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Used Metrology and inspection equipment

1,217 results
1

Max PCB: 510 x 510 mm Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)

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Inline AOI 5 Camera Windows 7 DOM: 10/2012 Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)

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The S3088-II utilizes high performance Viscom 8M camera technology to meet extreme throughput requirements. Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)

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Focused Ion Beam (FIB) system. Location : United States (USA)

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Condition Good Power Requirements 380 V 3 Phase Power Consumption : 17 kw 58 BTU/Hour Exterior Dimensio Year(s) : 1999 Location : EUROPE (Western and Northern)

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Optical 3D Surface Profiler Manufacturer: Sensofar Model: PLu Neox Optical 3D Surface Profiler with motorized Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)

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Condition Good Power Requirements 380 V 3 Phase Power Consumption : 17 KW 58 BTU/Hour Exterior Dimensio Year(s) : 2003 Location : EUROPE (Western and Northern)

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Condition Good Power Requirements 380 V 3 Phase Other Information Power Consumption : 17 kW 58 BTU/Hou Year(s) : 2006 Location : EUROPE (Western and Northern)

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Condition Good Power Requirements 380 V 3 Phase Other Information Power Consumption Exterior Dimensi Year(s) : 2001 Location : EUROPE (Western and Northern)

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Condition Good Power Requirements 380 V 3 Phase Power Consumption : 17 kw 58 BTU/hour Exterior Dimensio Year(s) : 2000 Location : EUROPE (Western and Northern)

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Thin Film measurement Version: Up to 300 MM Vintage: 01.06.2008 SENTECH Senduro 300 The SENDURO® 300 is a pow Year(s) : 2018 Location : AMERICA North (USA-Canada-Mexico)

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Model 5500 Main System Can handle from 2" up to 8"/200mm wafers Submicron sensitivity, detects 0.2 micron part Year(s) : 2007 Location : EUROPE (Western and Northern)

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Wafer Sizes: 8"/200mm Wafer defect inspection The Leica INS 3000 is the new defect review and inspection stat Year(s) : 1999 Location : EUROPE (Western and Northern)

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Coater developer Location : ASIA (North East)

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Wafer Inspection System Version: 300mm De-installed, warehoused, can be inspected by appointment Location : AMERICA North (USA-Canada-Mexico)

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WAFER SIZE 8 Year(s) : 1995 Location : EUROPE (Western and Northern)

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Rate Voltage: 220 VAC Rate Current: 10A Rate Frequency: 50 Hz Equipped with Panasonic Year(s) : 2017 Location : AMERICA North (USA-Canada-Mexico)

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SPUTTERS DOWN PE 2400 3 TARGET SPUTTERING SYSTEM FOR UP TO 6″ WAFERS (ANY SHAPE) RF TARGETS, 8″ DIAMETER FOR M Location : AMERICA North (USA-Canada-Mexico)

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Double Stack SRD (Set up for solar wafer use) Version: 100 mm, M0, M2 Vintage: 01.02.1999 -Semitool PSC 101 -S Year(s) : 1999 Location : AMERICA North (USA-Canada-Mexico)

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3D measuring platform for products of max 600mm x 600mm x 300mm lxwxh, resolution 0,0001mm. Year 2008. Year(s) : 2008 Location : EUROPE (Western and Northern)

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AOI for panel or reel to reel, max panel size 515mmx515mm, max exposure area reel to reel 250mmx500mm. with Year(s) : 2016 Location : EUROPE (Western and Northern)

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Automated Wafer, Die and Bump Inspection System Version: 300 mm Vintage: 01.06.2008 Dimensions on base: 72 in Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)

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Automated Macro Defect Inspection Version: 150 mm/200 mm Automatic Shut down in Fab. Needs to be removed in t Location : AMERICA North (USA-Canada-Mexico)

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Wafer Size 8" Vintage 2002-8 Tool's Condition Excellent - Long Scan Profiler P-15 Measurement. - Micro Head I Year(s) : 2002 Location : ASIA (North East)

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Binocular Angle 45° Eyepieces Magnification 20 X Field Number 13 mm Focusing YES Objective Model Location : AMERICA North (USA-Canada-Mexico)

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You can find used Metrology and inspection equipment on Wotol

The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.

The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.

HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. 

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