Used Semiconductor Equipment

The IVS120 is an automatic metrology system designed for measuring critical dimensions (CD´s). Power Requirem Year(s) : 1998 Location : EUROPE (Western and Northern)

Price : On request

Condition Good Power Requirements 220 V 24.0 A 15.0 A(2) 50 Hz 3 Phase Year(s) : 2008 Location : EUROPE (Western and Northern)

Price : On request

Wafer Size 200 mm Fab Section Thin Film General Product Information Vendor Supplier AMAT Model CENTURA MCVD S Year(s) : 2001 Location : United States (USA)

Price : On request

Wafer inspection system WS-75BU, WS-70LCKT/15M Location : EUROPE (Western and Northern)

Price : On request

Wafer Inspection System Model 7555.0 Location : EUROPE (Western and Northern)

Price : On request

The system was deinstalled in september 2002 and until that date was upgraded with various hardware and soft Location : EUROPE (Western and Northern)

Price : On request

WAFER SPECIFICATION Wafer Size 150mm SYSTEM CONFIGURATION CHAMBER A CHAMBER B Year(s) : 2007 Location : EUROPE (Western and Northern)

Price : On request

Condition Good Power Requirements 200-240 V 50/60 Hz 3 Phase Weight 1,213 lb (550 kg) Year(s) : 2011 Location : EUROPE (Western and Northern)

Price : On request

Tool still maintained within Basic-Maintenance contract by KLA! Condition Excellent Power Requirements 208 V Year(s) : 2017 Location : EUROPE (Western and Northern)

Price : On request

Wafer Size 200 mm Fab Section Thin Film Tool Available Date 2024-10-31 General Product Information Vendor Sup Year(s) : 1996 Location : United States (USA)

Price : On request

Wafer Size 300 mm Fab Section Thin Film General Product Information Vendor Supplier AMAT Model PECVD Producer Year(s) : 2014 Location : United States (USA)

Price : On request

The KLA is complete and refurbished in 2015. No known condition issues. Year(s) : 1992 Location : EUROPE (Western and Northern)

Price : On request

3 Ports: 200 mm / 300 mm Refurbished Location : EUROPE (Western and Northern)

Price : On request

Automatic Defect Inspection Machine Model NSX 95 Location : EUROPE (Western and Northern)

Price : On request

Wafer Size 200 mm Fab Section Diffusion General Product Information Vendor Supplier Tokyo Electron Limited Mo Year(s) : 1994 Location : United States (USA)

Price : On request

Wafer Size 200 mm Fab Section CMP General Product Information Asset Description Ebara 222 Oxide CMP-STI Softw Year(s) : 2000 Location : United States (USA)

Price : On request

Wafer Size 300 mm Fab Section Clean General Product Information Software Version 258000 CIM E84, SECS/GEM, GE Year(s) : 2012 Location : United States (USA)

Price : On request

Dual Track Photoresist Coater With Hotplates Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Parts machine 2008 Vintage Model NSX 105 Inspection System, 8" Year(s) : 2008 Location : EUROPE (Western and Northern)

Price : On request

Wafer Inspection System SFS7700 Used condition, recently came out from the working Environment. Year(s) : 1997 Location : EUROPE (Western and Northern)

Price : On request

Inspection system Brand Nanotronics Imaging Inc. Model nSPEC Year(s) : 2018 Location : EUROPE (Western and Northern)

Price : On request

Condition Good Year of Manufacture 2011 Exterior Dimensions Width 220.000 in (558.8 cm) Depth 125.000 Year(s) : 2011 Location : EUROPE (Western and Northern)

Price : On request

Probe Equipment 200mm Year(s) : 1995 Location : United States (USA)

Price : On request

300mm, s/n: V120377 Manual Photoresist Coaters Year(s) : 2012 Location : United States (USA)

Price : On request

Wafer Size 200 mm Fab Section Metrology General Product Information Vendor Supplier KLA Tencor Model UV1280SE Year(s) : 1999 Location : United States (USA)

Price : On request