Used Metrology and inspection equipment
1,300 resultsMicroscope Location : AMERICA North (USA-Canada-Mexico)
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More detailsStepper Location : ASIA (North East)
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More detailsStepper/4in. Location : ASIA (North East)
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More detailsAligner:Manual MASK/4in Year(s) : 2011 Location : ASIA (North East)
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More detailsFRONT SIDE ALIGNMENT 350 WATT LAMP HIGH RESOLUTION ALIGNMENT FOR UP TO 3″ WAFER NEW DIGITAL VIDEO CAMERA FLAT Location : AMERICA North (USA-Canada-Mexico)
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More detailsScanning Electron Microscope Manufacturer TESCAN Accessories Equip with OXFORD INCA ENERGY 200 Energy Disp Year(s) : 2004 Location : EUROPE (Western and Northern)
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More detailsBinocular Angle Variable Eyepieces Model N/A Magnification 16 X Focusing YES Magnification Range Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope Configuration Brightfield Illumination Type Xe Reflected Light Binocular Angle 60° Eyepieces Location : AMERICA North (USA-Canada-Mexico)
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More detailsPolarizer YES Analyzer YES Condenser YES Illumination Power Volts: 6 Watts: 15 Illumination Power Tran Location : AMERICA North (USA-Canada-Mexico)
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More detailsModel 340 Atomic Force Microscope Version: 300 MM Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)
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More detailsAPPROX 12X12” BEAM 1000 WATT POWER SUPPLY 1 YEAR WARRANTY ON NEW MOTORS AND TOUCH SCREEN CONTROLS CUSTOM MASK Location : AMERICA North (USA-Canada-Mexico)
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More detailsAtomic Force Microscope (AFM) Version: 200mm Location : AMERICA North (USA-Canada-Mexico)
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More detailsManual Analytical Wafer Probe Station. Wafer prober designed to support a broad range of precision probing ap Location : AMERICA North (USA-Canada-Mexico)
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More detailsView Pinnacle 250 Video Measuring Tool. The Pinnacle features a damped granite base and column, with passive Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Size Range Set Size 150 mm Microscope Type Stereo Zoom Vacuum Chuck Diameter 6.0000 in (152.4 Location : AMERICA North (USA-Canada-Mexico)
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More detailsIllumination Type Coaxial Multiple Objectives Models 2x X-Y-Z Stage Travel X: 25 mm (0.984 in) Y : Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Size 8 Year(s) : 1996 Location : ASIA (North East)
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More detailsWafer Size 8 Year(s) : 1998 Location : ASIA (North East)
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More details3D Bump Height (Veeco) Version: 150 mm/200 mm Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope Configuration Brightfield & Darkfield Illumination Type Reflected Light Binocular Angle Variable Year(s) : 2001 Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope Configuration Brightfield & Darkfield Illumination Type Reflected Light Binocular Angle Ergonomi Year(s) : 2001 Location : AMERICA North (USA-Canada-Mexico)
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More detailsFILM FRAME MOUNTER, UP TO 8″ (200mm) WAFERS Location : AMERICA North (USA-Canada-Mexico)
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More details7900-L, s/n: Z3D-7900-0412-0028, 300 mm Tool ID: ICD2900 Year(s) : 2012 Location : United States (USA)
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More detailsDescription: Delta 80+ photoresist coater Gyrset closed cover coating technology Wafer size up to 200mm 2 Waf Location : AMERICA North (USA-Canada-Mexico)
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More detailsDetails: Mechanical Pusher Pushes PCB’s from Magazine onto Conveyor of Next Machine Bottom Magazine Cl Year(s) : 2002 Location : AMERICA North (USA-Canada-Mexico)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.