Used Metrology and inspection equipment
1,304 resultsStereo Microscope Location : AMERICA North (USA-Canada-Mexico)
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More detailsInverted Microscope Location : AMERICA North (USA-Canada-Mexico)
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More detailsInverted Metallurgical Microscope Location : AMERICA North (USA-Canada-Mexico)
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More detailsVersamet Microscope S/N: 5103 Location : AMERICA North (USA-Canada-Mexico)
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More detailsOblique Microscope Location : AMERICA North (USA-Canada-Mexico)
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More detailsStereo Microscope Location : AMERICA North (USA-Canada-Mexico)
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More detailsSloan Dektak Profilometer Location : AMERICA North (USA-Canada-Mexico)
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More detailsZeiss Trinocular Microscope Location : AMERICA North (USA-Canada-Mexico)
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More detailsUSHIO MP7150 LTCC / GREEN TAPE PUNCH P Location : AMERICA North (USA-Canada-Mexico)
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More details• Magnification: 7X to 2000X • Variable Magnification: 7X to 500X • Resolution: 10 microns (depending on magni Year(s) : 2022 Location : AMERICA North (USA-Canada-Mexico)
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More detailsHigh-temperature Ion Implanter for SiC IH-860PSIC The Ion Implanter IH-860DSIC is a system especially designed Location : AMERICA North (USA-Canada-Mexico)
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More detailsTakaya APT-9411CE Flying Probe Test System Vintage: 2017 4 Top side probes Single phase, 50/60 Hz 2.2 kVA 240V Year(s) : 2017 Location : AMERICA North (USA-Canada-Mexico)
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More details・IC pretreatment method: Automatic acid addition and aeration treatment ・Carrier gas: High-purity air ・Sample Location : ASIA (North East)
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More detailsWafer inspection/review station for bare and patterned wafers Inspect 300mm wafers in FOUP loaders or 200mm wa Location : EUROPE (Western and Northern)
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More detailsSetup for 200mm Wafers Comes with Neslab CFT-25 Chiller, PC, Keyboard, Monitorand Printer. Removed from Se Year(s) : 1996 Location : EUROPE (Western and Northern)
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More detailsHard Drive and software not included Year(s) : 2006 Location : EUROPE (Western and Northern)
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More detailsMetrology Model S-5000H SEM Year(s) : 1998 Location : EUROPE (Western and Northern)
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More detailsThe Nanospec 210 is a wafer tester that has a film thickness measurement system. It has a 100 angstrom resol Location : AMERICA North (USA-Canada-Mexico)
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More detailsObservation method: Transmitted phase contrast, fluorescent observation ・Total magnification: 40, 100, 200, 40 Location : ASIA (North East)
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More details• Vacuum Chuck Diameter: 6 in • X-Y Stage Travel: 6 in x 6 in • Microscope X-Y Travel: Included • Microscope B Location : AMERICA North (USA-Canada-Mexico)
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More details• Impact Mechanism: Steel impactor driven by magnetic coils • Cooling Medium: Liquid nitrogen required • Vial Location : AMERICA North (USA-Canada-Mexico)
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More detailsIncludes Computer (current OS), monitor, keyboard, mouse New M3 software Location : AMERICA North (USA-Canada-Mexico)
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More detailsSpecifications: X-Travel: 100mm (4″) Z Column Height: 500mm Z Vertical Detector Travel with Contracer Head: 60 Location : AMERICA North (USA-Canada-Mexico)
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More detailsstepper Location : ASIA (North East)
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More detailsKLA-Tencor 2138XP Brightfield Defect Inspection Tool 0.25µ, 0.39µ, 0.62µ Spot Sizes For 150mm & 200mm Wafers M Year(s) : 2006 Location : EUROPE (Western and Northern)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.