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Nanometrics 9000
Ref :
2674595-9-CP
Condition :
Used
Manufacturer :
Nanometrics
Model :
9000
Year(s) :
2005
Quantity :
1
Location :
Seller or machines location:
AMERICA North (USA-Canada-Mexico)
AMERICA North (USA-Canada-Mexico)
Nanospec Wafer Metrology film thickness measurement tool
Version: 200 mm
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