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Used Metrology and inspection equipment

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console with keypad controller Free angle stand with manual X,Y,Z and theta rotation of stage Zoom lens 150-8 Location : EUROPE (Western and Northern)

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Photoresist Year(s) : 2013 Location : EUROPE (Western and Northern)

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SDP-ALD NIT 12 Thin Film ALD SiN/SiO Wafer Size 12 Location : EUROPE (Western and Northern)

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IPS AKRA CVD Ti/TiN Year(s) : 2010 Location : EUROPE (Western and Northern)

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Process: Thin Film Stress Measurement System Year(s) : 2007 Location : EUROPE (Western and Northern)

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Fixed Binocular Head U-BI30 Pair of WHN10x/22 Eyepieces (one adjustable). Fixed Stage with Right Hand Coaxial Location : EUROPE (Western and Northern)

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WAFER SIZE 8 Location : EUROPE (Western and Northern)

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TENCOR Surfscan 4500 Wafer surface inspection Unpatterned Wafer Surface Inspection Tool, for 75mm-150mm Wafer Location : EUROPE (Western and Northern)

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Camera and Optics: Review camera CCD : 3CCD Color Review camera Resolution : 752pixels*582 lines Second Camera Location : EUROPE (Western and Northern)

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Printed Circuit Board Manufacturing Location : EUROPE (Western and Northern)

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ADE Episcan 1000 FT-IR Measurement of Epi Films <25µ ON-LINE TECHNOLOGIES 2110 Spectrometer Head IRVINE OPTICA Year(s) : 2000 Location : EUROPE (Western and Northern)

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Mirtec MV-6e Omni 3D AOI- 2016 #17161122-3535 DOM: 11/2016 SW: Mirtec inspector 5.5.400.332 Win 7 Lighting: Year(s) : 2016 Location : AMERICA North (USA-Canada-Mexico)

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Omron VT-RNS-II Inline AOI Machine 120V Single phase Max board 18x20" Board size : L Good working order M Location : AMERICA North (USA-Canada-Mexico)

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YESTECH Nordson YTV-FX 2014 Inline AOI, 5 Camera, Windows 7 - DOM: 4/2014 Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)

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Mirtec MV-3L Benchtop AOI 5 Cameras DOM: 02/2018 Windows 7 - SW: Mirtec Inspector 5.5.400.327 5 Cameras: Year(s) : 2018 Location : AMERICA North (USA-Canada-Mexico)

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YESTECH Nordson YTV-FX 2014 Inline AOI, 5 Camera Windows 7 YesVision V2.8.0 DOM: 6/2013 Year(s) : 2013 Location : AMERICA North (USA-Canada-Mexico)

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DOM: February 2015 457 x 308 mm (18” x 12”) inspection area 12 um high-resolution, high-speed CMOS cameras In Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)

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Cyberoptics SE500-ULTRA SPI - 2015 #55076 DOM: March 2015 Win 7, V5.4.01283 software 510 x 510mm (20 x 20 in. Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)

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Max PCB: 510 x 510 mm Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)

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Yestech YTV-2050 5 camera inline AOI system, yesvision 2.8.2 SW 1 x top down camera 4 side camera Calibration Location : AMERICA North (USA-Canada-Mexico)

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YESTECH Nordson B3 Benchtop AOI w/ Color LED stadium lighting Color LED stadium lighting (fusion) 2.7 Softwar Location : AMERICA North (USA-Canada-Mexico)

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ViTechnology 3D SPI 4000L 3D Solder Paste Inspection System 2009 Location : AMERICA North (USA-Canada-Mexico)

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Brand: Visionmaster / ASC Visionmaster / ASC VM450 3d SPI solder paste measurement system Location : AMERICA North (USA-Canada-Mexico)

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Viscom S3088-III AOI 06/2011 High resolution 01005 capable 8MP camera 4 size camera Calibration kits Repair/r Location : AMERICA North (USA-Canada-Mexico)

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Brand: TRI Test Research TRI Test Research 7006L 2012 3D SPI Solder paste inspection system 6.2012 Vintage H Location : AMERICA North (USA-Canada-Mexico)

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You can find used Metrology and inspection equipment on Wotol

The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.

The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.

HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. 

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