Nanometrics 210
Ref :
2506133-9-AW
Condition :
Used
Manufacturer :
Nanometrics
Model :
210
Year(s) :
0
Quantity :
1
Location :
Seller or machines location:
ASIA (North East)
ASIA (North East)
Last check :
13 Dec. 2023
*. Process: Film thickness measurement. - silicon dioxide on silicon 400~ 30,000 A. - photo resist on silicon 500~ 40,000 A. - other thin films. *. Hardware configuration: - Optical microscope & objectives 5x,10x,40x. - Spectrophotometer Head. - Microcomputer & Monitor. - Photo intensity Display & Wavelength counter. - Microscope Stage. *. Wavelength : 390~800 nm TungstenLamp 12V /50W.
Wafer Size 8"
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