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Veeco Dektak IIA

Ref : 1956107-9
Condition : Used
Manufacturer : Veeco
Model : Dektak IIA
Year(s) : 1983
Quantity : 1
Location : Seller or machines location:
AMERICA North (USA-Canada-Mexico)
Last check : 05 Aug. 2020

Veeco Dektak IIA Thin Film Metrology

Description:
Programmable Linear scanning system used for accurate measurements on vertical features ranging in height from 100 to 655,000 Angstroms, Vertical resolution 5 Angstroms, scan time 4 to 65 sec., 12.5 micron radius stylus, with a 10 to 50mg tracking force, The stage can handle up to a 5" diameter wafer or parts up to 3/4" thick. Maximum of 1000 data points, 3-scanning speeds, 70X microscope is standard

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