Used Metrology and inspection equipment
1,300 resultsSFS 4500 Surfscan Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsWyko NT9800 Noncontact Profiler Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsFacilities: 100-240 VAC, 50/60 Hz, 10 amps Dims: 34” x 39” x 17” (864mm x 991mm x 432mm) @ 170 lbs FEATURES: Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsB&L Microscope Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsSEM Year(s) : 2003 Location : ASIA (North East)
Price : On request
More detailsMicroscope Location : ASIA (North East)
Price : On request
More detailsFacilities: 100-240 VAC, 50/60 Hz, 10 amps Dims: 34” x 39” x 17” (864mm x 991mm x 432mm) @ 170 lbs FEATURES: Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsLithius Track 300mm Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsProfiler Location : AMERICA North (USA-Canada-Mexico)
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More detailsAOI Serial Number SG51500054 Location : -
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More detailsCondition Fair Power Requirements 380 V 3 Phase Other Information Power Consumption : 6,25 kVA Temp Ra Year(s) : 2014 Location : EUROPE (Western and Northern)
Price : On request
More detailsWafer Size: 200mm Year(s) : 1999 Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Size: 200mm Location : AMERICA North (USA-Canada-Mexico)
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More detailsIon implant /5in Location : ASIA (North East)
Price : On request
More detailsFacilities: 100-120V, 50/60Hz Dimms: 1500 lbs Year(s) : 2004 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsDetails: Powerful 3D sensor technology for quality control from below Shadow-free results by using eight angle Year(s) : 2016 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMetaPULSE II 200 X Thickness Measurement System, s/n 200MP11-1608-AW-11. Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsFacilities: 110VAC 50/60Hz, 15A & 30 PSI min. Dims: 55” x 57” x 50” @ 2,000 lbs Specifications Inspection Cap Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMicroscope Type Upright Microscope Configuration Brightfield Illumination Type Reflected Light Binocular An Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsPatterned Wafer Contamination Analyzer Cassette to Cassette YES Condition Excellent Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsFixed Binocular Head U-BI30 Pair of WHN10x/22 Eyepieces (one adjustable). Fixed Stage with Right Hand Coaxial Location : EUROPE (Western and Northern)
Price : On request
More detailsPower Requirements 220/240 V 50 Hz Exterior Dimensions Width 32.677 in (83.0 cm) Depth 98.425 Year(s) : 2009 Location : EUROPE (Western and Northern)
Price : On request
More detailsWafer Size 12 Archer AIM MPX Year(s) : 2005 Location : ASIA (North East)
Price : On request
More detailsWafer Size 12 Centura DPS2 Year(s) : 2005 Location : ASIA (North East)
Price : On request
More detailsWafer Size 8 R4420 Year(s) : 2004 Location : ASIA (North East)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.