Used Semiconductor Equipment

De-installation complete by Nikon Tech and currently located in environmentally controlled warehouse. No miss Year(s) : 2011 Location : EUROPE (Western and Northern)

Price : On request

Wafer Size Range Set Size 300 mm Condition Good Power Requirements Other V 75.0 A 50/60 Hz 3 Year(s) : 2012 Location : EUROPE (Western and Northern)

Price : On request

Microscope Accessories without x - y table Power Requirements 200-240 V 2.0 A 50/60 Hz Condition Go Year(s) : 1997 Location : EUROPE (Western and Northern)

Price : On request

Wafer Inspection System, WS-75BU, WS-70LCKT/15M Location : EUROPE (Western and Northern)

Price : On request

Condition Refurbished 200mm Patterned wafer inspection System This Tool was refurbished in 2017 and two new L Year(s) : 2001 Location : EUROPE (Western and Northern)

Price : On request

Nikon Eclipse L200N inspection microscope with brightfield and darkfield episcopic illumination Trinocular vi Location : EUROPE (Western and Northern)

Price : On request

[Specifications] - Model year: 2012 - Measurement principle: VSI method: White light vertical scanning interfe Year(s) : 2012 Location : ASIA (North East)

Price : On request

Wafer Size Range Minimum 150 mm Maximum 150 mm Set Size 150 mm Condition Good Power Requirements Year(s) : 2000 Location : EUROPE (Western and Northern)

Price : On request

AOI System Year(s) : 2007 Location : EUROPE (Western and Northern)

Price : On request

*. Process: wafer Sheet Resistance measurement *. Measurement perfomance: - 4 Point Probe check surface on Sil Year(s) : 1998 Location : ASIA (North East)

Price : On request

X-Ray Inspection System Model XD7600NT Year(s) : 2009 Location : EUROPE (Western and Northern)

Price : On request

WSS Glass Demount Wafer Size Range Set Size 200 mm Condition Very Good Year(s) : 2014 Location : EUROPE (Western and Northern)

Price : On request

The IVS120 is an automatic metrology system designed for measuring critical dimensions (CD´s). Power Requirem Year(s) : 1998 Location : EUROPE (Western and Northern)

Price : On request

Condition Good Power Requirements 220 V 24.0 A 15.0 A(2) 50 Hz 3 Phase Year(s) : 2008 Location : EUROPE (Western and Northern)

Price : On request

Wafer inspection system WS-75BU, WS-70LCKT/15M Location : EUROPE (Western and Northern)

Price : On request

Wafer Inspection System Model 7555.0 Location : EUROPE (Western and Northern)

Price : On request

WAFER SPECIFICATION Wafer Size 150mm SYSTEM CONFIGURATION CHAMBER A CHAMBER B Year(s) : 2007 Location : EUROPE (Western and Northern)

Price : On request

Condition Good Power Requirements 200-240 V 50/60 Hz 3 Phase Weight 1,213 lb (550 kg) Year(s) : 2011 Location : EUROPE (Western and Northern)

Price : On request

The KLA is complete and refurbished in 2015. No known condition issues. Year(s) : 1992 Location : EUROPE (Western and Northern)

Price : On request

3 Ports: 200 mm / 300 mm Refurbished Location : EUROPE (Western and Northern)

Price : On request

Automatic Defect Inspection Machine Model NSX 95 Location : EUROPE (Western and Northern)

Price : On request

Dual Track Photoresist Coater With Hotplates Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Parts machine 2008 Vintage Model NSX 105 Inspection System, 8" Year(s) : 2008 Location : EUROPE (Western and Northern)

Price : On request

Wafer Inspection System SFS7700 Used condition, recently came out from the working Environment. Year(s) : 1997 Location : EUROPE (Western and Northern)

Price : On request

Inspection system Brand Nanotronics Imaging Inc. Model nSPEC Year(s) : 2018 Location : EUROPE (Western and Northern)

Price : On request