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Used Metrology and inspection equipment

1,236 results
1

Zeiss Microscope Set-up for cross sections, with 1x Zeiss Microscope type Stemi SV 11, 1x Zeiss Microscope t Location : EUROPE (Western and Northern)

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Nordson Dage XD7500VR Jade FP 160KV X-Ray System DOM : 7/2015 Open tube Flat panel detector 200-230V 16A Sin Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)

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MRSI 300mm (12″ INCH) PROBE STATION 300mm (12″ INCH) CHUCK 300mm (12″ INCH) X 300mm (12″ INCH) TRAVEL ANORAD T Location : AMERICA North (USA-Canada-Mexico)

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Sold As-Is, Where-Is Overall condition is okay but it is missing optical fiber deinstalled and stored Location : EUROPE (Western and Northern)

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Machine is complete and look to be in good condition Year(s) : 2004 Location : EUROPE (Western and Northern)

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Spea 3030IL dual bay in excellent condition. Vintage 2006 The 3030IL is the fully automatic bed-of-nails test Year(s) : 2006 Location : EUROPE (Western and Northern)

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Nordson YESTECH YTV-FX in excellent condition. vintage 2011 Specifications: Throughput: Up to 10 sq. in./sec. Year(s) : 2011 Location : EUROPE (Western and Northern)

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Specifications Resolution: High Vacuum mode: 3nm (30kV)*, 4nm (20kV), 8nm (3kV), 15nm (1kV) Low Vacuum mode: 4 Year(s) : 2018 Location : AMERICA North (USA-Canada-Mexico)

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Software version: 10.2.4.0101 This is a CS900 running CS920 software Tool powers on and initializes Does not h Year(s) : 2017 Location : EUROPE (Western and Northern)

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Warehoused It was in Working Condition before buying it. No EDX Vintage : 2000. It's completer with HDD and So Year(s) : 2000 Location : EUROPE (Western and Northern)

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Die level inspection on tape & reel and waffle plate. Manufacturer Exclusive Master Power Requirements 230 V Year(s) : 2016 Location : EUROPE (Western and Northern)

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Hours: 10 hours - Demo Machine! Sealed Micro-Focus X-Ray Tube 90KV Current Range 10-200 μA Max Output Power 8W Location : AMERICA North (USA-Canada-Mexico)

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• Type: Scanning Electron Microscope (SEM) • Configuration: With EDAX • Resolution at 1 kV: 2.1 nm • Resolutio Year(s) : 2002 Location : AMERICA North (USA-Canada-Mexico)

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measurement: Non-Contact type resistance measurement Year(s) : 2012 Location : ASIA (North East)

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Category: Metrology Maker: KLA Model: MIS-200 Wafer Size: 200 Process: Inspection Config Review inspection. N Location : EUROPE (Western and Northern)

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50Hz/60Hz Missing Parts: Controller PCB cards, Handling Robot and Controller 2005 Vintage Year(s) : 2005 Location : EUROPE (Western and Northern)

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SEMITOOL 1-CHAMBER 300MM SPRAY ACID TOOL (SAT) consisting of: - Model: SAT-1100S1PSHU - Spray Acid Tool (SAT) Location : AMERICA North (USA-Canada-Mexico)

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Measurement: Film thickness/6in Year(s) : 2020 Location : ASIA (North East)

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AOI for rigid panel or flex reel to reel feed, rigid panels max panel size 515mm x 515mm. Year(s) : 2019 Location : EUROPE (Western and Northern)

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- Type II - EDX 1) Performance Resolution: - 1.5 nm guaranteed (at accelerating voltage 15 kV, working distan Year(s) : 1997 Location : EUROPE (Western and Northern)

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Particle counter for transparent wafer 6 Inch As is cold down Was working before de-install, Year(s) : 2011 Location : EUROPE (Western and Northern)

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Centura TCCP – TAN Ox Location : AMERICA North (USA-Canada-Mexico)

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Thin Films measurement tool, 8300 XSE Film Thickness Analyzer, Semi Automatic loader (150, 200, and 300mm wafe Location : AMERICA North (USA-Canada-Mexico)

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DOM: August 2013 457 x 308 mm (18” x 12”) inspection area 12 um high-resolution, high-speed CMOS cameras Inspe Year(s) : 2013 Location : AMERICA North (USA-Canada-Mexico)

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457 x 308 mm (18” x 12”) inspection area 12 um high-resolution, high-speed CMOS cameras Inspection Speed 200cm Year(s) : 2016 Location : AMERICA North (USA-Canada-Mexico)

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You can find used Metrology and inspection equipment on Wotol

The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.

The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.

HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. 

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