator Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope on *KT* Stand with Microlite Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMicroscope On Square Base Boom Stand Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsZoom Microscope Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsZoom Microscope Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMicroscope Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsSereoscopic Zoom Microscope Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.