Used Metrology and inspection equipment
1,217 resultsFilm Thickness WAFER SIZE 8 Year(s) : 1996 Location : EUROPE (Western and Northern)
Price : On request
More detailsComplete Unit Model:340 Location : EUROPE (Western and Northern)
Price : On request
More detailsPower Requirements 115/ 230 V 60 Hz 1 Phase CE Marked YES Condition Good Year(s) : 2001 Location : EUROPE (Western and Northern)
Price : On request
More detailsAutomatic Surface Inspection System ›Vaccum: 6mm (0.25 in.) line – 500mm (20 in.) of Hg / flow rate 0.24 l/s Year(s) : 1996 Location : EUROPE (Western and Northern)
Price : On request
More detailseS32 is a top-of-the-line mask and wafer inspection equipment that is designed to meet the most stringent qua Year(s) : 2006 Location : EUROPE (Western and Northern)
Price : On request
More detailsCurrently Under KLA Service Contract. Location : EUROPE (Western and Northern)
Price : On request
More detailsas is where is in fab running Year(s) : 2006 Location : EUROPE (Western and Northern)
Price : On request
More detailsMania Argos 850 YOM 05/2003 Fully functional Year(s) : 2003 Location : EUROPE (Western and Northern)
Price : On request
More detailsVintage : 2004. HDDs included, please see the photos. Year(s) : 2004 Location : EUROPE (Western and Northern)
Price : On request
More detailsWAFER SIZE 200mm Location : EUROPE (Western and Northern)
Price : On request
More detailsModel: SEM Vision cX OEM: AMAT Accessory: 1 Baking Box, 1 User Manual Condition at Time of Shutdown: Operated Year(s) : 2001 Location : EUROPE (Western and Northern)
Price : On request
More detailsKLA Tencor Altair 8935 Wafer Inspection System consisting of: - Multiple Wafer Size Configurations Availabl Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsSEM / FIB Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsInspection: Profilometer Year(s) : 1999 Location : ASIA (North East)
Price : On request
More detailsdouble rail; CPK2.6; 30 type camera--4pcs; nozzle--48pcs Year(s) : 2012 Location : EUROPE (Western and Northern)
Price : On request
More detailsKLA-TENCOR CANDELA CS920 SURFACE ANALYZER consisting of: Model: Candela CS920 Vintage: 2017 Surface Analyzing Year(s) : 2017 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsInspection microscope with reflected and transmitted illumination Reflected and transmitted light 5x/10x/20x/5 Location : EUROPE (Western and Northern)
Price : On request
More detailsKLA-TENCOR 2139 SURFACE INSPECTION SYSTEM consisting of: - Model: 2139 - Configured for 200mm Dual Open Ca Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsKLA-TENCOR PROMETRIX RS100 FOUR POINT PROBE RESISTIVITY MAPPING SYSTEM consisting of: - Model: Prometrix RS10 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsKLA-TENCOR HRP-240 PROFILER consisting of: - Model: HRP-240 - Automated Surface Profiler - WAFER SIZE : 150mm Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsInspection: Surface profiler/Contour film thickness gauge Location : ASIA (North East)
Price : On request
More detailsInspection: Wafer Location : ASIA (North East)
Price : On request
More detailsInspection: Profilometer Location : ASIA (North East)
Price : On request
More detailsEO Technics CSM2000 Chip Scale Marker consisting of: - Manufacturer: EO Technics - Model: CSM2000 - Vintage: Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsAtomic Force Microscope (AFM) Wafer Size Range Minimum 200 mm Maximum 300 mm Set Size 300 mm Power Requir Year(s) : 2004 Location : EUROPE (Western and Northern)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.