Semilab CMS3 non contact sheet resistance measuring system

Ref : 2158770-9-W

Condition : Used

Manufacturer : -

Model : Semilab CMS3 non contact sheet resistance measuring system

Year(s) : -

Quantity : 1

Location : Seller or machines location:
AMERICA North (USA-Canada-Mexico)

Last check : 29 Jan. 2024

Meas. technique: non-contact, junction photovoltage (JPV)
Sample size: 100 to 156 mm (210mm option)
Sample structure: np or pn junctions
Measurement range: 10 Î©/sq. to 200 Î©/sq.
Probe distance: 1.5 mm probe height above transport bel
Wafer vertical position tolerance: < 400 Î¼m
Sample support: on belt
Calibration: by wafers verified with four point probe

Options:

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