Hitachi S-4700
Ref :
2747454-9-AS
Condition :
Used
Manufacturer :
Hitachi
Model :
S-4700
Year(s) :
2002
Quantity :
1
Location :
Seller or machines location:
AMERICA North (USA-Canada-Mexico)
AMERICA North (USA-Canada-Mexico)
• Guaranteed Resolution at 1 kV: 2.1 nm
• Resolution at 15 kV: 1.5 nm
• Working Distance: 12 mm
• Sample Exchange: Airlock system, no repositioning needed
• Sample Tilt: 45° without changing working distance
• X-ray Take-off Angle: 30° with sample normal to beam
• Electron Detectors: Integrated SE and BSE
• Imaging Modes: Ultra-high-resolution and analysis mode (computer-controlled)
• Objective Lens: Allows simultaneous use of YAG-type BSE and EDX detectors
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