Used Semiconductor Equipment

• Rotation Speed Range: adjustable from 300 to 20,000 rpm • Manual Left/Right Movement: 50 mm • Automatic Proc Location : ASIA (North East)

Price : On request

• X-Y Stage Coarse Movement (X): 200 mm • X-Y Stage Coarse Movement (Y): 200 mm • X-Y Stage Fine Movement (X): Location : ASIA (North East)

Price : On request

• Number of control axes: 3 axes (X, Y, Z) • Control method: PTP control • Control method: Interpolation contr Location : ASIA (North East)

Price : On request

The spin rinse dryer is used for rinsing and drying substrates. A safety emergency stop for the nitrogen heate Year(s) : 2015 Location : EUROPE (Western and Northern)

Price : On request

Wire Bonder Year(s) : 2021 Location : ASIA (North East)

Price : On request

Prober Year(s) : 1985, 1990 Location : ASIA (North East)

Price : On request

Coater/Developer Location : ASIA (North East)

Price : On request

Wafer size: 300mm Tool has been de-installed and is stored in an off-site warehouse. A Hard Disk Drive will Location : EUROPE (Western and Northern)

Price : On request

Wafer size: 20mm Microscope Location : EUROPE (Western and Northern)

Price : On request

Batch system for plasma cleaning or etching. Currently configured with one shelf set: 17 in. x 14 in. Shelves Location : EUROPE (Western and Northern)

Price : On request

Inspection/Auto Optical Location : ASIA (North East)

Price : On request

Measurement: Film thickness Year(s) : 2005, 2006 Location : ASIA (North East)

Price : On request

Process: HTO Vintage: 2006 Year(s) : 2006 Location : EUROPE (Western and Northern)

Price : On request

Process: HTO Vintage: 2015 Year(s) : 2015 Location : EUROPE (Western and Northern)

Price : On request

Process: Thickness Measurement Wafer size: 12" Condition: as is Year(s) : 2009 Location : EUROPE (Western and Northern)

Price : On request

Zeiss 1540 EsB Dual Beam FIB-SEM - EDX is included - 10mm EDAX detector - Known issue with Ion Pump for FIB ca Location : EUROPE (Western and Northern)

Price : On request

KLA-Tencor SP1-TBI Wafer Defect Inspection System | 200mm | AS-IS KLA-Tencor SP1-TBI wafer defect inspection s Year(s) : 2000 Location : EUROPE (Western and Northern)

Price : On request

KLA 6200 for sale in Refurbished condition. Optional Calibration Wafers available if required Location : EUROPE (Western and Northern)

Price : On request

Prober Location : ASIA (North East)

Price : On request

probe: Wafer Probing Tester Location : ASIA (North East)

Price : On request

Prober Location : ASIA (North East)

Price : On request

KLA-Tencor Equipment Model: Surfscan 6220 Type: Defect Inspection System Wafer Size: 2", 3", 4", 6", 8" Equipm Year(s) : 1997 Location : EUROPE (Western and Northern)

Price : On request

Burn-in Test System/Memory test Year(s) : 2018 Location : ASIA (North East)

Price : On request

insp: E-Beam Wafer inspection Year(s) : 2014, 2015 Location : ASIA (North East)

Price : On request

insp: E-Beam Wafer inspection Year(s) : 2012 Location : ASIA (North East)

Price : On request