Semiprobe Diced wafer Inspection system
Ref :
2806227-9-W
Condition :
Used
Manufacturer :
Semiprobe
Model :
Diced wafer Inspection system
Year(s) :
-
Quantity :
1
Location :
Seller or machines location:
AMERICA North (USA-Canada-Mexico)
AMERICA North (USA-Canada-Mexico)
Semiprobe wafer prober mounted on Newport table
Inspects diced wafers mounted on film frames
Wafer stage with motorized X,Y and theta
Motic PSM-1000 microscope with 5x and 20x objectives
video port with camera and monitor
Motic fiber optic light source
2 inkers for die marking
PC with Semiprobe software for wafer mapping and defect marking
Chuck configured for 150mm wafer frames with alignment pins
Newport vibration isolation table with 4" breadboard
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