Bruker Dektak XT Precision Stylus Profiler

Bruker’s DektakXT™ Stylus Profiler features a
revolutionary design that enables 4 angstrom repeatability.
Unmatched performance.
4 angstrom repeatability delivers industry leading accuracy.
Single-arch design provides breakthrough scan stability.
Leading-edge smart electronics establish new low
noise benchmark.
New hardware configuration offers 40% faster data
collection times than prior generations.
Unprecedented efficiency and ease of use.
Intuitive Vision64™ user interface workflow
simplifies operation.
Self-aligning styli enables effortless tip exchange.
Single sensor design offers low force and
extended range in a single platform.

Measurement Technique: Stylus profilometry (contact measurement).
Measurement Capability: Two-dimensional surface profile measurements.
Sample Viewing: Digital magnification,
0.275 to 2.2 mm vertical FOV.
Sample X/Y Stage: Manual Stage.
Max. Sample Thickness: 50 mm (1.95 in.).
Step Height Repeatability: 4Å,
1 sigma on steps ≤1 μm (30 scans using a 12.5 μm stylus).
Vertical Range: 1 mm (0.039 in.).
Vertical Resolution: 1Å (at 6.55 μm range).
115V, 50/60Hz, 3.2A