Used Metrology and inspection equipment
1,063 resultsMicroscope Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsStereo Microscope Location : AMERICA North (USA-Canada-Mexico)
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More detailsInverted Microscope Location : AMERICA North (USA-Canada-Mexico)
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More detailsProcessed material: 30 x 70 mm or 60 x 70 mm Pyrex Processing amount: 1 jig / batch Heating temperature: MAX 9 Year(s) : 2003 Location : ASIA (North East)
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More detailsspecifications -Piezo drive method: Revolver drive ・ Piezo scanning range: 100 μm * Measurement is about 90 μm Location : ASIA (North East)
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More detailsdescription: - the laser is alive it is built for 110V, but we have a generator Year(s) : 2000 Location : EUROPE (Western and Northern)
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More detailsVertex X-Ray Inspection Machine 130Kv Hamamatsu tube 6/4 Image intensifier Year(s) : 2013 Location : AMERICA North (USA-Canada-Mexico)
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More detailsIncludes: Windows 7 Professional fully networkable PC 35-80kV adjustable X-ray Tube Sealed Type Fl Location : AMERICA North (USA-Canada-Mexico)
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More detailsYTX-3000 X-Ray System Location : AMERICA North (USA-Canada-Mexico)
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More detailsNanoscope III Scanning Probe Microscope Location : AMERICA North (USA-Canada-Mexico)
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More details208v / 20 Amps/ Single Phase /60 Hz Year(s) : 1998 Location : AMERICA North (USA-Canada-Mexico)
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More detailsAligner Location : ASIA (North East)
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More details3D S3088 Ultra Blue Inline AOI Year(s) : 2016 Location : AMERICA North (USA-Canada-Mexico)
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More detailsInverted Metallurgical Microscope Location : AMERICA North (USA-Canada-Mexico)
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More detailsVersamet Microscope S/N: 5103 Location : AMERICA North (USA-Canada-Mexico)
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More detailsOblique Microscope Location : AMERICA North (USA-Canada-Mexico)
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More details- Can handle from 2" up to 8"/200mm wafers - Submicron sensitivity, detects 0.2 micron particles - Surface haz Location : AMERICA North (USA-Canada-Mexico)
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More detailsTemperature Shock Chamber Condition: very good Year(s) : 101252 Location : EUROPE (Western and Northern)
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More detailsFACTS 2 Acoustic Scanning Microscope, model DF2200, 110v Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)
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More detailsbasic board inspection blue vacuum-underscreen-cleaner 400 mm ASM-adjustable screen mount squeegee head with Year(s) : 2003 Location : EUROPE (Western and Northern)
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More detailsExcellent and very clean condition. Equipment details: Haxagon Camera 8 pices 2.2 D Inspection Double Convey Year(s) : 2003 Location : EUROPE (Western and Northern)
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More detailsSpin RInser/Dryer Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Size: 150mm Gasonics Aura A3000 Location : AMERICA North (USA-Canada-Mexico)
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More detailsFacilities: 100-240 VAC, 50/60 Hz, 10 amps / 60 to 90 PSI, 2 CFM Dims: 34.5 x 40 x 55 in. @ 1700 lbs Transfer Year(s) : 2018 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsmicroscope operates with bright field (BF), dark field (DF), and polarization modules. System includes eyepiec Location : AMERICA North (USA-Canada-Mexico)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.