Used Metrology and inspection equipment
1,052 results- Wafer sizes: 100mm, 150mm, and 200mm - Thin film measurement tool - Broadband UV optics - Dual beam spectrop Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details- Up to 8"/200mm wafer capable - Computer controlled - Measures roughness, waviness, step height, and other su Location : AMERICA North (USA-Canada-Mexico)
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More details- Bare Wafer Surface Defect Inspection System - System can handle up to 200mm capable - Cassette Handling: Sin Location : AMERICA North (USA-Canada-Mexico)
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More details- Spray Acid Tool (SAT) - Single Chamber - Up to 6"/150mm capable - Capacity: Single 25-Wafer Cassette, 150mm Location : AMERICA North (USA-Canada-Mexico)
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More details- Manual Mask Aligner - Topside Alignment (TSA) - Manual Alignment - Up to 6"/150mm Wafer Capable (with proper Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
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More details- Manual Mask Aligner - Topside Alignment (TSA) - Automatic Alignment - Up to 6"/150mm Wafer Capable (with pro Year(s) : 2004 Location : AMERICA North (USA-Canada-Mexico)
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More details- Long Scan Surface Profilometer - Wafer Size: 8"/200mm - S/N: 1090-0420 Location : AMERICA North (USA-Canada-Mexico)
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More details- Up to 8"/200mm wafer capable - Computer controlled - Measures roughness, waviness, step height, and other su Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsFully refurbished to like-new condition, including 1 year warranty, professional installation, and also proce Location : AMERICA North (USA-Canada-Mexico)
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More details<b>1x, KLA-Tencor, 2138XP Surface Inspection System</b> - Currently Setup for Processing 8"/200mm Wafers - L Location : AMERICA North (USA-Canada-Mexico)
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More detailsAOI Software: YesVision V2.8.2 Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)
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More detailsHTO PROCESS lP SIN TEOS PROCESS Year(s) : 1997 Location : ASIA (China - Taiwan - HKG)
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More detailsEXCALIBUR 2000 Location : ASIA (China - Taiwan - HKG)
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More detailsS5000 Location : ASIA (China - Taiwan - HKG)
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More detailsS-7800H Critical Dimension Scanning Electron Microscope (CD-SEM), 4″-8″ Automatic cassette to cassette wafer l Location : ASIA (China - Taiwan - HKG)
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More detailsS8820 Location : ASIA (China - Taiwan - HKG)
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More detailsMA25 mask aligner configured for simultaneous double side exposure and manual operation of wafers with a maxim Location : AMERICA North (USA-Canada-Mexico)
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More detailsMA 56 is a mask alignment and exposure system which offers unsurpassed, highly economical mass production capa Location : AMERICA North (USA-Canada-Mexico)
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More detailsSemiautomatic prober with 150mm (6â€) nickel plated vacuum chuck. B&L Microzoom II microscope with 2.5, 8x, 2 Location : AMERICA North (USA-Canada-Mexico)
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More detailsSemiautomatic prober with 4" wafer chuck Mitutoyo FS-50 microscope with lamphouse motorized microscope xy with Location : AMERICA North (USA-Canada-Mexico)
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More detailsSCA-50 software package ver. 1.21 Build 74 WT200E motorized measuring stage adjustable in 3 axes. Lens mount w Location : AMERICA North (USA-Canada-Mexico)
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More detailsmanual 6" prober with B&L Microzoom 2 Fiber optic light source and adaptor 5" vacuum chuck Location : AMERICA North (USA-Canada-Mexico)
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More detailsset of 4 programmable positioners, north, south, east, west includes cables and interface boards for PA200 pro Location : AMERICA North (USA-Canada-Mexico)
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More detailsultra high resolution remote control XY travel range 10mm Z range 8mm 0.2 micron resolution Location : AMERICA North (USA-Canada-Mexico)
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More detailsFS60 microscope with 2/5/10/20 objectives Location : AMERICA North (USA-Canada-Mexico)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.