Used Metrology and inspection equipment
1,259 results-CE MARKED -INCLUDES ALL SOFTWARE DISKS AND ELECTRONIC MANUALS -ONLY USED FOR RUNNING A FEW PILOT LOTS -NEVER Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsSDI ID: 99830 Manufacturer: JORDAN VALLEY Model: JVX6200I Type: X-ray Metrology System Version: 300 mm Conditi Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsHITACHI S4160 for Sale Year(s) : 1996 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsSpin Rinse Dryer Location : AMERICA North (USA-Canada-Mexico)
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More details- Computer (with hard drive) - Monitor - Keyboard & Mouse Location : AMERICA North (USA-Canada-Mexico)
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More detailsFlexible AOI SMEMA : True Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsWafer Size 8" Tool's Condition Refurbished Measurement Range : 25§- 20탆 - 500?-200 um with the visible light Location : ASIA (North East)
Price : On request
More detailsWafer Size 8" Tool's Condition Refurbishing •; Optimized Polarized Reflectance (Rs and Rp) Data - Wavelength Location : ASIA (North East)
Price : On request
More detailsSpecification: Illumination type: second light Binocular angle: 45° Ocular model: WHK 10x / 20L Magnification Location : EUROPE (Western and Northern)
Price : On request
More detailsSpecification: Display head: Trinocular 25x Ocular: Wild 10X/21 Diopric correction: +5 až -5 Approach: APO Zoo Location : EUROPE (Western and Northern)
Price : On request
More detailsDetails: Dimensions 28" x 53 1/4" x 53" Weight 288 lbs Electrical Requirements (North America): 120VAC, 10 Am Year(s) : 2016 Location : AMERICA North (USA-Canada-Mexico)
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More detailsVoltage: 115 Single lane Operating System Windows 2000 Vision 2007 Ver 4.8 program Manual - soft copy on machi Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsBinocular Viewing Head with 2ea CFI 10X Eyepieces Nikon Ti2-N-ND-E Motorized DIC Sextuple Nosepiece, Including Year(s) : 2019 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsZeiss Model D Tiltable Stand (G) Motorized Z-Drives for Focusing & Pivot Point Adjustment Tilting angle ≤ 45° Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsNanoscope III Scanning Probe Microscope Location : AMERICA North (USA-Canada-Mexico)
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More detailsSpin RInser/Dryer Location : AMERICA North (USA-Canada-Mexico)
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More detailsmicroscope operates with bright field (BF), dark field (DF), and polarization modules. System includes eyepiec Location : AMERICA North (USA-Canada-Mexico)
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More detailsOverlay Metrology System Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsErgolux Microscope Location : AMERICA North (USA-Canada-Mexico)
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More detailsUM-2 operates with transmission and reflection modes as well as bright field and dark field modules. System co Location : AMERICA North (USA-Canada-Mexico)
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More detailsStage module A(R) with 5 dovetail slide rails. Objective module with sextuple revolving nosepiece (LD-Plan Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsST Surface Profiler Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsNanoSpec AFT 200 Thickness Measurement System Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMA25 mask aligner configured for simultaneous double side exposure and manual operation of wafers with a maxim Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMA 56 is a mask alignment and exposure system which offers unsurpassed, highly economical mass production capa Location : AMERICA North (USA-Canada-Mexico)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.