Used Semiconductor Equipment

Wafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier KLA-TENCOR Model EDR 5210 Year(s) : 2010 Location : United States (USA)

Price : On request

Wafer Size 200 mm Fab Section Thin Film General Product Information Vendor Supplier Lam Research Model Novell Year(s) : 2000 Location : United States (USA)

Price : On request

Wafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier BRUKER Model D8 Fabline V Year(s) : 2014 Location : United States (USA)

Price : On request

Wafer Size 200 mm Fab Section Thin Film General Product Information Vendor Supplier Lam Research Model Novell Year(s) : 2000 Location : United States (USA)

Price : On request

Wafer Size 200 mm Fab Section Clean General Product Information Vendor Supplier CFM Model FullFlow 1/99 8100 Year(s) : 1999 Location : United States (USA)

Price : On request

Wafer Size 200 mm Fab Section Thin Film General Product Information Vendor Supplier AMAT Model ENDURA P5500 V Year(s) : 2000 Location : United States (USA)

Price : On request

Wafer Size 200 mm Fab Section Clean General Product Information Vendor Supplier CFM Model FullFlow 1/99 8100 Year(s) : 1999 Location : United States (USA)

Price : On request

Wafer Size 300 mm Fab Section Thin Film General Product Information Vendor Supplier AMAT Model Producer SE Vi Year(s) : 2011 Location : United States (USA)

Price : On request

OP2600DUVI, 200mm, s/n: 6454 Year(s) : 1997 Location : United States (USA)

Price : On request

OP3260I, 200mm, s/n: 6678 Year(s) : 1998 Location : United States (USA)

Price : On request

Scanning Electron Microscopes Year(s) : 2008 Location : United States (USA)

Price : On request

EDR 5210, 300mm, s/n: 5040135 Year(s) : 2010 Location : United States (USA)

Price : On request

200mm, s/n: 97-46-5419 Year(s) : 2000 Location : United States (USA)

Price : On request

200mm, s/n: 1080 Location : United States (USA)

Price : On request

ION IMPLANTATION SYSTEM Year(s) : 1998 Location : United States (USA)

Price : On request

General Product Information Vendor Supplier MATTSON TECHNOLOGY Model ASPEN 2 Vintage 1999 Asset Description MA Year(s) : 1999 Location : United States (USA)

Price : On request

General Product Information Vendor Supplier DISCO Model DGP8761/Type DP Vintage 2012 Asset Description BSG900- Year(s) : 2012 Location : United States (USA)

Price : On request

General Product Information Vendor Supplier Applied Material Model Quantum Leap II Vintage 2002 Asset Descript Year(s) : 2002 Location : United States (USA)

Price : On request

General Product Information Vendor Supplier LINTECH Model RAD-3510F/12 Vintage 2012 Asset Description BSL900-T Year(s) : 2012 Location : United States (USA)

Price : On request

Transaction Information Tool ID OP 922 Tool Status Connected Wafer Size 300 mm Fab Section Defect Detection Year(s) : 2007 Location : United States (USA)

Price : On request

Vendor Supplier DISCO Model DGP8761/Type DP Vintage 2018 Asset Description BSG903U1-TR DISCO DFM2800 Fully au Location : United States (USA)

Price : On request

Wafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier AMAT Model Verity1 SEM Vi Year(s) : 2005 Location : United States (USA)

Price : On request

5200, 200mm, s/n: 2070 Year(s) : 2000 Location : United States (USA)

Price : On request

Raider ECD310 Year(s) : 2006 Location : United States (USA)

Price : On request

Wafer Size 300 mm Fab Section Diffusion General Product Information Vendor Supplier APPLIED MATERIALS Model C Year(s) : 2006 Location : United States (USA)

Price : On request