Used Semiconductor Equipment

OP3260I, 200mm, s/n: 6678 Year(s) : 1998 Location : United States (USA)

Price : On request

Scanning Electron Microscopes Year(s) : 2008 Location : United States (USA)

Price : On request

EDR 5210, 300mm, s/n: 5040135 Year(s) : 2010 Location : United States (USA)

Price : On request

200mm, s/n: 97-46-5419 Year(s) : 2000 Location : United States (USA)

Price : On request

200mm, s/n: 1080 Location : United States (USA)

Price : On request

ION IMPLANTATION SYSTEM Year(s) : 1998 Location : United States (USA)

Price : On request

General Product Information Vendor Supplier MATTSON TECHNOLOGY Model ASPEN 2 Vintage 1999 Asset Description MA Year(s) : 1999 Location : United States (USA)

Price : On request

General Product Information Vendor Supplier DISCO Model DGP8761/Type DP Vintage 2012 Asset Description BSG900- Year(s) : 2012 Location : United States (USA)

Price : On request

Applied Materials Raider Edge ECD Liftoff Tool 3ea Process Tanks 2ea Chemical Dispense Cabinets HCl, Dilute HF Year(s) : 2019 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

For 200mm & 300mm Patterned & Unpatterned Wafers Brightfield/Darkfield Optics 2X, 3.5X, 5X & 10X Objectives 35 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

For 150mm & 200mm Patterned & Unpatterned Wafers For GaN & GaAs on Sapphire & Silicon Wafers Brightfield/Dark Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Automated Optical Inspection System Brand Pemtron Year(s) : 2020 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Placement Machine (4) 12 nozzle heads Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

High-Tech Science High-performance fluorescent X-ray thickness gauge [Main specifications] ・X-ray tube: Tub Year(s) : 2013 Location : ASIA (North East)

Price : On request

Spin Etch Tool (8''tool) Condition Fair Exterior Dimensions Width 246.000 in (624.8 cm) Depth 109.0 Year(s) : 2006 Location : EUROPE (Western and Northern)

Price : On request

For 200mm Patterned Wafers on Film Frames Brightfield/Darkfield Optics 2X, 5X, 10X & 20X Objectives 35X LWD Re Year(s) : 2022 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Brightfield Defect Inspection Tool Cassette to Cassette YES Condition Excellent 0.25µ, 0.39µ, 0.62µ Spot Si Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Wafer Size Range Minimum 300 mm Maximum 300 mm Set Size 300 mm Illumination Source Type Multi-wave Year(s) : 2016 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Plasma Etch Version: 150 mm Vintage: 01.06.1995 The equipment was operational in the wafer fab up until Augus Year(s) : 1995 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

High Current Implanter Version: 200 mm SMIF Vintage: 01.12.2000 : Current Status of tool: In cleanroom, idled Year(s) : 2000 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Version: 150 mm Vintage: 01.06.1992 The equipment was operational in the wafer fab up until August 2024. The Year(s) : 1992 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

General Product Information Vendor Supplier LINTECH Model RAD-3510F/12 Vintage 2012 Asset Description BSL900-T Year(s) : 2012 Location : United States (USA)

Price : On request

Transaction Information Tool ID OP 922 Tool Status Connected Wafer Size 300 mm Fab Section Defect Detection Year(s) : 2007 Location : United States (USA)

Price : On request

OAI Model 806 MBA NUV 4" Mask Aligner is a four-camera, manual, optical backside mask aligner system that is d Location : AMERICA North (USA-Canada-Mexico)

Price : On request

DOM 6/2017 Per the OEM: As the true 3D AOI system, ZENITH LiTE effectively measures solder joints and compo Year(s) : 2017 Location : AMERICA North (USA-Canada-Mexico)

Price : On request