Used Semiconductor Equipment

Höllmüller Acid Etch YOM 2001 Year(s) : 2001 Location : EUROPE (Western and Northern)

Price : On request

RAIDER ECD310 Year(s) : 2007 Location : United States (USA)

Price : On request

Model SFS 6200 Wafer Size 8" Vintage 1994-2 Tool's Condition Excellent Description *.Configuration: - Wafe Year(s) : 1994 Location : ASIA (North East)

Price : On request

Chemical Vapor Deposition Equipment 200mm Year(s) : 2011 Location : United States (USA)

Price : On request

Stepper Manufacturer Ultratech Model UT1500 Year(s) : 1996 Location : EUROPE (Western and Northern)

Price : On request

De-installation complete by Nikon Tech and currently located in environmentally controlled warehouse. No miss Year(s) : 2011 Location : EUROPE (Western and Northern)

Price : On request

Developer with 3 Developer Units, 9 Hotplates and 4 Coolplates. Very good condition Power Requirements 220 V Year(s) : 2001 Location : EUROPE (Western and Northern)

Price : On request

Wafer Size Range Set Size 300 mm Condition Good Power Requirements Other V 75.0 A 50/60 Hz 3 Year(s) : 2012 Location : EUROPE (Western and Northern)

Price : On request

Wafer Size Range Minimum 200 mm Maximum 200 mm Set Size 200 mm Number of Chambers 3 Chamber 1 Desc Year(s) : 2000 Location : EUROPE (Western and Northern)

Price : On request

Microscope Accessories without x - y table Power Requirements 200-240 V 2.0 A 50/60 Hz Condition Go Year(s) : 1997 Location : EUROPE (Western and Northern)

Price : On request

Wafer Size 300 mm Fab Section Material Handling General Product Information Vendor Supplier Rorze Model A4-BL Year(s) : 2006 Location : United States (USA)

Price : On request

Wafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier KLA Model Archer A500 LCM Year(s) : 2014 Location : United States (USA)

Price : On request

Wafer Size 200 mm Fab Section Etch General Product Information Vendor Supplier AME Model Centura Etch, IPS Vi Year(s) : 1997 Location : United States (USA)

Price : On request

Wafer Inspection System, WS-75BU, WS-70LCKT/15M Location : EUROPE (Western and Northern)

Price : On request

Condition Refurbished 200mm Patterned wafer inspection System This Tool was refurbished in 2017 and two new L Year(s) : 2001 Location : EUROPE (Western and Northern)

Price : On request

Nikon Eclipse L200N inspection microscope with brightfield and darkfield episcopic illumination Trinocular vi Location : EUROPE (Western and Northern)

Price : On request

Wafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier KLA Model Archer A500 LCM Year(s) : 2014 Location : United States (USA)

Price : On request

Wafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier KLA-TENCOR Model SPECTRAC Year(s) : 2010 Location : United States (USA)

Price : On request

Wafer Size 200 mm Fab Section Etch General Product Information Vendor Supplier Applied Materials Model Centur Year(s) : 1998 Location : United States (USA)

Price : On request

[Specifications] - Model year: 2012 - Measurement principle: VSI method: White light vertical scanning interfe Year(s) : 2012 Location : ASIA (North East)

Price : On request

Wafer Size Range Minimum 150 mm Maximum 150 mm Set Size 150 mm Condition Good Power Requirements Year(s) : 2000 Location : EUROPE (Western and Northern)

Price : On request

Wafer Size Range Minimum 150 mm Maximum 200 mm Set Size 200 mm Condition Excellent Power Requirements Location : EUROPE (Western and Northern)

Price : On request

AOI System Year(s) : 2007 Location : EUROPE (Western and Northern)

Price : On request

*. Process: wafer Sheet Resistance measurement *. Measurement perfomance: - 4 Point Probe check surface on Sil Year(s) : 1998 Location : ASIA (North East)

Price : On request

X-Ray Inspection System Model XD7600NT Year(s) : 2009 Location : EUROPE (Western and Northern)

Price : On request