Used Metrology and inspection equipment
1,300 results300mm inspection microscope for reflected and transmitted light inspection Nikon stage with 12" x 14" XY trave Year(s) : 2002 Location : EUROPE (Western and Northern)
Price : On request
More detailsUltra Micro Hardness Tester Model DUH 202 Location : EUROPE (Western and Northern)
Price : On request
More detailsLike new condition Year(s) : 2001 Location : EUROPE (Western and Northern)
Price : On request
More detailsReflected light microscope configured for brightfield and darkfield inspection stage has 6x6 xy travel 5 pla Location : EUROPE (Western and Northern)
Price : On request
More detailsConfigured for Top Alignment Wafer Size: Small Pieces up to 4"/100mm Diameter Wafers Exposure Modes: Hard, So Year(s) : 2007 Location : EUROPE (Western and Northern)
Price : On request
More detailsUsed, looks complete, very clean Year(s) : 1993 Location : EUROPE (Western and Northern)
Price : On request
More detailsUsed, looks complete, very clean Location : EUROPE (Western and Northern)
Price : On request
More details200mm Description Non working/running rvsi inspection set up for 267mm TSV. Missing robot, ocr cameras Year(s) : 2003 Location : EUROPE (Western and Northern)
Price : On request
More detailsSold in good working condition Refurbished WaferMark Sigmaclean Laser Marking Machine Vintage:2001 With Ultra Year(s) : 2001 Location : EUROPE (Western and Northern)
Price : On request
More detailsThis JEOL JASM-6200 Atmospheric Scanning Electron Microscope Clairescope was removed from a university lab wh Year(s) : 1993 Location : EUROPE (Western and Northern)
Price : On request
More detailsInverted Fluorescence Motorised Microscope Model Observer.Z1 Location : EUROPE (Western and Northern)
Price : On request
More detailsThis Jeol JSM-5910LV SEM Scanning Electron Microscope was removed from a university lab where it was surplus Location : EUROPE (Western and Northern)
Price : On request
More detailsSignatone CM100 manual prober Analytical probe station with submicron resolution Manual control of wafer stage Location : EUROPE (Western and Northern)
Price : On request
More detailsOnly 100 working Hours, Open to best offers Year(s) : 2019 Location : EUROPE (Western and Northern)
Price : On request
More detailsVintage: 2016 Brightness controller of 2D measurement need to be exchanged Please inspect tool to reconfirm Year(s) : 2016 Location : EUROPE (Western and Northern)
Price : On request
More detailsVintage: 1995 Condition: good Wentworth Probe Station with probes, 105mm vacuum plate, 4 objectives, color di Year(s) : 1995 Location : EUROPE (Western and Northern)
Price : On request
More detailsWafer size: 300mm Category: diffusion Process: ALO Furnace Pics 1-8 = tool 1 Pics 9-16 = tool 2 Year(s) : 2003 Location : EUROPE (Western and Northern)
Price : On request
More detailsTester Year(s) : 1993 Location : EUROPE (Western and Northern)
Price : On request
More detailsREFURBISHED COMPLETE & WORKING CONDITION Binocular 3 Stage MHS 10×6 (X:250 Y:150) Processor DP-303 (X/Y/Z 3 ax Location : EUROPE (Western and Northern)
Price : On request
More detailsWAFER SIZE 12 Year(s) : 2014 Location : EUROPE (Western and Northern)
Price : On request
More detailsMissing some parts Sold as-is Wafer Size 200mm Location : EUROPE (Western and Northern)
Price : On request
More details6" Condition: Good- Functional Location : EUROPE (Western and Northern)
Price : On request
More detailsKLA-TENCOR Opti-2600 Thickness Measurement Year(s) : 1995 Location : EUROPE (Western and Northern)
Price : On request
More detailsThis is being sold refurbished with a 3 months parts warranty. Its currently configured with SMIF but can be Year(s) : 1999 Location : EUROPE (Western and Northern)
Price : On request
More detailsScanning Electron Microscope Model S 4500 SEM Year(s) : 1994 Location : EUROPE (Western and Northern)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.