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Used Semiconductor Equipment

3,764 results
1

N&K 3700 RT Metrology System Wafer Size 8" Vintage 2004 Broadband spectrometry for film thickness on transpar Year(s) : 2004 Location : ASIA (North East)

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N&K 8000 Trench Depth & Thin film thickness Measurement Wafer Size 8" Vintage 2007 Fully Automated Thin Film Year(s) : 2007 Location : ASIA (North East)

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Nanometrics Nanospec 9300 Thin Film Thickness Measurement Wafer Size 12" Vintage 2002 Currently 12" configure Year(s) : 2002 Location : ASIA (North East)

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Tencor P-2 Step Height Measurement System - Wafer Size 8" - Long Scan Profiler Measurement. - Standard Head w Location : ASIA (North East)

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Tencor P-20(H) Step Height Measurement Sytem - Wafer Size 8" - Scan Length: 210mm. - Scan Speed : 1㎛ ~ 25 mm/ Location : ASIA (North East)

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Veeco/Digital Instruments Nanoscope III SPM Atomic Force Microscope Nanoscope III SPM and controller, LSSF la Location : AMERICA North (USA-Canada-Mexico)

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Veeco CPII Atomic Force Microscope Motorized Z stage, scans up to 100um, Mitutoyo M Plan Apo 20SL objective w Location : AMERICA North (USA-Canada-Mexico)

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Suss/MFI Vibsense For use with Suss MFI Probehead or for the monitoring of environmental parameters of any pi Location : AMERICA North (USA-Canada-Mexico)

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RMS Systems/Hologenix NGS 3500 Defect Detection System Automatic Defect Detection & Classification Automated Location : AMERICA North (USA-Canada-Mexico)

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Yestech YTV-FX Inspection Equipment 2012 Location : AMERICA North (USA-Canada-Mexico)

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Koh Young 8030-2 Inspection Equipment 2012 Location : AMERICA North (USA-Canada-Mexico)

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Mirtec MV-7Xi Inspection Equipment 2013 Location : AMERICA North (USA-Canada-Mexico)

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CYBEROPTICS SE 300 ULTRA 3D Solder Paste Inspection - Inline inspection system after printer - Vintage 2008 Location : EUROPE (Central and Eastern)

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CYBEROPTICS model SE 300 ULTRA online SPI inspection machine - 508mm x 508mm card size - thickness from 0.5mm Location : EUROPE (Central and Eastern)

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ULTRON SYSTEMS INC / USI UH 114-8 Ultron UH 114-8 mounter and UH 101 remover PC BOARD ASSEMBLY AND MANUFACTUR Location : AMERICA North (USA-Canada-Mexico)

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Viking VIS-100W Die Inspection Systems (VIS-100W Die Inspection System) * EQP-00564 & EQP-00565 * Automatic Location : AMERICA North (USA-Canada-Mexico)

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Brand: GAS Automation GAS Automation SAR‐1300‐B2‐CL PCB Depanneling System Available with a single milling Location : EUROPE (Western and Northern)

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Brand: GAS Automation GAS Automation SAR-1400-L PCB Depanneling System Available with a single milling head Location : EUROPE (Western and Northern)

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Brand: GAS Automation GAS Automation SAR‐1000‐B1-CL PCB Depanneling System Holding down of the printed circ Location : EUROPE (Western and Northern)

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Brand: GAS Automation GAS Automation SAR‐1000‐B1 PCB Depanneling System Low invest Fast and precise linear Location : EUROPE (Western and Northern)

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Brand: Piergiacomi Piergiacomi DPF200 DEPANELING SYSTEM Separation type: Routing Bit PCB thickness: max. 2.5 Location : EUROPE (Western and Northern)

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MAESTRO 4M PCB Separator Separation length: max. 450 mm Separation speed: 300/500 mm/s Earthing stud: Ø 10 m Location : EUROPE (Western and Northern)

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Brand: MAESTRO MAESTRO 3E PCB Separator Separation length: max. 450 mm Earthing stud: Ø 10 mm Operating tem Location : EUROPE (Western and Northern)

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Brand: Maestro MAESTRO 2M PCB Separator Separation speed 2M: 100/200/300 mm/s Separation length: 15 - 300 m Location : EUROPE (Western and Northern)

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Brand: Maestro PCB Separator MAESTRO 2 Separation type: Component side: circular blade Solder side: circular Location : EUROPE (Western and Northern)

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You can find used Semiconductor Equipment on Wotol

For second hand Semiconductor Equipment we have Wafer Equipment, Wafer Handler & Robots, CVD Equipment, Wet Bench, Lithography & Photoresist, Plasma Etcher / Asher, Dicer & Scriber, Grinding, Lapping & Polishing, Component Counters/Tapers, Dry Pump, Bonder, Metrology and inspection equipment. The main manufacturers for used Semiconductor Equipment are KLA-Tencor, Plasmatherm, AMAT, TEL, Disco, Karl Suss, Canon, Semitool, Hitachi, Nanometrics, Nikon, Applied Materials, Tegal, Varian.

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