Used Metrology and inspection equipment
1,299 resultsMain System FEI TL-150 Handler System Asyst Front End with AeroTech Software Version 2.55.6.107 Factory Interf Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsG2 F20 S TWIN TMP, 300mm Scanning Electron Microscope Location : AMERICA North (USA-Canada-Mexico)
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More detailsSonogage 200, Model 20-02000 Location : AMERICA North (USA-Canada-Mexico)
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More detailsPaxcam 2 Camera, X/Y/Theta adjustment, Corse/fine focus Location : AMERICA North (USA-Canada-Mexico)
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More detailsL117 Ellipsometer w/ Video Camera & Computer Location : AMERICA North (USA-Canada-Mexico)
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More detailsThis XRD is the X ‘pert Pro MRD manufactured by Panalytical With mainly configuration： Cradle（5-Axis X Y Location : AMERICA North (USA-Canada-Mexico)
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More detailsBHM Reflected Light Microscope w/ Sentech Analyzer + HP Vectra Location : AMERICA North (USA-Canada-Mexico)
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More detailsAutomatic Ellipsometer Location : AMERICA North (USA-Canada-Mexico)
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More detailsCondition Good Power Requirements 380 V 3 Phase Power Consumption : 17 kw 58 BTU/hour Exterior Dimensio Year(s) : 2000 Location : EUROPE (Western and Northern)
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More detailsWafer Inspection System Version: 300mm De-installed, warehoused, can be inspected by appointment Location : AMERICA North (USA-Canada-Mexico)
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More detailsSPUTTERS DOWN PE 2400 3 TARGET SPUTTERING SYSTEM FOR UP TO 6″ WAFERS (ANY SHAPE) RF TARGETS, 8″ DIAMETER FOR M Location : AMERICA North (USA-Canada-Mexico)
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More detailsDouble Stack SRD (Set up for solar wafer use) Version: 100 mm, M0, M2 Vintage: 01.02.1999 -Semitool PSC 101 -S Year(s) : 1999 Location : AMERICA North (USA-Canada-Mexico)
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More detailsAutomated Wafer, Die and Bump Inspection System Version: 300 mm Vintage: 01.06.2008 Dimensions on base: 72 in Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)
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More detailsAutomated Macro Defect Inspection Version: 150 mm/200 mm Automatic Shut down in Fab. Needs to be removed in t Location : AMERICA North (USA-Canada-Mexico)
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More details【specification】 ・Measurement part: XM-T1000 (2 probe type) ・Controller: XM-1500 ・Measurement range: 300mm x 25 Location : ASIA (North East)
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More detailsHigh-Tech Science Scanning White Interference Microscope <b> specification </b> ○Observation interference mi Location : ASIA (North East)
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More detailsWafer Size 8" Vintage 2002-8 Tool's Condition Excellent - Long Scan Profiler P-15 Measurement. - Micro Head I Year(s) : 2002 Location : ASIA (North East)
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More detailsBinocular Angle 45° Eyepieces Magnification 20 X Field Number 13 mm Focusing YES Objective Model Location : AMERICA North (USA-Canada-Mexico)
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More detailsBinocular Angle 45° Eyepieces Magnification 20 X Focusing YES Magnification Range 18 X - 150 X Zo Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand Mitaka Kohki Non-contact 3D measuring device 【Main Specifications】 〇Microscope section ・Expensive obser Location : ASIA (North East)
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More detailsSurface roughness measuring machine Year: Model: 2011 Measurement range/resolution: Z axis 800μm/0.01μm, 80 Year(s) : 2011 Location : ASIA (North East)
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More detailsYear: Model: 2015 Tilt mechanism: Yes (X axis, tilt angle ±45 degrees) Measurement range/resolution: X-axis 20 Year(s) : 2015 Location : ASIA (North East)
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More detailsXray Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)
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More detailsImage dimension measuring instrument 【specification】 ・Controller: IM-6600 ・Measuring head: IM-6140 (high prec Location : ASIA (North East)
Price : On request
More details6×6″ travel with 6″ wafer chuck New video camera and monitor 1 year warranty on parts Optional probe card hold Location : AMERICA North (USA-Canada-Mexico)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.