Used Semiconductor Equipment

Wafer Size 300 mm Fab Section Defect Detection General Product Information Vendor Supplier AMAT Model UVision Year(s) : 2014 Location : United States (USA)

Price : On request

Wafer Size 200 mm Fab Section Implant General Product Information Software Version 13.42.18 CIM GEM and SECS Year(s) : 2007 Location : United States (USA)

Price : On request

Wire Bonder Model 3088 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Laser System Brand Epilog Vintage : AUG 2010 Model: 9000 Laser System 36"x24" Work Area 120W Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

[Specifications] ○Printing laser: Yb fiber laser, class 4 laser ○Laser wavelength: 1060nm ○Printing laser aver Location : ASIA (North East)

Price : On request

Currently tool is still warm down Condition Good Year of Manufacture 2006 Year(s) : 2006 Location : EUROPE (Western and Northern)

Price : On request

Wafer Size 300 mm Fab Section Lab General Product Information Vendor Supplier FEI Model FEI ExSolve CLM Next Year(s) : 2016 Location : United States (USA)

Price : On request

Wafer Size 200 mm Fab Section Clean General Product Information Vendor Supplier Fusion Semiconductor Model 20 Year(s) : 1993 Location : United States (USA)

Price : On request

Wafer Size 200 mm Fab Section Etch General Product Information Vendor Supplier GASONICS INTERNATIONAL Model P Year(s) : 2000 Location : United States (USA)

Price : On request

Stepper: ArF scanner/8in. Year(s) : 2003, 2004 Location : ASIA (North East)

Price : On request

Digital Instruments Nanoscope III Scanning Probe Microscope Location : EUROPE (Western and Northern)

Price : On request

Type: Laser Equipment Configuration: 2008 Vintage Year(s) : 2008 Location : EUROPE (Western and Northern)

Price : On request

Sources: · (x2) RF Magnetrons with (x2) Matching units · (x1) RF generator 3kW AE RFG3001 switch Year(s) : 2006 Location : EUROPE (Western and Northern)

Price : On request

Brand AITCO Vintage: Approximately 2019 Up to 8" capable Used Minimally for R&D & Light Production Year(s) : 2019 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Model: Prometrix UV-1280SE Configured for 100mm and 150mm handling Measures Film Thickness, Refractive Index ( Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Fab Section Failure Analysis General Product Information Vendor Supplier BRUKER Model D8 Davinci Vintage 2013 Year(s) : 2013 Location : United States (USA)

Price : On request

Wafer Size 300 mm Fab Section Defect Detection General Product Information Vendor Supplier AMAT Model UVISION Year(s) : 2013 Location : United States (USA)

Price : On request

Main specifications -Controller: IM-6700 -Measuring head: IM-6225 (wide field of view, variable lighting type Location : ASIA (North East)

Price : On request

Basic Post Reflow Automated Optical Inspection Machine Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

KLA / MicroSense UMA-C200-STR Thin Film Stress Measurement System consisting of: - Vintage: Approximately 20 Year(s) : 2019 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

KLA-TENCOR SURFSCAN 6420 PARTICLE INSPECTION SYSTEM consisting of: - Model: Surfscan 6420 - Particle inspectio Location : AMERICA North (USA-Canada-Mexico)

Price : On request

APPLIED MATERIALS AMAT CENTURA II consisting of: - 2 DPS / DTM Chambers - Configured for 200mm - Vintage: 2019 Year(s) : 2019 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Wafer Size 200 mm Fab Section Diffusion General Product Information Vendor Supplier TOKYO ELECTRON LIMITED Mo Year(s) : 1995 Location : United States (USA)

Price : On request

Wafer Size 200 mm Fab Section Diffusion General Product Information Vendor Supplier TOKYO ELECTRON LIMITED Mo Year(s) : 1996 Location : United States (USA)

Price : On request

Wafer Size 200 mm Fab Section Diffusion General Product Information Vendor Supplier TOKYO ELECTRON LIMITED Mo Year(s) : 1993 Location : United States (USA)

Price : On request