Used Semiconductor and PCB Manufacturing

Nanometrics AFT 210UV * Nanometrics 210UV * Film Measurement System * Stage - 4" wafers - larger stage can b Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics Nanospec AFT 210XP Film Measurement System. *System is in excellent "like new" condition. *Read Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Tencor OmniMap NC-110 * Non-Contact Resistivity System. * Measures complex aluminum and tungsten multilayer Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Rudolph Auto EL III Ellipsometer EQP-00470 * Serial tag info: 24A, Serial # 7367, June 1983 * Ellipsometer, 6 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Rudolph Auto EL III Ellipsometer *Serial Tag info: 2C4C, Serial # 7511, July/1984 *Ellipsometer, 633nm wavele Location : AMERICA North (USA-Canada-Mexico)

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Rudolph Auto EL II Ellipsometer *Ellipsometer, 633nm wavelength *Built-in printer *Measuring Time: 17 to 50 Location : AMERICA North (USA-Canada-Mexico)

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Rudolph FE IV Ellipsometer Specifications: System: The Rudolph FE III series is a focused beam ellipsometer f Location : AMERICA North (USA-Canada-Mexico)

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QC Optics OPTIQUEST reticle inspection Location : AMERICA North (USA-Canada-Mexico)

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Prometrix FT-530e Thin Film Mapping System. Location : AMERICA North (USA-Canada-Mexico)

Price : On request

OPAL 7830i CD-SEM Location : AMERICA North (USA-Canada-Mexico)

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Nanometrics Nanoline AFT 4000 * Table top automated film thickness and reflectivity system. * Standard Film Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics 215 Automated Film Thickness Tool. * Cassette to cassette operation. 3¿ to 6¿ wafer capability. Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics Nanospec AFT 181 (Nanospec AFT 181) Computerized Film Thickness Measurement Nanometrics 181. Mic Location : AMERICA North (USA-Canada-Mexico)

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Nanometrics Nanospec AFT 181 (Nanospec AFT 181) Computerized Film Thickness Measurement Nanometrics 181 with Location : AMERICA North (USA-Canada-Mexico)

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Keysight-Agilent 1143A Agilent 1143A independently powers the Agilent 54701A Programmable offset +/-50 V offs Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Keysight-Agilent 5383A The 5383A 520 MHz Frequency Counter is designed to deliver reliable, high quality oper Location : AMERICA North (USA-Canada-Mexico)

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Keysight-Agilent 34401A The 34401A is a 6.5 digit , high performance digital multimeter. Its combination of b Location : AMERICA North (USA-Canada-Mexico)

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Keysight-Agilent 6291A The 6291A Power Supply is a 200 W unit rated at 40 V @ 5 A. It has 10-turn voltage and Location : AMERICA North (USA-Canada-Mexico)

Price : On request

SAKI BF-10Z n-line 2D AOI Max PCB size is 330x250mm for BF-Planet-XII, 500x460mm for BF-FrontierII, 870x686mm Location : EUROPE (Western and Northern)

Price : On request

SAKI BF TRISTAR II In-line/Off-line Simultaneous Double-sided AOI Suitable for the final inspection such as a Location : EUROPE (Western and Northern)

Price : On request

SAKI BF-10D In-line Dual Lane High Resolution and High Speed AOI Scanning time for M size (330x250mm) PCB is Location : EUROPE (Western and Northern)

Price : On request

SAKI BF-FRONTIER II In-line 2D AOI Max PCB size is 330x250mm for BF-Planet-XII, 500x460mm for BF-FrontierII, Location : EUROPE (Western and Northern)

Price : On request

SAKI BF-PLANET XII In-line 2D AOI Max PCB size is 330x250mm for BF-Planet-XII, 500x460mm for BF-FrontierII, 8 Location : EUROPE (Western and Northern)

Price : On request

SAKI BF-3Di 3D height data to be by directly reading sample and components height to analyze assembly conditi Location : EUROPE (Western and Northern)

Price : On request

CyberOptics QX500-L AOI Vintage: 2010 Large Board: 20"x 20" 01005 Capable Component Types: Standard SMT (chip Location : AMERICA North (USA-Canada-Mexico)

Price : On request