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Used Metrology and inspection equipment

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Nanometrics AFT 210 * EQP-00848-SI & EQP-00870-SI (has auto loader as pictured below) * Nanometrics 210 * Fil Location : AMERICA North (USA-Canada-Mexico)

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Gaertner L116S Ellipsometer * Fully Operational * PC controlled for measurement * Simple manual stage 8" capa Location : AMERICA North (USA-Canada-Mexico)

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Veeco Dektak 3030 Profilometer * EQP-00847-SI * Operating modes: Automatic, semi automatic, manual. * Stage Location : AMERICA North (USA-Canada-Mexico)

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Laser marking Refurbished Used Equipment - Outside dimensions (LxWxH): 1000 x 1635 x 1555 mm - Weight: 450 Year(s) : 2009 Location : EUROPE (Western and Northern)

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CYBEROPTICS SE 300 ULTRA 3D Solder Paste Inspection - Inline inspection system after printer - Vintage 2008 Location : EUROPE (Central and Eastern)

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CYBEROPTICS model SE 300 ULTRA online SPI inspection machine - 508mm x 508mm card size - thickness from 0.5mm Location : EUROPE (Central and Eastern)

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Facilities: 208-240VAC 50/60Hz, 10A / Air: 60 PSI, 1 CFM Dims: 39" W x 43.3" D x 62" H @ 1100 lbs Transfer Dir Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)

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Facilities: 110 VAC 1ph, 50/60Hz, 15amps / 80 psi, 2 CFM Dims: 59" x 66" x 63" @ 5,500 lbs offers complete ins Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)

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Quick Set up Supplied fully working & Tested Hi Resolution 1.3 Mega Pixel Colour Camera Max. Board Year(s) : 2005 Location : EUROPE (Western and Northern)

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IR-4 Preheater 208VAC 20Amp 50/60Hz Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)

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Thin film measurement system, 6"-8" Computer: Intel Pentium III Operating system: Windows NT (2) Open cassette Location : AMERICA North (USA-Canada-Mexico)

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microscope has been rebuilt to the original OEM specifications and comes complete with a Schottky emitter that Location : AMERICA North (USA-Canada-Mexico)

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100KV W or LaB6 Compustage and a single tilt holder Location : AMERICA North (USA-Canada-Mexico)

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Equipped with Magnum ion Column SFEG UHR SEM STEM capable! 5 axis stage with 100 x 100 mm XY Turbo vacuum 2 GI Location : AMERICA North (USA-Canada-Mexico)

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Type I available Equipped with a cold FEG emitter High vacuum 25mm XY stage 4” load lock entry ODP vacuum Location : AMERICA North (USA-Canada-Mexico)

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is equipped with 100KV, W or LaB TWIN lens, and a single tilt holder Location : AMERICA North (USA-Canada-Mexico)

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is equipped with a Schottky FEG emitter High vacuum, 5 axis motorized stage 50 x 50mm XY, and Turbo vacuum Location : AMERICA North (USA-Canada-Mexico)

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microscope has been rebuilt to the original OEM specifications and comes complete with a Schottky emitter that Location : AMERICA North (USA-Canada-Mexico)

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Equipped with 120KV, W or LaB6 and a single tilt holder Install and custom configuration available including c Location : AMERICA North (USA-Canada-Mexico)

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is equipped with a Schottky FEG emitter High vacuum, 5 axis motorized stage 150 x 150mm XY, and Turbo vacuum Location : AMERICA North (USA-Canada-Mexico)

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Equipped with Prelens ion Column SFEG UHR SEM 5 axis stage with 200 x 200 mm XY Load lock loading Turbo vacuum Location : AMERICA North (USA-Canada-Mexico)

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Equipped with 200KV, Schottky FEG emitter SuperTWIN lens. Beautiful and high performer! It includes single ti Location : AMERICA North (USA-Canada-Mexico)

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software package: Magnum Column SFEG UHR SEM 300mm wafers and 200 Flexilock loading FOUP loading Bridge tool f Location : AMERICA North (USA-Canada-Mexico)

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A single tilt holder SE mode TMP vacuum Location : AMERICA North (USA-Canada-Mexico)

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Features a S-TWIN pole piece Analytical setup – STEM Operates up to 200KV and comes with a single tilt holder; Year(s) : 2003 Location : AMERICA North (USA-Canada-Mexico)

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You can find used Metrology and inspection equipment on Wotol

The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.

The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.

HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. 

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