Used Metrology and inspection equipment
1,258 resultsMicroscope Accessories without x - y table Power Requirements 200-240 V 2.0 A 50/60 Hz Condition Go Year(s) : 1997 Location : EUROPE (Western and Northern)
Price : On request
More detailsWafer Inspection System, WS-75BU, WS-70LCKT/15M Location : EUROPE (Western and Northern)
Price : On request
More detailsCondition Refurbished 200mm Patterned wafer inspection System This Tool was refurbished in 2017 and two new L Year(s) : 2001 Location : EUROPE (Western and Northern)
Price : On request
More detailsNikon Eclipse L200N inspection microscope with brightfield and darkfield episcopic illumination Trinocular vi Location : EUROPE (Western and Northern)
Price : On request
More details[Specifications] - Model year: 2012 - Measurement principle: VSI method: White light vertical scanning interfe Year(s) : 2012 Location : ASIA (North East)
Price : On request
More detailsAOI System Year(s) : 2007 Location : EUROPE (Western and Northern)
Price : On request
More details*. Process: wafer Sheet Resistance measurement *. Measurement perfomance: - 4 Point Probe check surface on Sil Year(s) : 1998 Location : ASIA (North East)
Price : On request
More detailsX-Ray Inspection System Model XD7600NT Location : EUROPE (Western and Northern)
Price : On request
More detailsThe IVS120 is an automatic metrology system designed for measuring critical dimensions (CD´s). Power Requirem Year(s) : 1998 Location : EUROPE (Western and Northern)
Price : On request
More detailsWafer inspection system WS-75BU, WS-70LCKT/15M Location : EUROPE (Western and Northern)
Price : On request
More detailsWafer Inspection System Model 7555.0 Location : EUROPE (Western and Northern)
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More detailsThe system was deinstalled in september 2002 and until that date was upgraded with various hardware and soft Location : EUROPE (Western and Northern)
Price : On request
More detailsThe KLA is complete and refurbished in 2015. No known condition issues. Year(s) : 1992 Location : EUROPE (Western and Northern)
Price : On request
More details3 Ports: 200 mm / 300 mm Refurbished Location : EUROPE (Western and Northern)
Price : On request
More detailsAutomatic Defect Inspection Machine Model NSX 95 Location : EUROPE (Western and Northern)
Price : On request
More detailsParts machine 2008 Vintage Model NSX 105 Inspection System, 8" Year(s) : 2008 Location : EUROPE (Western and Northern)
Price : On request
More detailsWafer Inspection System SFS7700 Used condition, recently came out from the working Environment. Year(s) : 1997 Location : EUROPE (Western and Northern)
Price : On request
More detailsInspection system Brand Nanotronics Imaging Inc. Model nSPEC Year(s) : 2018 Location : EUROPE (Western and Northern)
Price : On request
More details3D Solder Paste Inspection Max Inspection Area: 20”x19.8” Max PCB: 510 x 510 mm (20.0 x 20.0 in.) Min PCB: 50 Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsUV curing device Location : ASIA (North East)
Price : On request
More detailsConfigured for 200/300mm Manuals and Documentation Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsVeeco Wyko NT3300 Profiler consisting of: - Model: NT3300 - Computer & Monitor - Keyboard & Mouse - Objective Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsKLA-TENCOR SURFSCAN 6420 PARTICLE INSPECTION SYSTEM consisting of: Model: Surfscan 6420 Particle inspection sy Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsVintage 2014 Condition: excellent CE marked Year(s) : 2014 Location : EUROPE (Western and Northern)
Price : On request
More detailsSemiprobe wafer prober mounted on Newport table Inspects diced wafers mounted on film frames Wafer stage with Location : EUROPE (Western and Northern)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.