Hitachi S-4700 I

Ref : 2713093-9-AS

Condition : Used

Manufacturer : Hitachi

Model : S-4700 I

Year(s) : 2002

Quantity : 1

Location : Seller or machines location:
AMERICA North (USA-Canada-Mexico)

• Type: Scanning Electron Microscope (SEM)
• Configuration: With EDAX
• Resolution at 1 kV: 2.1 nm
• Resolution at 15 kV: 1.5 nm
• Working distance: 12 mm
• Sample tilt: Up to 45° without changing working distance
• X-ray take-off angle: 30° with sample normal to beam
• Detector types: Secondary Electron (SE), Backscattered Electron (BSE)
• BSE detector: YAG-type
• Simultaneous BSE and EDX detector usage
• Sample exchange: Airlock system, no repositioning needed
• Control interface: Full column setup via computer
• Imaging modes: Ultra-high-resolution mode and analysis mode

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