Used Semiconductor Equipment

Basic Post Reflow Automated Optical Inspection Machine Year: 2014 Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Automated Optical Inspection Machine Model Ultra III Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Wafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier KLA Model Archer A500 AIM Year(s) : 2014 Location : United States (USA)

Price : On request

Wafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier KLA-TENCOR Model EDR 5210 Year(s) : 2010 Location : United States (USA)

Price : On request

Basic Post Reflow Automated Optical Inspection Machine Year: 2014 Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Automated Optical Inspection Year: 2010 Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Solder Paste Inspection Machine Year: 2010 Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Wafer Size 200 mm Fab Section Thin Film General Product Information Vendor Supplier Lam Research Model Novell Year(s) : 2000 Location : United States (USA)

Price : On request

Wafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier BRUKER Model D8 Fabline V Year(s) : 2014 Location : United States (USA)

Price : On request

KLA-TENCOR SURFSCAN SP1 DLS UNPATTERNED SURFACE INSPECTION SYSTEM consisting of: - Model: SP1 DLS with 300mm S Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Wafer Size 200 mm Fab Section Thin Film General Product Information Vendor Supplier Lam Research Model Novell Year(s) : 2000 Location : United States (USA)

Price : On request

Wafer Size 200 mm Fab Section Clean General Product Information Vendor Supplier CFM Model FullFlow 1/99 8100 Year(s) : 1999 Location : United States (USA)

Price : On request

Wafer Size 200 mm Fab Section Thin Film General Product Information Vendor Supplier AMAT Model ENDURA P5500 V Year(s) : 2000 Location : United States (USA)

Price : On request

200mm As-is KLA / MicroSense UMA-C200-STR Thin Film Stress Measurement System consisting of: - Vintage: Appro Year(s) : 2019 Location : EUROPE (Western and Northern)

Price : On request

PLASMATHERM ODYSSEY HDRF ASHER consisting of: - Model: Odyssey HDRF - Configured for 150mm wafers - 2 Chambers Location : EUROPE (Western and Northern)

Price : On request

Suss MJB3 submicron mask aligner with 350w lamphouse and splitfield optics Splitfield microscope Leica objec Location : EUROPE (Western and Northern)

Price : On request

Laminators Location : EUROPE (Western and Northern)

Price : On request

Detaping 6" thinwafer Wafer Size Range Minimum 200 mm Maximum 200 mm Set Size 200 mm Cassette to Ca Year(s) : 2006 Location : EUROPE (Western and Northern)

Price : On request

Wafer Size 200 mm Fab Section Clean General Product Information Vendor Supplier CFM Model FullFlow 1/99 8100 Year(s) : 1999 Location : United States (USA)

Price : On request

Wafer Size 300 mm Fab Section Thin Film General Product Information Vendor Supplier AMAT Model Producer SE Vi Year(s) : 2011 Location : United States (USA)

Price : On request

Max KV: 160KV Operating system : Windows 10 Detector : Flat Panel Max tube power : 10W Tube NT500 Condition : Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Wafer Size Range Minimum 200 mm Maximum 300 mm Set Size 300 mm Cassette to Cassette YES Wafer Hand Location : AMERICA North (USA-Canada-Mexico)

Price : On request

APCVD Version: 150 mm Year(s) : 1998 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Photoresist prime Version: 150 mm Year(s) : 2017 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

OP2600DUVI, 200mm, s/n: 6454 Year(s) : 1997 Location : United States (USA)

Price : On request