Used Semiconductor Equipment

Wafer Size 8" Tool's Condition Refurbished Measurement Range : 25§- 20탆 - 500?-200 um with the visible light Location : ASIA (North East)

Price : On request

Wafer Size 8" Tool's Condition Refurbishing •; Optimized Polarized Reflectance (Rs and Rp) Data - Wavelength Location : ASIA (North East)

Price : On request

Wafer Size 8" Tool's Condition Refurbishing Step height: Nanometers to 1000µ;m Step height repeatability : 4 Year(s) : 2017 Location : ASIA (North East)

Price : On request

Wafer Size 8" Vintage 2012-3 Tool's Condition Refurbishing The KLA-Tencor P-16+ Profiler is a highly sensiti Year(s) : 2012 Location : ASIA (North East)

Price : On request

Model Dimension 7000 Wafer Size 8" Vintage 1996-3 Year(s) : 1996 Location : ASIA (North East)

Price : On request

Wafer Size 8" Tool's Condition Refurbishing 1.Microscope : - Model : OLYMPUS MX61L F - Objectives :5X,10X,20 Location : ASIA (North East)

Price : On request

Wafer Size 8" Vintage 2018-4 Tool's Condition Refurbishing ■ System Configuration . WT2020 main unit with sc Year(s) : 2018 Location : ASIA (North East)

Price : On request

Wafer Size 8" Vintage 2009-5 Tool's Condition Excellent ■ System Configuration . WT2000PV main unit with scan Year(s) : 2009 Location : ASIA (North East)

Price : On request

Wafer Size 8" . Up to 8" . Automatic robotic wafer handling . Single open-cassette wafer loading station . Me Year(s) : 0 Location : ASIA (North East)

Price : On request

Wafer Size 8" Vintage 2000-10 . Wafer size : 200mm . CE marked . Single open cssette handler . Image Computer Year(s) : 2000 Location : ASIA (North East)

Price : On request

Wafer Size 8" Vintage - . Scans samples up to 8 inch . Little or no sample preparation for increased produc Location : ASIA (North East)

Price : On request

System Measurement Performance Spreading Resistance Dynamic Range : 1Ω to > 10Ω Reistivity : 10-⁴~ 4x10⁴Ωcm Co Year(s) : 2004 Location : ASIA (North East)

Price : On request

[ General Description ] Wafer Size : 2 ~8 inch Illumination Source : 25 mW laser, 405 nm wavelength Operator I Year(s) : 2009 Location : ASIA (North East)

Price : On request

■ Capable up to 12" Wafer ■ SSM 52 Capacitance Measurement Unit ■ Motor control unit ■ Pneumatic control Unit Year(s) : 2008 Location : ASIA (North East)

Price : On request

[ General Description ] Wafer Size : 2 ~ 6 inch Illumination Source : 25 mW laser, 405 nm wavelength Operator Year(s) : 2005 Location : ASIA (North East)

Price : On request

[ General Description ] Wafer Size : 2 ~8 inch Illumination Source : 8mW laser, 635 nm wavelength Operator Int Year(s) : 2006 Location : ASIA (North East)

Price : On request

■ Capable up to 12" Wafer ■ SSM 52 Capacitance Measurement Unit ■ Auto wafer handling (Genmark robot & pre ali Year(s) : 2004 Location : ASIA (North East)

Price : On request

■ Capable up to 12" Wafer ■ SSM 42 Capacitance Measurement Unit ■ Motor control unit ■ Pneumatic control Unit Year(s) : 2001 Location : ASIA (North East)

Price : On request

Fully Automated Thin Film Metrology System for Patterned and Unpatterned Wafers DUV - Vis - NIR: 190nm to 100 Location : ASIA (North East)

Price : On request

*. Process: Film thickness measurement. - silicon dioxide on silicon 400~ 30,000 A. - photo resist on silicon Year(s) : 1996 Location : ASIA (North East)

Price : On request

*. Process: Film thickness measurement. - silicon dioxide on silicon 400~ 30,000 A. - photo resist on silicon Year(s) : 0 Location : ASIA (North East)

Price : On request

[ General Description ] Wafer Size : 2 ~ 6 inch Illumination Source : 25 mW laser, 405 nm wavelength Operator Year(s) : 2006 Location : ASIA (North East)

Price : On request

[ General Description ] Wafer Size : 2 ~8 inch Illumination Source : 8mW laser, 635 nm wavelength Operator Int Year(s) : 2006 Location : ASIA (North East)

Price : On request

[ General Description ] Wafer Size : 2 ~8 inch Illumination Source : 25 mW laser, 405 nm wavelength Operator I Year(s) : 2009 Location : ASIA (North East)

Price : On request

- Long Scan Profiler Measurement. - Standard Head with L type stylus. - Scan Length: 210mm. - Scan Speed : 1㎛ Year(s) : 0 Location : ASIA (North East)

Price : On request