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Used Metrology and inspection equipment

1,041 results
1

Manual Spin Coater Location : EUROPE (Western and Northern)

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SDP-ALD NIT 12 Thin Film ALD SiN/SiO Wafer Size 12 Location : EUROPE (Western and Northern)

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IPS AKRA CVD Ti/TiN Year(s) : 2010 Location : EUROPE (Western and Northern)

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Process: Thin Film Stress Measurement System Year(s) : 2007 Location : EUROPE (Western and Northern)

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with Cymer XLA165 Track Pre-warning signal (APR)s: APR enabled Avoid Track INPUT/OUTPUT conflicts, Raise AS af Location : EUROPE (Western and Northern)

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Fixed Binocular Head U-BI30 Pair of WHN10x/22 Eyepieces (one adjustable). Fixed Stage with Right Hand Coaxial Location : EUROPE (Western and Northern)

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Features: Automated Sheet Resistivity Meter 1 mOhm / square to 800 kOhm / square extended range up to 8x1011W/ Location : EUROPE (Western and Northern)

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WAFER SIZE 8 Location : EUROPE (Western and Northern)

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TENCOR Surfscan 4500 Wafer surface inspection Unpatterned Wafer Surface Inspection Tool, for 75mm-150mm Wafer Location : EUROPE (Western and Northern)

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8 Inch SRD Manual included Location : EUROPE (Western and Northern)

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Camera and Optics: Review camera CCD : 3CCD Color Review camera Resolution : 752pixels*582 lines Second Camera Location : EUROPE (Western and Northern)

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Printed Circuit Board Manufacturing Location : EUROPE (Western and Northern)

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KH-8030 In-line 3D Solder Paste Inspection System Year(s) : 2008, 2010 Location : EUROPE (Western and Northern)

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ADE Episcan 1000 FT-IR Measurement of Epi Films <25µ ON-LINE TECHNOLOGIES 2110 Spectrometer Head IRVINE OPTICA Year(s) : 2000 Location : EUROPE (Western and Northern)

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Inline AOI Machine Complete with: Loader E-Cube (2008) Unloader E-Cube (2008) Year(s) : 2004 Location : EUROPE (Western and Northern)

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AOI System 2D INLINE Location : EUROPE (Western and Northern)

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Formerly item 860 Olympus BH series microscope Objectives: 10X, 40X, 100X Reflected and transmitted light Eye Year(s) : 1980 Location : AMERICA North (USA-Canada-Mexico)

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Specification: Illumination type: second light Binocular angle: 45° Ocular model: WHK 10x / 20L Magnification Location : EUROPE (Western and Northern)

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Specification: Display head: Trinocular 25x Ocular: Wild 10X/21 Diopric correction: +5 až -5 Approach: APO Zoo Location : EUROPE (Western and Northern)

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BH 4X4″ TRAVEL 10, 20,40X BF/DF OBJECTIVES Location : AMERICA North (USA-Canada-Mexico)

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BH2, ON LARGE BASE WITH 6X6″ TRAVEL 10, 20, 40X BF/DF OBJECTIVES BINOCULAR TILTING HEAD OR TRINOCULAR HEAD Location : AMERICA North (USA-Canada-Mexico)

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BH2 4X4″ TRAVEL 10, 20,50X BF/DF OBJECTIVES BINOCULAR TILTING HEAD (OPTIONAL TRINOCULAR HEAD) TOP AND BOTTOM L Location : AMERICA North (USA-Canada-Mexico)

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Bf/df with adjustable height eyepeice assembly 6″ travel with motorized objective turret for cleanroom operato Location : AMERICA North (USA-Canada-Mexico)

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Aligner:Mask/4in Year(s) : 1981 Location : ASIA (North East)

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Calibrated microscopes on boom stand Includes LED ring light or gooseneck light Location : AMERICA North (USA-Canada-Mexico)

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You can find used Metrology and inspection equipment on Wotol

The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.

The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.

HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. 

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