Used Metrology and inspection equipment
1,300 results- 1 Phase - 50/60 Hz 2011 Vintage Year(s) : 2011 Location : EUROPE (Western and Northern)
Price : On request
More detailsWafer Inspection System Model Optistation 3100 Location : EUROPE (Western and Northern)
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More detailsRUDOLPH WV320 Wafer size: 300mm Process: measurement Location : EUROPE (Western and Northern)
Price : On request
More detailsNikon NWL860 Wafer Loader With ISS200 Microscope Download the documents below for more information: NWL860 cat Year(s) : 2000 Location : EUROPE (Western and Northern)
Price : On request
More detailsProcess: UNDOPED-POLY INSPECTION DATE 2024-08-21 General Info 1 System Layout Main , Utility 2 System Type L- Year(s) : 2003 Location : EUROPE (Western and Northern)
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More detailsTool ID T-103 Process COATER, DEVELOPER Wafer Size 200mm Year(s) : 1996 Location : EUROPE (Western and Northern)
Price : On request
More detailsProcess:D-POLY INSPECTION DATE 2024. 08. 21 Gas system: 1 Process Gas N2, SiH4, Ph3, ClF3 2 Basic Style Integ Year(s) : 2004 Location : EUROPE (Western and Northern)
Price : On request
More detailsProcess Type: Microscope Location : EUROPE (Western and Northern)
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More details- Refurbished - 0.050 um Defect Sensitivity on Polished Bare Silicon - Enhanced Rough Film Sensitivity - Alrea Location : EUROPE (Western and Northern)
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More detailsOlympus TH3 Polish Inspection Microscope, w/ WHK10x/20L eyepieces; objectives (1ea): ULWD NeoSPlan 20x/0.40, Location : EUROPE (Western and Northern)
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More detailsWafer inspection Microscope system Model Mis 8 Location : EUROPE (Western and Northern)
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More detailsFurther details in attachment. Equipment/Component Type:High Speed Color AOI Item has scratches and markings Year(s) : 2003 Location : EUROPE (Western and Northern)
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More details- 4mega camera - 20um pixel resolution - 510*460mm Year(s) : 2013 Location : EUROPE (Western and Northern)
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More detailsRefurbished to OEM Specs Rudolph/August Wafer Inspection System Model:NSX-105C Condition: Good working condit Year(s) : 2006 Location : EUROPE (Western and Northern)
Price : On request
More detailsRefurbished with 6 Mnths warranty System has Windows NT System has Dual Spot Optics System has Transformer fo Year(s) : 2000 Location : EUROPE (Western and Northern)
Price : On request
More detailsSold As-Is, Where-Is Overall condition is okay but it is missing optical fiber deinstalled and stored Location : EUROPE (Western and Northern)
Price : On request
More detailsMachine is complete and look to be in good condition Year(s) : 2004 Location : EUROPE (Western and Northern)
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More detailsSoftware version: 10.2.4.0101 This is a CS900 running CS920 software Tool powers on and initializes Does not h Year(s) : 2017 Location : EUROPE (Western and Northern)
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More detailsWarehoused It was in Working Condition before buying it. No EDX Vintage : 2000. It's completer with HDD and So Year(s) : 2000 Location : EUROPE (Western and Northern)
Price : On request
More detailsCategory: Metrology Maker: KLA Model: MIS-200 Wafer Size: 200 Process: Inspection Config Review inspection. N Location : EUROPE (Western and Northern)
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More details50Hz/60Hz Missing Parts: Controller PCB cards, Handling Robot and Controller 2005 Vintage Year(s) : 2005 Location : EUROPE (Western and Northern)
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More details- Type II - EDX 1) Performance Resolution: - 1.5 nm guaranteed (at accelerating voltage 15 kV, working distan Year(s) : 1997 Location : EUROPE (Western and Northern)
Price : On request
More detailsParticle counter for transparent wafer 6 Inch As is cold down Was working before de-install, Year(s) : 2011 Location : EUROPE (Western and Northern)
Price : On request
More detailsHitachi WA200 FAB SMIFF interface Wide area scanning probe microscope Year(s) : 2001 Location : EUROPE (Western and Northern)
Price : On request
More detailsMetrology Model INS3300 Location : EUROPE (Western and Northern)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.