Used Metrology and inspection equipment
1,040 resultsObservation method Transmission: bright field Epi-illumination: bright field, dark field, high intensity (UV) Location : ASIA (North East)
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More detailsWafer Size: 200mm 150/200mm Open Handler Software Version 5.3.17.4 Double Darkfield Inspection Tool SECS II Year(s) : 1999 Location : AMERICA North (USA-Canada-Mexico)
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More detailsG2 F20 S TWIN TMP, 300mm Scanning Electron Microscope Location : AMERICA North (USA-Canada-Mexico)
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More detailsExterior Dimensions Width 47.244 in (120.0 cm) Depth 58.268 in (148.0 cm) Height 66.929 in (1 Year(s) : 2015 Location : EUROPE (Western and Northern)
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More detailsMain System FEI TL-150 Handler System Asyst Front End with AeroTech Software Version 2.55.6.107 Factory Interf Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)
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More details8 inch WAFER PROBE SYSTEM Location : AMERICA North (USA-Canada-Mexico)
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More details1200 8 inch WAFER PROBE SYSTEM Location : AMERICA North (USA-Canada-Mexico)
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More detailsINSPECTION MICROSCOPE WITH FOCEA SYSTEM Location : EUROPE (Western and Northern)
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More detailsSEM/Scanning electron microscope Year(s) : 2003 Location : ASIA (North East)
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More detailsSEM Year(s) : 1999 Location : ASIA (North East)
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More detailsIon implant Year(s) : 1997 Location : ASIA (North East)
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More detailsLaser Cutting System Wafer Size Range Minimum 100 mm Maximum 150 mm Accessories Cutting Table Safet Year(s) : 1994 Location : EUROPE (Western and Northern)
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More details120mm X 120mm TRAVEL SCRIBE RANGE WITH SKIP IS 3X3″ SMALLEST STEPS: X=5 MICRONS, Y=1 MICRON (5 MICRON ACCURACY Location : AMERICA North (USA-Canada-Mexico)
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More detailsTencor Candela 2 is an optical metrology system manufactured by KLA Corporation. It is primarily used in the Location : AMERICA North (USA-Canada-Mexico)
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More detailsCS-201- R rotary bin, full off trays All manuals (complete) Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
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More detailsThe KY8030-2 has maintained the industry’s leading position as the best-selling True 3D Solder Paste Inspectio Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Size 8 Year(s) : 1996 Location : ASIA (North East)
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More detailsWafer Size 12 Year(s) : 2006 Location : ASIA (North East)
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More detailsComplete Nikon microscope-system CE Marked YES Year of Manufacture 2010 Condition Excellent Year(s) : 2010 Location : EUROPE (Western and Northern)
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More detailsSpectroscopic ellipsometry: Measures the change in polarization state of light reflected from a sample to de Location : AMERICA North (USA-Canada-Mexico)
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More detailsLaser System Year(s) : 2016 Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Size Range Minimum 125 mm Maximum 200 mm Controller Type PC Controller Type Cassette to Cassett Year(s) : 1998 Location : EUROPE (Western and Northern)
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More detailsScientific and Laboratory Equipment Location : EUROPE (Western and Northern)
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More detailsDescription Step Height Measure Location : ASIA (North East)
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More detailsThickness Measurement Wafer Size 8" Location : ASIA (North East)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.