Used Metrology and inspection equipment
1,302 resultsOAI MBA 806 Mask Aligner OAI MBA 806 Mask Aligner consisting of: - Model: MBA806 - Manual Wafer Load Mask Alig Location : AMERICA North (USA-Canada-Mexico)
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More detailsOlympus MX-80 Wafer Inspection Microscope Motorized Stage for up to 300mm Wafers Bright/Darkfield Optics: 5X, Location : AMERICA North (USA-Canada-Mexico)
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More detailsAOI/SPI/PCB Inspection Conveyor Specifications PCB Size 50 mm x 50 mm to 450 mm x 350 mm wide (1.97" x 1.97" t Location : AMERICA North (USA-Canada-Mexico)
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More detailsSpatial Resolution 20 line-pairs/mm (standard) 100 line-pairs/mm (w/ optional 10 μm x-ray source) Ano Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: Manncorp Manncorp Sherlock-300F Benchtop AOI Machine Maximum PCB Size 13" x 9.85" (330 mm x 250 mm) 2 Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: Manncorp Manncorp BC Series Inspection / Linking Conveyors PCB Size 50 mm L x 50 mm W to 530 mm L x 4 Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: Manncorp Manncorp Sherlock-300I Inline AOI Machine Minimum PCB Size 2" x 2" (50 mm to 50 mm) Maximum Location : AMERICA North (USA-Canada-Mexico)
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More detailsmask aligner exposes up to 3″ wafers Includes split field optics Location : AMERICA North (USA-Canada-Mexico)
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More detailsMa 6 mask aligner upgraded 1000 watt power supply 1 micron resolution on 6″ wafers Location : AMERICA North (USA-Canada-Mexico)
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More detailsMetal Film thickness measurement Version: 300mm Location : AMERICA North (USA-Canada-Mexico)
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More detailsProgrammable pulse periodic reverse power supply, 20 volts peak, 30 amp maximum DC, 100amp peak pulse, DynaNet Location : AMERICA North (USA-Canada-Mexico)
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More detailsKLA ADE equipment Metrology Location : AMERICA North (USA-Canada-Mexico)
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More detailsBare Wafer Surface Defect Inspection System The Surfscan 6400 is a highly advanced inspection system desig Location : AMERICA North (USA-Canada-Mexico)
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More detailsSurface Inspection System Location : AMERICA North (USA-Canada-Mexico)
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More detailsUnpatterned Surface Inspection System Location : AMERICA North (USA-Canada-Mexico)
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More detailsIn addition to its advanced data analysis software, the ADE 7200 offers a user-friendly interface that makes Location : AMERICA North (USA-Canada-Mexico)
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More detailsThe system features a high-resolution, double-sided non-contact measurement array with a sophisticated silic Location : AMERICA North (USA-Canada-Mexico)
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More detailsAtomic Force Microscope Accessories Stage Controller: NanoScope Model 5000C-1 Scanning Probe Microscope Con Location : AMERICA North (USA-Canada-Mexico)
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More detailsMetrology Equipment Year(s) : 2001 Location : EUROPE (Western and Northern)
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More detailsTEL Precio Wafer Prober Tri-Temp with Chiller Dual FOUP Handlers Wafer Size Range Minimum 200 mm Maxim Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Size 6" Tool's Condition Excellent Nikon Eclips L200 - Wafer size : up to 8" - Objectives : 5X, 10X, 2 Location : ASIA (North East)
Price : On request
More detailsYesTech X-Ray Inspection System YTX-3000_ ID 112791 VOLTAGE 120VAC, 1500W MAX Vintage 2003 130KVA Sealed Tube Location : AMERICA North (USA-Canada-Mexico)
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More detailsPlease visit our website for updated information at www.allwin21.com Updated Brochure in2024： https://allwin Year(s) : 2024 Location : AMERICA North (USA-Canada-Mexico)
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More detailsVintage : NOV 2015 Details 3D AOI Dual Lane Capability 120/210 Voltage Specifications This high-end inspect Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)
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More detailsThe S3088-II utilizes high performance Viscom 8M camera technology to meet extreme throughput requirements. Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.