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Nanometrics NaoSpec/AFT 200, Film Thickness Measurement System

Ref : 1232712-9-CP
Condition : Used
Manufacturer : Nanometrics
Model : NaoSpec/AFT 200, Film Thickness Measurement System
Year(s) : -
Quantity : 1
Location : Seller or machines location:
AMERICA North (USA-Canada-Mexico)
Last check : 16 Apr. 2020

Used

Manufacture : Nanometrics
Model : NaoSpec/AFT 200
Model Number : 7001-0081
Desc : Film Thickness Measurement System

Details:
Wafer Size : Up to 6"

Standard films measured silicon dioxide and nitride,
negative and positive resists, nitrides, oxides, and polyimides

- Measures from 400A to 40,000A
- Measures in the 480-790 nm wavelength range
- 10x eyepieces
- M5x0.1, M10x0.25, and M100x0.90 objectives
- Computer Controller : model: 7201-1045, s/n:0986-cs-2-2089
- printer (model: 20-03050)

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