Used Metrology and inspection equipment
1,259 resultsCondition Good Power Requirements 380 V 3 Phase Power Consumption : 17 kw 58 BTU/hour Exterior Dimensio Year(s) : 2000 Location : EUROPE (Western and Northern)
Price : On request
More detailsThin Film measurement Version: Up to 300 MM Vintage: 01.06.2008 SENTECH Senduro 300 The SENDURO® 300 is a pow Year(s) : 2018 Location : AMERICA North (USA-Canada-Mexico)
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More detailsModel 5500 Main System Can handle from 2" up to 8"/200mm wafers Submicron sensitivity, detects 0.2 micron part Year(s) : 2007 Location : EUROPE (Western and Northern)
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More detailsWafer Sizes: 8"/200mm Wafer defect inspection The Leica INS 3000 is the new defect review and inspection stat Year(s) : 1999 Location : EUROPE (Western and Northern)
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More detailsWafer Inspection System Version: 300mm De-installed, warehoused, can be inspected by appointment Location : AMERICA North (USA-Canada-Mexico)
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More detailsWAFER SIZE 8 Year(s) : 1995 Location : EUROPE (Western and Northern)
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More detailsIs equipped with 200KV, W or LaB6, SuperTWIN lens Beautiful and high performer! It includes a single tilt hold Location : AMERICA North (USA-Canada-Mexico)
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More detailsSPUTTERS DOWN PE 2400 3 TARGET SPUTTERING SYSTEM FOR UP TO 6″ WAFERS (ANY SHAPE) RF TARGETS, 8″ DIAMETER FOR M Location : AMERICA North (USA-Canada-Mexico)
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More detailsDouble Stack SRD (Set up for solar wafer use) Version: 100 mm, M0, M2 Vintage: 01.02.1999 -Semitool PSC 101 -S Year(s) : 1999 Location : AMERICA North (USA-Canada-Mexico)
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More detailsAutomated Wafer, Die and Bump Inspection System Version: 300 mm Vintage: 01.06.2008 Dimensions on base: 72 in Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)
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More detailsAutomated Macro Defect Inspection Version: 150 mm/200 mm Automatic Shut down in Fab. Needs to be removed in t Location : AMERICA North (USA-Canada-Mexico)
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More details【specification】 ・Measurement part: XM-T1000 (2 probe type) ・Controller: XM-1500 ・Measurement range: 300mm x 25 Location : ASIA (North East)
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More detailsOne Shot 3D Shape Measuring Machine 【specification】 ・Year: 2015 ・Measurable height: Wide field mode 10mm, h Year(s) : 2015 Location : ASIA (North East)
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More detailsHigh-Tech Science Scanning White Interference Microscope <b> specification </b> ○Observation interference mi Location : ASIA (North East)
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More detailsIT Control System X-ray Nondestructive Inspection System <b> Specification </b> Table size: 410×360 mm Tabl Year(s) : 2017 Location : ASIA (North East)
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More detailsWafer Size 8" Vintage 2002-8 Tool's Condition Excellent - Long Scan Profiler P-15 Measurement. - Micro Head I Year(s) : 2002 Location : ASIA (North East)
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More detailsBinocular Angle 45° Eyepieces Magnification 20 X Field Number 13 mm Focusing YES Objective Model Location : AMERICA North (USA-Canada-Mexico)
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More detailsBinocular Angle 45° Eyepieces Magnification 20 X Focusing YES Magnification Range 18 X - 150 X Zo Location : AMERICA North (USA-Canada-Mexico)
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More details【specification】 Observation method Epi-illumination: bright field, dark field, differential interference obse Location : ASIA (North East)
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More detailsBrand Mitaka Kohki Non-contact 3D measuring device 【Main Specifications】 〇Microscope section ・Expensive obser Location : ASIA (North East)
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More detailsSurface roughness measuring machine Year: Model: 2011 Measurement range/resolution: Z axis 800μm/0.01μm, 80 Year(s) : 2011 Location : ASIA (North East)
Price : On request
More detailsYear: Model: 2015 Tilt mechanism: Yes (X axis, tilt angle ±45 degrees) Measurement range/resolution: X-axis 20 Year(s) : 2015 Location : ASIA (North East)
Price : On request
More detailsEquipped with Magnum ion Column SFEG UHR SEM STEM capable! 5 axis stage with 100 x 100 mm XY Turbo vacuum 2 GI Location : AMERICA North (USA-Canada-Mexico)
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More detailsXray Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)
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More details【specification】 ・Measuring head/controller: VR-3200/VR-3000 ・Observation mode: Wide field of view (12, 25, 38, Location : ASIA (North East)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.