Spea 3030IL Dual bay

Spea 3030IL dual bay in excellent condition.
Vintage 2006

The 3030IL is the fully automatic bed-of-nails tester expressly designed to
minimize the cost of test, providing unparalleled throughput without
requiring the operator to load the PCB or perform the test.
It can be quickly integrated into SMEMA production lines,
or used with standard automatic board loaders/unloaders.
Modular and fully upgradable, 3030IL combines a wide range of
test capabilities in a unique, integrated, high-throughput, cost-effective system.

Key features:
4x throughput with 4-Core Architecture
No operator cost
Ultra-fast handling in 3 sec.
5000+ tests/sec
Automatic test program generation
Parallel programming of different-type ICs

Specificaties:
Test Core
Number of cores:
Configuration - Cores x channels
Analog channels - characteristics
Digital channels - quantity
Digital channels - Characteristics

Measurement capability
Resistance range - 1mΩ - 1GΩ
Inductance range - 1µH - 1H
Capacitance range - 0.5pF ÷ 1F

Test type
Electrical test
ICT (In-Circuit Test) :Yes
High Power Functional Test: Yes
Open Pin Scan Yes 15°C ÷ 32°C
Power-On Test Yes
Functional Test: Yes
Flashing via On-Board Programming: Yes
Open / Short:: Yes
Boundary Scan Yes

Other test
LED Color & Intensity Test: Optional

Instruments on interface
Parallel test: Yes

Interface
Zif Version: Yes

Enviromental requirements
Transport temperature range: -25°C ÷ +55°C
Environmental temperature range: 15°C ÷ 32°C
Measurement temperature: 15°C ÷ 32°C
range Humidity: ≥20% ÷ ≤70%

System specifcation
Body main dimensions (L x W x H): 900 x 970 x 1737mm