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Used Metrology and inspection equipment

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1

Wyko Veeco NT 8000Â 8 x 8 stage with Galil 5 axis stage controller Nixsystem G5 computer , running windows 7Â Location : AMERICA North (USA-Canada-Mexico)

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International 200mm hot chuck with digital controller Location : AMERICA North (USA-Canada-Mexico)

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Operating Temperature: 70 K to 730 K Temperature Stability: ± 0.1 K with MMR's Programmable Controller Temper Location : AMERICA North (USA-Canada-Mexico)

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Bulk resistivity of a slice with a known thickness Thickness in, A, MILS, or microns of a slice or layer with Location : AMERICA North (USA-Canada-Mexico)

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6x6 square chuck 12.5 micron stylus VLSI Step Height Calibration standard - 4.438um camera motorized 6x6 XY st Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)

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Detail (4) ZN50R-10-P7 Probe Tip (6) K-085-K-13 Probe Cable (6) GSG-100-40A-551-D Microwave Probes (1) P Location : AMERICA North (USA-Canada-Mexico)

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6"/150mm vacuum chuck Leica S6E trinocular stereozoom, 10x/23 eyepieces, 6.3-40x zoom, total magnification 6 Location : AMERICA North (USA-Canada-Mexico)

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Vacuum base Probe arm 100TPI lead screws Priced per positioner Location : AMERICA North (USA-Canada-Mexico)

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PH150 micropositioner with vacuum hold-down - Condition Refurbished Location : AMERICA North (USA-Canada-Mexico)

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Meas. technique: non-contact, junction photovoltage (JPV) Sample size: 100 to 156 mm (210mm option) Sa Location : AMERICA North (USA-Canada-Mexico)

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micropositioner with vacuum base 12C Picoprobe with power supply Location : AMERICA North (USA-Canada-Mexico)

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Probe: 100mm tip spacing, 60+ grams force, Tungsten Carbide, Tip Ru 100 (100 microns tip radius) 200mm vacuum Location : AMERICA North (USA-Canada-Mexico)

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6" stainless steel vacuum chuck Olympus SZX7 Stereozoom microscope with camera port and fiber ring illuminator Location : AMERICA North (USA-Canada-Mexico)

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Feature resolution 3um Travel range X/Y/ZÂ 12.5mm/12.5mm/12.5mm Magnetic base with quick release lever Location : AMERICA North (USA-Canada-Mexico)

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4" vacuum chuck Mitutoyo microscope with 2x/10x/20x objectives Optional: positioners Location : AMERICA North (USA-Canada-Mexico)

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Veeco/Digital Instruments Nanoscope III SPM Atomic Force Microscope Nanoscope III SPM and controller, LSSF la Location : AMERICA North (USA-Canada-Mexico)

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Veeco CPII Atomic Force Microscope Motorized Z stage, scans up to 100um, Mitutoyo M Plan Apo 20SL objective w Location : AMERICA North (USA-Canada-Mexico)

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Suss/MFI Vibsense For use with Suss MFI Probehead or for the monitoring of environmental parameters of any pi Location : AMERICA North (USA-Canada-Mexico)

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RMS Systems/Hologenix NGS 3500 Defect Detection System Automatic Defect Detection & Classification Automated Location : AMERICA North (USA-Canada-Mexico)

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S 5000 Location : ASIA (China - Taiwan - HKG)

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WAFER SIZE: 150MM Location : ASIA (China - Taiwan - HKG)

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NSR-4425i 6 inch As-is condition Complete with no missing parts Working condition before decommissioned Perfec Year(s) : 1995 Location : ASIA (China - Taiwan - HKG)

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AUTO MICROSCOPE WAFER SIZE: 150MM WITH LOADER Location : ASIA (China - Taiwan - HKG)

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S4500 Location : ASIA (China - Taiwan - HKG)

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Aligner/4in. Location : ASIA (North East)

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You can find used Metrology and inspection equipment on Wotol

The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.

The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.

HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. 

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