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Used Semiconductor Equipment

3,621 results
1

Die Bonder Model AD898 Year(s) : 2006 Location : EUROPE (Western and Northern)

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Automated wafer cleaning system 4 robots Condition: Complete like new working condition, only used during Year(s) : 2011 Location : EUROPE (Western and Northern)

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Optical 3D Surface Profiler Manufacturer: Sensofar Model: PLu Neox Optical 3D Surface Profiler with motorized Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)

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Vertical Furnace for LPCVD SOD Process Version: 200 mm Vintage: 01.06.2007 Vintage 2007.01 Software OS L Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)

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Condition Good Power Requirements 380 V 3 Phase Power Consumption : 17 KW 58 BTU/Hour Exterior Dimensio Year(s) : 2003 Location : EUROPE (Western and Northern)

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Condition Good Power Requirements 380 V 3 Phase Other Information Power Consumption : 17 kW 58 BTU/Hou Year(s) : 2006 Location : EUROPE (Western and Northern)

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Condition Good Power Requirements 380 V 3 Phase Other Information Power Consumption Exterior Dimensi Year(s) : 2001 Location : EUROPE (Western and Northern)

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Condition Good Power Requirements 380 V 3 Phase Power Consumption : 17 kw 58 BTU/hour Exterior Dimensio Year(s) : 2000 Location : EUROPE (Western and Northern)

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1

Thin Film measurement Version: Up to 300 MM Vintage: 01.06.2008 SENTECH Senduro 300 The SENDURO® 300 is a pow Year(s) : 2018 Location : AMERICA North (USA-Canada-Mexico)

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PVD cluster tool Version: 150 mm Vintage: 01.06.1990 This tool was not operational prior to removal and has m Year(s) : 1990 Location : AMERICA North (USA-Canada-Mexico)

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ICP PECVD system for solar cells production Version: Solar Vintage: 01.06.2015 -STILL INSTALLED. IN EXCELLENT Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)

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Model 5500 Main System Can handle from 2" up to 8"/200mm wafers Submicron sensitivity, detects 0.2 micron part Year(s) : 2007 Location : EUROPE (Western and Northern)

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Wafer Sizes: 8"/200mm Wafer defect inspection The Leica INS 3000 is the new defect review and inspection stat Year(s) : 1999 Location : EUROPE (Western and Northern)

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Dry etcher Location : ASIA (North East)

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Coater developer Location : ASIA (North East)

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Wafer Inspection System Version: 300mm De-installed, warehoused, can be inspected by appointment Location : AMERICA North (USA-Canada-Mexico)

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1

The Model 572 sets the industry standard for ease of operation and maintenance. Front panel operator controls Location : AMERICA North (USA-Canada-Mexico)

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HYBOND’s Model 616 ultrasonic single channel peg bonder has been designed to perform ultrasonic attachment of Location : AMERICA North (USA-Canada-Mexico)

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18″ X 30″ HIGH S/S BELL JAR INFICON IC-6000 THICKNESS MONITOR AUTOTECH II AUTOMATIC/MANUAL VALVING ION/DUAL TC Location : AMERICA North (USA-Canada-Mexico)

Price : On request

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1

WAFER SIZE 6,8 Year(s) : 2007 Location : EUROPE (Western and Northern)

Price : On request

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WAFER SIZE 8 Year(s) : 1995 Location : EUROPE (Western and Northern)

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The K&S 4123 is a manual wedge bonder that comes with stereo zoom optics. Upgrade to heated work holder. Location : AMERICA North (USA-Canada-Mexico)

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Rebuilt Vacuum Valves Rebuilt Vacuum Pump Rebuilt CTI Cryopump New touch screen valve controller 30 day warran Location : AMERICA North (USA-Canada-Mexico)

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all manual valving can be configured with diffusion pump or cryopump filiment evaporator Location : AMERICA North (USA-Canada-Mexico)

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This system was only used in an R&D Lab for O2 Plasma clean of medical device. It is in excellent condition. Year(s) : 2000 Location : EUROPE (Western and Northern)

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You can find used Semiconductor Equipment on Wotol

For second hand Semiconductor Equipment we have Wafer Equipment, Wafer Handler & Robots, CVD Equipment, Wet Bench, Lithography & Photoresist, Plasma Etcher / Asher, Dicer & Scriber, Grinding, Lapping & Polishing, Component Counters/Tapers, Dry Pump, Bonder, Metrology and inspection equipment. The main manufacturers for used Semiconductor Equipment are KLA-Tencor, Plasmatherm, AMAT, TEL, Disco, Karl Suss, Canon, Semitool, Hitachi, Nanometrics, Nikon, Applied Materials, Tegal, Varian.

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