Focus, Nano µsprint 3d inspection system with Baumann Handler
Ref :
2690922-9-CP
Condition :
Used
Manufacturer :
Focus, Nano
Model :
µsprint 3d inspection system with Baumann Handler
Year(s) :
2014
Quantity :
1
Location :
Seller or machines location:
EUROPE (Western and Northern)
EUROPE (Western and Northern)
Vintage 2014
Condition: excellent
CE marked
Other machines similar to Focus, Nano µsprint 3d inspection system with Baumann Handler
1
ZEISS NanoFab
Location :
United States (USA)
Year(s) :
2015
1
GE Analyzer 160kV Nano Focus
Location :
AMERICA North (USA-Canada-Mexico)
Year(s) :
2005
1
Mirtec MV-6 OMNI 3D AOI
Location :
AMERICA North (USA-Canada-Mexico)
Year(s) :
2017
1
Rudolph 105C Wafer inspection System
Location :
EUROPE (Western and Northern)
Year(s) :
2006