Used Semiconductor Equipment

Double Stack SRD (Set up for solar wafer use) Version: 100 mm, M0, M2 Vintage: 01.02.1999 -Semitool PSC 101 -S Year(s) : 1999 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Dry Etcher Version: 200 mm De-installed from working condition and warehoused. Please refer to the attached p Location : AMERICA North (USA-Canada-Mexico)

Price : On request

This 200/ 300mm track system is built on a proven 200mm platform, the POLARIS 3500 Together with this machin Location : EUROPE (Western and Northern)

Price : On request

3D measuring platform for products of max 600mm x 600mm x 300mm lxwxh, resolution 0,0001mm. Year 2008. Year(s) : 2008 Location : EUROPE (Western and Northern)

Price : On request

AOI for panel or reel to reel, max panel size 515mmx515mm, max exposure area reel to reel 250mmx500mm. with Year(s) : 2016 Location : EUROPE (Western and Northern)

Price : On request

Automated Wafer, Die and Bump Inspection System Version: 300 mm Vintage: 01.06.2008 Dimensions on base: 72 in Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Automated Macro Defect Inspection Version: 150 mm/200 mm Automatic Shut down in Fab. Needs to be removed in t Location : AMERICA North (USA-Canada-Mexico)

Price : On request

WAFER SIZE 12 Location : EUROPE (Western and Northern)

Price : On request

Exposure LED, 5Kw, CCD camera assist. Year 2006 Year(s) : 2006 Location : EUROPE (Western and Northern)

Price : On request

Wafer Size 8" Vintage 2002-8 Tool's Condition Excellent - Long Scan Profiler P-15 Measurement. - Micro Head I Year(s) : 2002 Location : ASIA (North East)

Price : On request

Binocular Angle 45° Eyepieces Magnification 20 X Field Number 13 mm Focusing YES Objective Model Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Accessories Heated/vacuum work stage 5.25" X 5.75" with model 1201D power supply (see photo #10) Tool heat Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Binocular Angle 45° Eyepieces Magnification 20 X Focusing YES Magnification Range 18 X - 150 X Zo Location : AMERICA North (USA-Canada-Mexico)

Price : On request

4 chambers Wafer Size 8,12 Year(s) : 2008 Location : EUROPE (Western and Northern)

Price : On request

4 chambers Wafer Size 8,12 Year(s) : 2003 Location : EUROPE (Western and Northern)

Price : On request

Automated Photoresist Coater Version: 200 mm Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Xray Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

AlphaStep 200 Computerized Surface Profiler The AlphaStep 200 sets a new standard in computerized surface pr Location : AMERICA North (USA-Canada-Mexico)

Price : On request

6×6″ travel with 6″ wafer chuck New video camera and monitor 1 year warranty on parts Optional probe card hold Location : AMERICA North (USA-Canada-Mexico)

Price : On request

TILTING PLATEN, 5X5″ TRAVEL, WITH 6″ DIAMETER CHUCK INCLUDES B&L STEREO ZOOM 7 OPTICS, OR CAN BE UPGRADED TO Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Scanning Acoustic Microscope Version: Laboratory Vintage: 01.06.2010 A high-speed scanning acoustic microscope Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Automated Photoresist Coater Version: 150 mm/200 mm Automatic Shut down in Fab. Needs to be removed in the ne Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Compound Microscope Microscope Configuration Brightfield & Darkfield Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Unpatterned Wafer Surface Inspection Tool Location : AMERICA North (USA-Canada-Mexico)

Price : On request

DNS 80A SK-W80A-AVO WAFER SIZE 8 Year(s) : 2001 Location : EUROPE (Western and Northern)

Price : On request