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N&K Technology 3700 RT

Ref : 1838842-9-AW
Condition : Used
Manufacturer : N&K Technology
Model : 3700 RT
Year(s) : 2004
Quantity : 1
Location : Seller or machines location:
ASIA (North East)
Last check : 21 May. 2020

N&K 3700 RT Metrology System

Wafer Size 8"
Vintage 2004
Broadband spectrometry for film thickness on transparent substrates, including photomask reticles.

Spotsize: R = 50um, T < 400um
The n&k 3700-RT automated system is designed for handling 5” or 6” square masks or up to 8” square samples.
These systems can also be configured for transparent wafers.

The n&k 3700-RT simultaneously determines thickness, and n and k in the spectral range of 190-1000nm and provide non-destructive, real time, high throughput measurements directly on the device. This system collects reflectance and transmission data (in the spectral range from 190-1000 nm) at the same point and encompasses advanced pattern recognition software, patented microspot measurement technology and a unique all-reflective optical based system.

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