Used Semiconductor Equipment

Automated Wafer, Die and Bump Inspection System Version: 300 mm Vintage: 01.06.2008 Dimensions on base: 72 in Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Automated Macro Defect Inspection Version: 150 mm/200 mm Automatic Shut down in Fab. Needs to be removed in t Location : AMERICA North (USA-Canada-Mexico)

Price : On request

WAFER SIZE 12 Location : EUROPE (Western and Northern)

Price : On request

Exposure LED, 5Kw, CCD camera assist. Year 2006 Year(s) : 2006 Location : EUROPE (Western and Northern)

Price : On request

Wafer Size 8" Vintage 2002-8 Tool's Condition Excellent - Long Scan Profiler P-15 Measurement. - Micro Head I Year(s) : 2002 Location : ASIA (North East)

Price : On request

Binocular Angle 45° Eyepieces Magnification 20 X Field Number 13 mm Focusing YES Objective Model Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Accessories Heated/vacuum work stage 5.25" X 5.75" with model 1201D power supply (see photo #10) Tool heat Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Binocular Angle 45° Eyepieces Magnification 20 X Focusing YES Magnification Range 18 X - 150 X Zo Location : AMERICA North (USA-Canada-Mexico)

Price : On request

4 chambers Wafer Size 8,12 Year(s) : 2008 Location : EUROPE (Western and Northern)

Price : On request

4 chambers Wafer Size 8,12 Year(s) : 2003 Location : EUROPE (Western and Northern)

Price : On request

Automated Photoresist Coater Version: 200 mm Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Xray Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

AlphaStep 200 Computerized Surface Profiler The AlphaStep 200 sets a new standard in computerized surface pr Location : AMERICA North (USA-Canada-Mexico)

Price : On request

6×6″ travel with 6″ wafer chuck New video camera and monitor 1 year warranty on parts Optional probe card hold Location : AMERICA North (USA-Canada-Mexico)

Price : On request

TILTING PLATEN, 5X5″ TRAVEL, WITH 6″ DIAMETER CHUCK INCLUDES B&L STEREO ZOOM 7 OPTICS, OR CAN BE UPGRADED TO Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Scanning Acoustic Microscope Version: Laboratory Vintage: 01.06.2010 A high-speed scanning acoustic microscope Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Automated Photoresist Coater Version: 150 mm/200 mm Automatic Shut down in Fab. Needs to be removed in the ne Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Compound Microscope Microscope Configuration Brightfield & Darkfield Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Unpatterned Wafer Surface Inspection Tool Location : AMERICA North (USA-Canada-Mexico)

Price : On request

DNS 80A SK-W80A-AVO WAFER SIZE 8 Year(s) : 2001 Location : EUROPE (Western and Northern)

Price : On request

Automated Photoresist Coater Version: 150 mm/200 mm Vintage: Inquire Automatic Shut down in Fab. Needs to be r Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Mask Aligner Version: 150 mm Vintage: 01.06.2004 This excellent Karl Suss MA150 System mask aligner is still Year(s) : 2004 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

4″ probe station 4″ chuck, 4×4″ travel Includes: Microzoom and 2 objectives 80-160x and 250-500x Location : AMERICA North (USA-Canada-Mexico)

Price : On request

6″ Probe station With 6″ chuck and 6X6″ travel Manual lifting platen, Z movement controlled by chuck Microzoom Location : AMERICA North (USA-Canada-Mexico)

Price : On request

ELECTROGLAS 2001X PROBER MANUAL LOAD WITH 6″ CHUCK FOR UP TO 6″ WAFERS. Location : AMERICA North (USA-Canada-Mexico)

Price : On request