Used Semiconductor Equipment

Accessories 3 monitors Condition Good Year of Manufacture 2008 Year(s) : 2008 Location : EUROPE (Western and Northern)

Price : On request

Particle counter for transparent wafer 6 Inch As is cold down Was working before de-install, Year(s) : 2011 Location : EUROPE (Western and Northern)

Price : On request

Centura TCCP – TAN Ox Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Thin Films measurement tool, 8300 XSE Film Thickness Analyzer, Semi Automatic loader (150, 200, and 300mm wafe Location : AMERICA North (USA-Canada-Mexico)

Price : On request

WIRE BONDER Accessories Monitors Year of Manufacture 2003 Condition Good Year(s) : 2003 Location : EUROPE (Western and Northern)

Price : On request

Condition Good Year(s) : 2004 Location : EUROPE (Western and Northern)

Price : On request

CVD: MOCVD(SIC)/4in. Year(s) : 2014 Location : ASIA (North East)

Price : On request

CVD: MOCVD/4in Year(s) : 2010 Location : ASIA (North East)

Price : On request

CVD: MOCVD Year(s) : 2004 Location : ASIA (North East)

Price : On request

DOM: August 2013 457 x 308 mm (18” x 12”) inspection area 12 um high-resolution, high-speed CMOS cameras Inspe Year(s) : 2013 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

457 x 308 mm (18” x 12”) inspection area 12 um high-resolution, high-speed CMOS cameras Inspection Speed 200cm Year(s) : 2016 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Condition Good Exterior Dimensions Width 106.299 in (270.0 cm) Depth 62.992 in (160.0 cm) Heigh Year(s) : 2011 Location : EUROPE (Western and Northern)

Price : On request

LIthography System Model 2450L DI DUO Year(s) : 2018 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Implant Disc 13 Site, Silicon Coated Two-dimensional beam profiler Model/Type Viision 200+ Manufacturing Ye Year(s) : 1997 Location : EUROPE (Western and Northern)

Price : On request

Wafer Mount Accessories Includes one monitor Condition Good Year(s) : 2005 Location : EUROPE (Western and Northern)

Price : On request

DOM: February 2015 457 x 308 mm (18” x 12”) inspection area 12 um high-resolution, high-speed CMOS cameras In Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Omron VT-X700-L X-Ray System Inline 3D X-Ray System DOM: 2017 Large Board Option Micro-focus closed tube (130 Year(s) : 2017 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

DOM: November 2013 457 x 308 mm (18” x 12”) inspection area 12 um high-resolution, high-speed CMOS cameras Ins Year(s) : 2013 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Power Requirements 230 V 16.0 A Condition Excellent Year(s) : 2007 Location : EUROPE (Western and Northern)

Price : On request

Power Requirements 240 V 13.0 A Condition Excellent Year(s) : 2014 Location : EUROPE (Western and Northern)

Price : On request

Cyberoptics SE500-ULTRA SPI - 2015 #55076 DOM: March 2015 Win 7, V5.4.01283 software 510 x 510mm (20 x 20 in. Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Tube: NanoTech 160 kV / 20 W Transmissive tube. Microfocus source with submicron feature recognition Detect Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Hitachi WA200 FAB SMIFF interface Wide area scanning probe microscope Year(s) : 2001 Location : EUROPE (Western and Northern)

Price : On request

Metrology Model INS3300 Location : EUROPE (Western and Northern)

Price : On request

VJ Electronix SRT Micra Rework Station Vintage: 9-2014 Software: Windows 7 Convection Top Site Heating SierraM Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)

Price : On request