3 KLA-Tencor 8100XP
Ref : 2188814-9-GO
Condition : Used
Manufacturer : KLA-Tencor
Model : 8100XP
Year(s) : 2000
Quantity : 3
Location :
Seller or machines location:
AMERICA North (USA-Canada-Mexico)
AMERICA North (USA-Canada-Mexico)
Last check : 24 Apr. 2024
Configuration:
KLA-Tencor 8100XP CD-SEM is an advanced metrology instrument with capability to provide superior imaging and precision measurements at the bottom of very high aspect ratio device features.
Performance Specification:
• Feature Size: < 30 nm
• Resolution: < 4 nm
• Electron Source: Schottky, Thermal Field Emitter
• Magnification: 2.34 kX - 400 kX
• Stage: X-Y leadscrew stage, Position Accuracy < 10 micron
• Accelerating Voltage: 0.4kV - 1.5kV
• Throughput: upto 50 wafers/hr
Other machines similar to 3 KLA-Tencor 8100XP
1
KLA UV 1280 SE
Location :
EUROPE (Western and Northern)
Year(s) :
2001
1
KLA-Tencor Surfscan 6220
Location :
AMERICA North (USA-Canada-Mexico)
1
KLA-Tencor 2367
Location :
EUROPE (Western and Northern)
Year(s) :
2017
1
KLA-Tencor UV-1280SE Thin Film Measurement System
Location :
AMERICA North (USA-Canada-Mexico)