Used Semiconductor Equipment

S1000 3″ PROBE STATION Includes B&L Stereo Zoom 4 Optics Location : AMERICA North (USA-Canada-Mexico)

Price : On request

PROBES UP TO 200mm OR 8″ WAFERS. AVAILABLE WITH STEREO ZOOM OPTICS OR HIGH POWER MICROSCOPES (MICROZOOM OR MIT Location : AMERICA North (USA-Canada-Mexico)

Price : On request

【specification】 Printing laser: Fiber laser class 4 laser Laser wavelength: 1064nm Laser oscillator output: 20 Year(s) : 2019 Location : ASIA (North East)

Price : On request

Marantz AOI System Vintage: 2007 Year(s) : 2007 Location : EUROPE (Western and Northern)

Price : On request

MANUAL PROBE STATION PROBE UP TO 5″ WAFERS, FAST CHESSMAN MOVEMENT FOR LARGE GEOMETRIES AND JOYSTICK FOR FINE Location : AMERICA North (USA-Canada-Mexico)

Price : On request

ULTRACISION 860 200mm XY TRAVEL WITH 8″ DIAMETER CHUCK WITH B&L ZOOM 5 STEREO OPTICS (8-40X) OR 16-80X WITH 2 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Binocular Angle 45° Eyepieces Model 455043-0000 Magnification 10 X Field Number 23 mm Trinocular/P Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Microscope Configuration Brightfield Illumination Type Reflected Light Binocular Angle 45° Eyepieces Mo Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Microscope Configuration Brightfield & DIC Illumination Type Xe Reflected Light Eyepieces Model KPL-W Location : AMERICA North (USA-Canada-Mexico)

Price : On request

INS:AOI Year(s) : 2006 Location : ASIA (North East)

Price : On request

Prober Version: 300 mm Vintage: 01.05.2006 De-installed, warehoused. Inspection WITH POWER-UP DEMONSTRATION i Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

WAFER FILM THICKNESS MEASUREMENT SYSTEM Vintage: 01.06.1991 KLA-Tencor Prometrix Film Thickness Probe W/ FT-65 Year(s) : 1991 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

It can be used for both mask cassettes and wafer cassettes. There are 2 EPROM chips with this indexer. 1st E Location : EUROPE (Western and Northern)

Price : On request

Tool Status: Deinstalled and crated and in storage. (March 2023) like new! Wafer Size 300 mm Process PE-ALD S Year(s) : 2010 Location : EUROPE (Western and Northern)

Price : On request

Microwave plasma batch system Autoload PC Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Wafer Size: 3,4,5,6 inch capability Gas Lines: 4 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

S4075-11020 Barrel Plasma Asher D380-015 With 4000C controller and PM-112 RF Generator Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Configuration: Supports wafer sizes up to 300mm (330mm Platen) RIE set up for SiO2 Etch RF Gener Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

The Nanospec 210 is a wafer tester that has a film thickness measurement system. It has a 100 angstrom resol Location : AMERICA North (USA-Canada-Mexico)

Price : On request

The Sloam M-100 wafer tester has an interferometer, which measures wafter thickness by optical fringes. This Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Measurement Display Range … 200 A to 655,000 A (20nm to 65,000nm) Vertical Resolution … 5A (.5nm) Scan Length Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Microscope Configuration Brightfield Illumination Type Reflected Light Binocular Angle 45° Eyepieces Mo Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Microscope Type Microzoom Multiple Objectives Models Bausch and Lomb 2.25 X 0.04 N.A. 8 X 0.15 N.A. 25 X 0.3 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Exterior Dimensions Width 38.000 in (96.5 cm) Depth 25.750 in (65.4 cm) Height 72.000 in (182 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Microscope for machines (without stand) Objective: Nikon G-AL 0,29 x Oculars: 20 x Illumination: up to 29 x o Location : EUROPE (Western and Northern)

Price : On request