Used Semiconductor Equipment

Digital Instruments Nanoscope III Scanning Probe Microscope Location : EUROPE (Western and Northern)

Price : On request

Type: Laser Equipment Configuration: 2008 Vintage Year(s) : 2008 Location : EUROPE (Western and Northern)

Price : On request

Brand AITCO Vintage: Approximately 2019 Up to 8" capable Used Minimally for R&D & Light Production Year(s) : 2019 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Model: Prometrix UV-1280SE Configured for 100mm and 150mm handling Measures Film Thickness, Refractive Index ( Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Basic Post Reflow Automated Optical Inspection Machine Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

KLA / MicroSense UMA-C200-STR Thin Film Stress Measurement System consisting of: - Vintage: Approximately 20 Year(s) : 2019 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

KLA-TENCOR SURFSCAN 6420 PARTICLE INSPECTION SYSTEM consisting of: - Model: Surfscan 6420 - Particle inspectio Location : AMERICA North (USA-Canada-Mexico)

Price : On request

APPLIED MATERIALS AMAT CENTURA II consisting of: - 2 DPS / DTM Chambers - Configured for 200mm - Vintage: 2019 Year(s) : 2019 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Basic Post Reflow Automated Optical Inspection Machine Year: 2014 Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Automated Optical Inspection Machine Model Ultra III Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Basic Post Reflow Automated Optical Inspection Machine Year: 2014 Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Automated Optical Inspection Year: 2010 Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Solder Paste Inspection Machine Year: 2010 Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

KLA-TENCOR SURFSCAN SP1 DLS UNPATTERNED SURFACE INSPECTION SYSTEM consisting of: - Model: SP1 DLS with 300mm S Location : AMERICA North (USA-Canada-Mexico)

Price : On request

200mm As-is KLA / MicroSense UMA-C200-STR Thin Film Stress Measurement System consisting of: - Vintage: Appro Year(s) : 2019 Location : EUROPE (Western and Northern)

Price : On request

PLASMATHERM ODYSSEY HDRF ASHER consisting of: - Model: Odyssey HDRF - Configured for 150mm wafers - 2 Chambers Location : EUROPE (Western and Northern)

Price : On request

Detaping 6" thinwafer Wafer Size Range Minimum 200 mm Maximum 200 mm Set Size 200 mm Cassette to Ca Year(s) : 2006 Location : EUROPE (Western and Northern)

Price : On request

Wafer Size Range Minimum 200 mm Maximum 300 mm Set Size 300 mm Cassette to Cassette YES Wafer Hand Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Applied Materials Raider Edge ECD Liftoff Tool 3ea Process Tanks 2ea Chemical Dispense Cabinets HCl, Dilute HF Year(s) : 2019 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Automated Optical Inspection System Brand Pemtron Year(s) : 2020 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Placement Machine (4) 12 nozzle heads Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

High-Tech Science High-performance fluorescent X-ray thickness gauge [Main specifications] ・X-ray tube: Tub Year(s) : 2013 Location : ASIA (North East)

Price : On request

Plasma Etch Version: 150 mm Vintage: 01.06.1995 The equipment was operational in the wafer fab up until Augus Year(s) : 1995 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Manufacturer: ESEC Type: Smart Card Wire Bonder Model: ESEC 3100 SCplus Location : EUROPE (Western and Northern)

Price : On request